Patent classifications
G01R1/06722
Probe and method of manufacturing probe
A probe for connecting an electrode terminal of an electric circuit or an electric component includes a first spring; a second spring covering the first spring; a cover covering the second spring; a first terminal that is connected to the second spring and is provided at one end of the probe; and a second terminal that is connected to the cover and is provided at another end of the probe.
PROBE FOR TESTING CHARGING/DISCHARGING OF SECONDARY BATTERY
A charge and discharge test probe for a secondary battery includes: an inner plunger moved up and down by elastic force of a spring; a head having a central through hole through which the inner plunger passes to protrude from an upper end of the head; and a first conductive elastic member mounted to the head.
SOCKET
A socket includes: a contact probe; and an insulating support body supporting the contact probe. The contact probe includes: a first plunger to be connected with an object to be inspected; a second plunger to be connected with an inspecting board; and a spring configured to urge the first plunger and the second plunger in a direction apart from each other. In a state where a tip end of the first plunger is released, a projecting amount of the second plunger from the insulating support body is zero with a natural length of the spring.
CONTACT PIN AND SOCKET FOR ELECTRICAL COMPONENT
A contact pin to electrically connect a first electrical component to a second electrical component and contact with the first and second electrical components at a sufficiently large contact pressure. The contact pin includes a first plunger with a first contact portion and a second plunger with a second contact portion. An expandable meander portion is formed on the second plunger. A contact piece to conduct electricity between the first and second plungers is provided to guide the expanding and shrinking operation of the meander portion. The first and second plungers are conducted via the contact piece when the first electrical component is electrically connected to the second electrical component, and the meander portion is shrunk to bring the first contact portion of the first plunger and the second contact portion of the second plunger into contact with the first and second electrical components at a sufficiently large contact pressure.
SPRING CONTACT IN A TESTING APPARATUS FOR INTEGRATED CIRCUITS
A vertical spring contact that is constructed of a single piece of electrical conductor, having a central spine that acts as a spring and does not bulge horizontally during compression. This contact is also provided with a pair of arms extending downwards from a top member, flanking both sides of the central spine without being in contact with the central spine. The lower tips of the arms are bent inwards. The central spine structurally connects the top member to a bottom member. The bottom member is provided with recesses that are adapted to loosely receive the lower tips of the arms. In this way, when the contact is compressed, the lower tips of the arms are pressed into the recesses, thus establishing more contact points for a current to pass through.
CONNECTION TERMINAL
A conductive connection terminal is extensible and compressible in a longitudinal direction, and includes: a first contact member including a first tip portion configured to contact with one electrode of a contact target, and a first base end portion; a second contact member including a second tip portion configured to contact with another electrode of the contact target, and a plurality of tongue parts configured to contact with the first base end portion; an elastic member configured to extend and compress the first contact member and the second contact member in the longitudinal direction; and a load applying unit configured to apply a load to the tongue parts in a direction bringing the tongue parts into contact with an outer circumference of the first base end portion.
COAXIAL CONTACT
An example contact head includes coaxial contacts configured for transmission of radio frequency (RF) signals or digital signals between a test system and a device under test (DUT). Each of the coaxial contacts is configured to target a specific impedance. Each of the coaxial contacts includes a coaxial structure having an open-curve shape. The coaxial structure includes a spring material that bends in response to applied force and that returns to the open-curve shape absent the applied force. The coaxial structure includes a center conductor terminating in a contact pin and a return conductor separated by a dielectric from the center conductor. At least part of the center conductor and the return conductor include an electrically-conductive material. Flexible contacts on the coaxial contact include the electrically-conductive material.
Contactor and probe using same
A contactor including a bellows body, a fixed portion connected to one end of the bellows body, and a movable portion connected to the other end of the bellows body, where the bellows body, the fixed portion and the movable portion are integrally molded by electroforming, and the movable portion is configured to be depressed to compress the bellows body, so that adjacent arc portions of the bellows body are brought into contact with each other to cause a short circuit.
Probe member for pogo pin
Provided is a probe member for a pogo pin, which is used for testing a semiconductor device, and at least a portion of which is inserted into a cylindrical body to be supported by an elastic member and an upper end of which contacts a terminal of the semiconductor device.
Integrated pogo pin enabling integrated housing
Proposed is an integrated pogo pin including: a casing portion rolled up to have a C-shaped cross section; an upper elastic portion extending from a first side surface of the casing portion in a first spiral direction toward an upper-end opening along an inner circumferential surface thereof; an upper probe portion arranged on a non-stationary end of the upper elastic portion and rolled up to a shape of a cylinder in such a manner as to reciprocate upward and downward within the upper-end opening; a lower elastic portion extending from the first side surface of the casing portion in a second spiral direction toward a lower-end opening along the inner circumferential surface; and a lower probe portion arranged on a non-stationary end of the lower elastic portion and rolled up to the shape of the cylinder in such a manner as to reciprocate upward and downward within the lower-end opening.