A contact probe includes a first plunger, a contact terminal, and a conductive member. The first plunger is contactable with one of an electrode of a semiconductor device and a pad of a test jig. The contact terminal is contactable with the other of the electrode of the semiconductor device and the pad of the test jig. The conductive member covers a part of the first plunger. The conductive member and the first plunger are provided to bring an end portion of the first plunger and the contact terminal into a conduction state when the end portion of the first plunger is pressed by a force smaller than a predetermined force, and bring the end portion of the first plunger and the contact terminal into a nonconduction state when the end portion of the first plunger is pressed by a force equal to or larger than the predetermined force.

A spring connector includes: an insulating housing having a through hole; a conductor disposed on one end side of the through hole; and a conductive external contact pin disposed on another end side of the through hole. The housing has an opening portion on the other end side of the through hole. A part of the through hole and a part of the conductor form an internal space. The external contact pin includes a tip end portion configured to protrude from the opening portion and a main body portion positioned in the through hole. The external contact pin and the conductor are configured to be switched between a non-conductive state and a conductive state by moving the tip end portion of the external contact pin in a backward direction opposite to a protruding direction in which the tip end portion protrudes from the opening portion.

According to a certain embodiment, a pin plunger includes: a first contact member; a second contact member that faces the first contact member and is apart from the first contact member; a spring arranged between the first contact member and the second contact member; and a housing that houses the first contact member, the second contact member, and the spring. The housing comprises a bimetal inside or outside the housing. The bimetal comprises a first metal and a second metal, the first metal having a thermal expansion coefficient different from a thermal expansion coefficient of the second metal. The elastic force decreased or increased by contracting or expanding of the spring due to a temperature change is compensated with a warping force due to stretching of the first metal and the second metal.

Provided is an electrical contactor that is formed from a small number of components that can improve the conductivity in the electrical contactor, while improving the slidability of an elastic member and the electrical contact stability with a contact target. The present disclosure provides an electrical contactor which is formed from a plate-shaped member, the plate-shaped member including: a main body; an upper arm portion; a first tip end portion provided at a tip end of the upper arm portion; a lower arm portion; and a second tip end portion provided at a tip end of the lower arm portion, the electrical contactor including: a first contact portion formed by winding the first tip end portion; a first elastic portion formed by winding the upper arm portion and having a bamboo-shoot-like spring structure; a second contact portion formed by winding the second tip end portion; a second elastic portion formed by winding the lower arm portion and having a bamboo-shoot-like spring structure; and a coupling portion that couples the first elastic portion and the second elastic portion to enable elasticity of each of the first elastic portion and the second elastic portion by winding the main body, in which each or either of a tip end surface of the first contact portion that contacts the first contact target and a tip end surface of the second contact portion that contacts the second contact target is an inclined surface.

Embodiments provided herein include methods, compositions, and uses of aromatic alcohols to increase the potency of antifungal agents.

A probe pin is proposed. The probe pin includes a first plunger configured to come in contact with a testing target contact point of a testing object and a second plunger configured to come in contact with a testing contact point of a testing circuit, in which the first plunge or the second plunger has a stem extending with a predetermined cross-sectional area and a contact portion extending from the stem such that a cross-sectional area decreases, and having first second tips, which are configured to come in contact with the testing target contact point or the testing contact point, at a front end; and the first and second tips are formed in symmetric shapes at positions that are symmetric with a central axis of the stem therebetween.

When a load necessary for inspection is applied to a cylindrical body in the axial direction thereof, an end of the first bar-like main body is located closer to the other end side of the cylindrical body than one end of a support portion in a support member that supports the body portion, an end of the second bar-like main body is located closer to one end side of the cylindrical body than the other end of the support portion, the body portion is located in the entire portion where the support portion is located, and a radial distance between the outer peripheral surface of the axial central portion of at least one of the first spring portion and the second spring portion and the support member is larger than the distance between the body portion and the support portion.

An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

According to a certain embodiment, a pin plunger includes: a first contact member; a second contact member that faces the first contact member and is apart from the first contact member; a spring arranged between the first contact member and the second contact member; and a housing that houses the first contact member, the second contact member, and the spring. The housing comprises a bimetal inside or outside the housing. The bimetal comprises a first metal and a second metal, the first metal having a thermal expansion coefficient different from a thermal expansion coefficient of the second metal. The elastic force decreased or increased by contracting or expanding of the spring due to a temperature change is compensated with a warping force due to stretching of the first metal and the second metal.

The invention relates to a contact device (1) for contacting an electrical contact point of a test object, comprising a contact plunger (3), which has a plunger shaft (4) for mounting in a guide sleeve (2) in an axially displaceable manner as well as a contact head (5) which is assignable to the test object and arranged on a free end of the plunger shaft (4), and comprising at least one contact element (13), which is movably mounted on and/or in the contact head (5), whereby at least one spring element (6), which is elastically deformable against its spring force by means of the contact element (13) under a load resulting from a contact, is assigned to the contact element (13). is provided that several of the contact elements (13), which in each case have a contact area (14) for contacting, are arranged next to one another on the contact head (5) in such a way that the contact areas (14) form an at least essentially continuous contact surface (15) of the contact head (5) for the contact point in the unloaded state.