A True Wireless System (TWS)headphone is provided, which comprises a charging case and one or two earbuds. The earbuds may be attached into the charging case by a two pogo pin connector. The earbuds can detect the different status of the battery in the charging case via the two pogo pin connector and can auto power on or off accordingly when taken out or put into the charging case.

An inspection device comprising: a first elastomer defining a hole; and a plunger overlapping with the first elastomer, wherein a conductive film is formed over an inner wall of the hole, and the plunger is electrically connected to the conductive film.

Provided is a probe head capable of reducing an inductance value of a ground probe. In a probe head 1, a pin plate 40, a pin block 50, and a solder resist film 60 are stacked in this order from a measuring instrument side to be integrally formed, and constitute a support body that supports a signal probe 10 and a first ground probe 20. The pin plate 40 is an insulator. The pin block 50 is a conductor, and is electrically connected to the first ground probe 20 and a measuring instrument-side ground, and is not electrically connected to the signal probe 10. The solder resist film 60 is provided on the surface of the pin block 50 on a side of a device to be inspected, and is interposed between the pin block 50 and the device to be inspected.

An electrical connector having a barrel or hollow cylindrical sleeve into which is inserted a cylindrical interface member adapted to accept a coil spring member on one end thereof. The interface member on its other end acts upon a cylindrical sphere or ball captured with the other end of the sleeve member. The ball is movable axially and rotationally within the sleeve to make electrical and mechanical contact with an external surface which may be either movable with respect to the ball or not perpendicular to the ball. The connector is formed to direct current to pass primarily through the sleeve and to bypass the spring.

This contact pin electrically connects a first electrical component and a second electrical component, the contact pin comprising: a pin body having an inside pin element and an outside pin element combined to be extendable; an elastic member that energizes the inside pin element and the outside pin element in the direction in which the pin body expands when the pin body is in a contracted state; and a pressing part that is provided on the outside pin element, and that when the pin body contracts, applies force to the inside pin element that moves in a first direction in the axial direction, the force including a component in a second direction orthogonal to the first direction.

An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

The present invention relates to a test socket having a thin structure that can reduce durability degradation of a contact itself, have excellent electrical characteristics in processing high-speed signals, and can extend a service life thereof, and relates to spring contacts suitable thereto. The test socket according to the present invention includes: a plurality of spring contacts (100) each of which includes an upper contact pin (110) and a lower contact pin (120) that are assembled cross each other, and a spring (130) supporting the upper and lower contact pins (110 and 120); a main plate (1110) having a plurality of accommodating holes (1111) in which the respective spring contacts (100) are accommodated, with first openings (1113); and a film plate (1120) provided on a lower portion of the main plate (1110), and having second openings (1121).

An electric connection socket for relaying electric signals between a circuit substrate and an electric component includes: a metal housing which has a through hole enabling communication between the top surface and the bottom surface thereof, and on the top surface of which the electric component is mounted and on the bottom surface of which the circuit substrate is mounted; and a signal pin inserted into the through hole to configure a coaxial line between the inner wall surfaces of the through hole, and which is electrically connected at one end to a signal path first pad electrode of the circuit substrate and is electrically connected at the other end to a signal path terminal of the electric component. On the bottom surface, the metal housing has a ground connection unit which contacts a second pad electrode for grounding formed on the circuit substrate and which grounds the metal housing.

The present invention relates to a contact and a socket device for testing a semiconductor device. The contact of the present invention is a spring contact which is integrally formed by blanking and bending a metal plate member and includes an elastic portion made of various strips of certain pattern and a tip provided at both ends of the elastic portion. Preferably, an inner volume of the contact is filled with a filler having conductivity and elasticity, whereby durability and electrical characteristics are excellent. Further, the test socket according to the present invention is a rubber type employing the above-mentioned contact and has an advantage that it is suitable for testing a fine pitch device.

To guarantee positioning of an elastic pin during manufacturing without using a guide member, and to prevent contamination from a guide member in a final product. An electronic device inspection socket having a plurality of elastic pins each having the center portion embedded in, and having respective ends projecting from, an insulator which changes, through solidification, from a fluid state to a solid but deformable state, wherein the leading ends of the elastic pins are portions received by a plurality of recesses provided to a device for manufacturing the electronic device inspection socket, and the insulator is a portion formed after being injected in a fluid state between said respective ends in a state where said respective ends are received in the recesses and being solidified.