The invention relates to a method for determining the state of charge (SOC) of a chargeable battery pack (5) comprising at least one battery cell (5a, 5b, 5c), said method comprising the steps of: providing an initial state of charge value (SOC.sub.1) for said battery pack (5); estimating a battery cell voltage value (V.sub.est) using a cell model (7b) based on input values representing at least a measured voltage (V.sub.meas) of said battery pack (5); comparing said estimated battery cell voltage value (Vest) with said measured battery cell voltage value (V.sub.meas) for said at least one battery cell (5a, 5b, 5c); and determining an estimated state of charge value (SOC.sub.est) to update the state of charge (SOC) from the initial state of charge value (SOC.sub.1), based on said comparing step and by using an observer module (7a). According to the invention, the observer module (7a) comprises an influence factor, said influence factor representing errors in the state of charge (SOC) based on the parameterization of said cell model (7b). The invention also relates to an arrangement for determining the state of charge (SOC) of a battery pack (5).

A system and method are disclosed for formulating a sequential equivalency problem for fault (non)propagation with minimal circuit logic duplication by leveraging information about the location and nature of a fault. The system and method further apply formal checking to safety diagnoses and efficiently models simple and complex transient faults.

The present disclosure discloses a method and an apparatus for testing an artificial intelligence chip test, a device and a storage medium, and relates to the field of artificial intelligence. The specific implementation solution is: the target artificial intelligence chip has multiple same arithmetic units, the method includes: obtaining scale information of the target artificial intelligence chip; determining whether the target artificial intelligence chip satisfies a test condition of an arithmetic unit array level according to the scale information; dividing all the arithmetic units into multiple same arithmetic unit arrays, and performing a DFT test on the arithmetic unit arrays, respectively, if it is determined that the test condition of the arithmetic unit array level is satisfied; performing the DFT test on the arithmetic units, respectively, if it is not determined that the test condition of the arithmetic unit array level is not satisfied.

A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.

The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.

A control method of a touch display apparatus applicable to a probe station is provided. The probe station includes a movable element. The movable element is a chuck stage, a camera stage, a probe platen, or a positioner. The control method of a touch display apparatus includes displaying a first window and a second window on a touch display apparatus; displaying an operation interface on the first window and displaying a real-time image on the second window; and detecting a touch instruction generated on the operation interface, where the movable element moves according to the touch instruction.

The present disclosure discloses a method and an apparatus for testing an artificial intelligence chip test, a device and a storage medium, and relates to the field of artificial intelligence. The specific implementation solution is: the target artificial intelligence chip has multiple same arithmetic units, the method includes: obtaining scale information of the target artificial intelligence chip; determining whether the target artificial intelligence chip satisfies a test condition of an arithmetic unit array level according to the scale information; dividing all the arithmetic units into multiple same arithmetic unit arrays, and performing a DFT test on the arithmetic unit arrays, respectively, if it is determined that the test condition of the arithmetic unit array level is satisfied; performing the DFT test on the arithmetic units, respectively, if it is not determined that the test condition of the arithmetic unit array level is not satisfied.

A method and test system are provided for selectively emphasizing waveforms on a display of the test system. The method includes presenting a graphical user interface (GUI) on the display of the test system; receiving through the GUI a selection of channels to be viewed on the display; receiving through the GUI an indication enabling a waveform emphasis feature; receiving through the GUI an indication of a cycle time; and displaying through the GUI multiple waveforms, respectively produced by the selected channels, by sequentially emphasizing each waveform of the multiple waveforms for the cycle time as a viewable waveform, while de-emphasizing each remaining waveforms of the multiple waveforms in relation to the emphasized waveform for the cycle time.

A display method of a display apparatus is provided. The method includes: displaying, on a touch display apparatus, a first window and a second window that overlap with each other, where the first window is smaller than the second window; displaying a first image on the first window, and displaying a second image on the second window, where the second image is an image captured by the camera module in real time; displaying the first image on the second window and displaying the second image on the first window according to the first touch instruction; and displaying the first image on the first window and displaying the second image on the second window according to the second touch instruction.

A system for acquiring a test-and-measurement signal from a device under test (DUT) including a test-and-measurement probe, a user interface, a robot, and a controller. The probe is configured to acquire an electronic signal from the DUT. The user interface displays a digital representation of a physical electronic circuit of the DUT, including portrayals of virtual nodes that correspond to actual nodes on the DUT. The robot is configured to automatically position the probe with respect to the DUT. The controller is configured to receive from the user interface an electronic indication of a selected node of the digital representation of the physical electronic circuit, where the selected node is one of the virtual nodes. The controller is further configured to provide instructions to the robot to automatically position the probe to a position on the physical electronic circuit corresponding to the actual node.