Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.

A method for defect identification for an integrated circuit includes determining a defect ranking technique, applying at least two defect identification techniques and generating a defect report corresponding to each technique, comparing the defect reports and generating probable defect locations, prioritizing the probable defect locations according to the defect ranking technique; and generating a report of the prioritized probable defect locations.

Aspects of the disclosed technology relate to techniques of activity coverage assessment. Transistor-level circuit simulation is performed for a circuit design under a set of test stimuli, which determines values of one or more electrical properties for each of circuit elements of interest in the circuit design. The one or more electrical properties are selected based on information of the each of circuit elements of interest, which comprises what circuit element type the each of circuit elements of interest belongs to. Based on the values of the one or more electrical properties, activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli is determined.

Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.

It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

It is determined, if a simulated hardware signal of a design for an electronic circuit has an influence on a checker for simulation errors. To achieve this, a checker control flow database is generated for a static code description containing checkers and concerned simulated signals. Further, a database based on the output of instrumented verification code is generated, thus gaining dynamic information about the verification code. Herein, the hardware signal values will be associated with colored values or, alternatively, attributed values. For the checkers in the checker control flow database, a list of attributes is generated and stored. Based on the above operations, a hardware signal database is generated, wherein hardware signals are mapped to a list of checkers, based on determining, for each checker in the checker database, the associated hardware signals from its list of attributed values.

The invention refers to an apparatus for testing a circuit, including: an interrupter configured for interrupting based on a circuit model describing at least a part of the circuit a connection between two components of the circuit, wherein the circuit model describes the two components connected by the connection, an inserter configured for inserting based on the circuit model a test element model into the interrupted connection, and an evaluator configured for evaluating based on the circuit model and the test element model a response of the circuit model to the inserted test element model. The invention also refers to a corresponding method.

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

A thermal transient response simulation is performed to determine a total thermal resistance value for a structure having a plurality of thermal model elements. A plurality of thermal transient response simulations are also performed for the structure to determine changed total thermal resistance values by varying one of thermal resistance values of the thermal model elements. Thermal resistance values for the thermal model elements are then determined based on the total thermal resistance value and the changed total thermal resistance values. The structure function is divided into portions associated with the thermal model elements based on the thermal resistance values for the thermal model elements.

A new approach is proposed to support device under test (DUT) validation reuse across a plurality of platforms, e.g., hardware simulation, hardware emulation, and post-silicon validation. First, an inference profile used for an inference operation of an application, e.g., a machine learning (ML) application, is generated based on a set of profile configurations, a set of test parameters, and a set of randomized constraints. A plurality of math functions specified by, e.g., an architecture team, for the ML application are also statically and/or dynamically verified via block simulation and/or formal verification. An inference model for the DUT is then built based on the inference profile and the plurality of verified math functions. Finally, an inference database including one or more of stimulus, DUT configurations, input data and predicted output results is generated based on the inference model, wherein the inference database for the DUT is reusable across the plurality of platforms.