A measurement system for measuring a device under test is described. The measurement system includes a control and analysis module composed of one or more circuits, a stimulus module composed of one or more circuits, and a measurement interface composed of ,for example, one or more circuits. The stimulus module is configured to generate an electric stimulus signal based on predefined measurement parameters. The measurement system is configured to be connected to a device under test via the measurement interface. The measurement interface is configured to forward the electric stimulus signal from the stimulus module to the device under test. The measurement interface further is configured to forward a response signal from the device under test to the control and analysis module, wherein the response signal corresponds to a response of the device under test to the stimulus signal. The control and analysis module is configured to analyze the response signal, thereby generating a set of analysis data. The control and analysis module is further configured to compare the set of analysis data generated with a database. The database includes several measurement data sets being associated with different classes or types of devices under test. The control and analysis module is further configured to adapt the predefined measurement parameters of the stimulus module based on the comparison of the set of analysis data with the database. Further, a method of measuring a device under test is described.

Arrangements and techniques for testing mobile devices within a test module. The test modules are portable and may be stacked to provide a modular testing system. A pulley system may be used to move an actuator arm horizontally in the X and Y directions. The actuator arm may be moved vertically in the Z direction such that a tip may engage a touchscreen of a mobile device being tested or a user interface element of the mobile device.

Provided is a measuring method for testing a device under test (DUT) having a plurality of terminals and, particularly, to a means for measuring the functions and performance of various electronic devices in which an electronic circuit such as that in an electronic device, a semiconductor element, a circuit module, and a circuit board is mounted, and to: a method by which a processor supports measurement with software such that unit costs can be reduced to be lower than those of conventional means operating with various, high-cost hardware; and a device using the same.

An automated test equipment for testing one or more devices under test comprising a plurality of port processing units, comprising at least a respective buffer memory, and a respective high-speed-input-output, HSIO, interface for connecting with at least one of the devices under test. The port processing units are configured to receive data, store the received data in the respective buffer memory, and provide the data stored in the respective buffer memory to one or more of the connected devices under test via the respective HSIO interface for testing the one or more connected devices under test. A method and computer program for automated testing of one or more devices under test are also described.

An automated test equipment for testing a device under test comprises an on-chip-system-test controller. The on-chip system test controller comprises at least one debug interface or control interface configured to communicate with the device under test. The on-chip-system-test controller optionally comprises at least one high bandwidth interface configured to communicate with the device under test. The on-chip-system-test controller is configured to control a test of a device-under-test which is a system-on-a chip.

A device of a data testing environment including a node configured to connect the device to a tester; one or more processors configured to receive from the node an electrical signal alternating between at least a first state and a second state, the first state representing a data transmission trigger and the second state representing a data transmission opportunity; determine a timing of the data transmission opportunity based on the received electrical signal; and send data to the node during the data transmission opportunity in response to receiving the data transmission trigger.

A method for controlling a test apparatus, the test apparatus including a test unit in which testers are arranged in columns and rows, each tester configured to test a substrate; aligners each configured to cause the substrate to be contacted with respect to a given tester from among the testers, at least one aligner provided in each row; and a controller configured to control the aligners. The method includes constraining, by the controller, operation of at least a second aligner, while alignment is performed through a first aligner from among the aligners.

Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.

A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.

A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.