A rechargeable power module (RPM) may include a rechargeable energy storage device such as a battery or capacitor, a charging circuit, a direct-current (DC) to DC converter, a low drop-out (LDO) voltage regulator and a controller. The charging circuit provides the rechargeable energy storage device with a charging current based on power requirements of device under test and the state of charge, or storage, of the energy storage device.

A signal generator and a method for controlling the signal generator, capable of suppressing variation in the intensity of signals inputted to multiple devices under test are provided. An attenuation amount setting unit 15 sets a reference attenuation amount, obtained by subtracting the maximum amount of the losses stored in the cable loss storage unit 16 with respect to the cables 4a to 4f connected to the output ports 12a to 12f from a target attenuation amount, to the first attenuator 11, and sets an output attenuation amount, obtained by subtracting the losses stored in the cable loss storage unit 16 with respect to each of the cables 4a to 4f connected to the output ports 12a to 12f, from the maximum amount of the losses, to each of the second attenuators 14a to 14f.

A tester including an interface configured to interface with an electronic device and a logic circuit. The logic circuit includes a pattern generator and at least one finite-state machine and is configured to sequentially acquire read data from the electronic device at sequential testing points of a testing range for evaluating an operating parameter of the electronic device or the tester until a set of consecutive passing points having a first passing point and a last passing point is identified, in response to identifying the first passing point, write data within the logic circuit of the tester identifying the first passing point, in response to identifying the second passing point, write data within the logic circuit of the tester identifying the second passing point, and output only data identifying the first passing point and data identifying the last passing point to a software application.

An active load circuit that includes a diode bridge having first through fourth nodes, wherein a voltage buffer is connected with the first node, a source current mirror is connected with the second node, the third node is configured for connection to a device under test (DUT), and a sink current mirror is connected with the fourth node. A first current mirror is connected with the source current mirror, and a second current mirror is connected with the sink current mirror. A first differential pair is connected with the first current mirror and includes an input connected with the DUT and a second input connected with the input voltage. A second differential pair is connected with the second current mirror and includes a first input connected with the DUT and a second input connected with the input voltage.

A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.

The present disclosure relates to a detection system including a control circuit, a power line network bridge circuit, a fixture device and a detection device. The control circuit is configured to generate a plurality of detection signals. The power line network bridge circuit receives detection signals through a power line. The fixture device is electrically connected to the power line through the power line network bridge, and is configured to receive the detection signals. The fixture device is configured to transmit the detection signals to a device under test, so that the device under test displays a plurality of media. The detection device is configured to capture the media and transmit the media to the control circuit. The control circuit is further configured to determine whether the media match with detection parameters.

A circuit measuring device and a method thereof are provided. A voltage source supplies a common voltage such that a calibration current having a preset current value flows from a current-voltage converter to a final test machine. The current-voltage converter converts the calibration current into a calibration voltage. At this time, a voltage sensing component senses a voltage between an input terminal and an output terminal of the current-voltage converter to output sensed calibration data. The current-voltage converter converts a tested current outputted by a tested circuit into a tested voltage. At this time, the voltage sensing component senses the voltage between the input terminal and the output terminal of the current-voltage converter to output actual sensed data. When the final test machine determines that a difference between the sensed calibration data and the actual sensed data is larger than a threshold, the tested circuit is adjusted.

In some examples, a device includes a control circuit configured to deliver driving signals to a switch. The device also includes a testing circuit configured to cause the control circuit to toggle the switch at a first instance and determine a parameter magnitude at the switch at a second instance after toggling the switch at the first instance by at least determining a voltage magnitude at the switch at the second instance. The testing circuit is also configured to cause the control circuit to toggle the switch after the second instance and determine a parameter magnitude at the switch at a third instance after toggling the switch after the second instance. The testing circuit is further configured to generate an output based on the determined parameter magnitudes at the switch at the second and third instances.

A force-sense system for providing signals to, or receiving signals from, a device under test (DUT) at a first DUT node. The system can include an interface coupling first and second portions of a first force-sense measurement device, such as a parametric measurement unit. The first and second portions of the first force-sense measurement device can be provided using respective different integrated circuits, such as can comprise different semiconductor dies of different die types. In a first test mode, the interface can be configured to communicate a first DUT force signal from the first portion to the second portion of the first force-sense measurement device, and in a second test mode the interface can be configured to communicate DUT sense information, received from the DUT at the first DUT node, from the second portion to the first portion of the first force-sense measurement device.

A measurement system for measuring a device under test is described. The measurement system includes a control and analysis module composed of one or more circuits, a stimulus module composed of one or more circuits, and a measurement interface composed of ,for example, one or more circuits. The stimulus module is configured to generate an electric stimulus signal based on predefined measurement parameters. The measurement system is configured to be connected to a device under test via the measurement interface. The measurement interface is configured to forward the electric stimulus signal from the stimulus module to the device under test. The measurement interface further is configured to forward a response signal from the device under test to the control and analysis module, wherein the response signal corresponds to a response of the device under test to the stimulus signal. The control and analysis module is configured to analyze the response signal, thereby generating a set of analysis data. The control and analysis module is further configured to compare the set of analysis data generated with a database. The database includes several measurement data sets being associated with different classes or types of devices under test. The control and analysis module is further configured to adapt the predefined measurement parameters of the stimulus module based on the comparison of the set of analysis data with the database. Further, a method of measuring a device under test is described.