G06F11/1016

TEMPERATURE AND INTER-PULSE DELAY FACTORS FOR MEDIA MANAGEMENT OPERATIONS AT A MEMORY DEVICE
20220405181 · 2022-12-22 ·

An average inter-pulse delay of a data unit of the memory device is calculated. An average temperature of the data unit is calculated. A first scaling factor based on the average inter-pulse delay and a second scaling factor based on the average temperature is obtained. A media management metric based on the first scaling factor and the second scaling factor is calculated. Responsive to determining that the media management metric satisfies a media management criterion, a media management operation on the data unit at a predetermined cycle count is performed.

MEMORY ADDRESS PROTECTION

A method for memory protection includes receiving a burst-write instruction that includes data and a burst-write address. The data are segmented into a plurality of data blocks. One or more bits of the burst-write address, or a hash of the burst-write address are concatenated to respective data blocks to obtain data-and-write-address-bit (DWAB) segments. A SECDED ECC is executed on respective DWAB segments to generate a corresponding plurality of sets of parity bits (DWAB-PB). Respective DWAB-PB are concatenated to the corresponding data block to generate corresponding forward-error-correction (FEC) blocks, none of the FEC blocks including the burst-write address or the hash of the burst-write address. A burst-write command and a respective portion of a respective FEC block is sent to respective memory devices during a plurality of beats until all of the beats of the burst-write have been sent.

Dedicated interface for coupling flash memory and dynamic random access memory
11513689 · 2022-11-29 · ·

The present application describes embodiments of an interface for coupling flash memory and dynamic random access memory (DRAM) in a processing system. Some embodiments include a dedicated interface between a flash memory and DRAM. The dedicated interface is to provide access to the flash memory in response to instructions received over a DRAM interface between the DRAM and a processing device. Some embodiments of a method include accessing a flash memory via a dedicated interface between the flash memory and a dynamic random access memory (DRAM) in response to an instruction received over a DRAM interface between the DRAM and a processing device.

Parity protection

A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.

Access schemes for access line faults in a memory device
11508458 · 2022-11-22 · ·

Methods, systems, and devices related to access schemes for access line faults in a memory device are described. In one example, a method may include isolating a first word line of a section of a memory device from a voltage source (e.g., a deselection voltage source) during a first portion of a period when the first word line is deselected, and coupling the first word line with the voltage source during a second portion of the period when the first word line is deselected based on determining that an access operation is performed during the second portion of the period when the word line is deselected. In some examples, the method may include identifying that the first word line is associated with a fault, such as a short circuit fault with a digit line of the memory device.

Platform framework error handling

Embodiments of systems and methods for platform framework error handling are described. A platform framework may receive registration requests from framework participants that provide operation of a plurality of hardware devices of an IHS (Information Handling System). The framework registration requests by participants specify remediation policies for addressing error conditions related to respective participants. The received remediation policies are mapped to the registered participants, where remediation policies may include handles for invoking remediation procedures for a registered participant. Error conditions are detected during operation of the platform framework. The registered participant is identified as a source of the error condition and a remediation policy that is mapped to the registered participant is identified. Handles in the remediation policy are used to invoke remediation procedures for the registered participant. Remediation procedures invoked by the handles may be provided by a remediation agent that provides support for registered participants.

Temperature and inter-pulse delay factors for media management operations at a memory device

An average inter-pulse delay of a data unit of the memory device is calculated. An average temperature of the data unit is calculated. A first scaling factor based on the average inter-pulse delay and a second scaling factor based on the average temperature is obtained. A media management metric based on the first scaling factor and the second scaling factor is calculated. Responsive to determining that the media management metric satisfies a media management criterion, a media management operation on the data unit at a predetermined cycle count is performed.

Storage device performance optimization using deep learning
11610116 · 2023-03-21 · ·

Disclosed is a computer-implemented method for optimizing read thresholds of a memory device using a deep neural network engine, comprising reading, using a set of read threshold voltages applied to the memory device, data from the memory device under a first set of operating conditions that contribute to read errors in the memory device, producing a labeled training data set using the set of read threshold voltages under the first set of the operating conditions, determining, based on characteristics of the memory device, a number of layers, a size of each layer, and a number of input and output nodes of the deep neural network engine, training the deep neural network engine using the labeled training data set, and using the trained deep neural network engine to compute read thresholds voltage values under a second set of operating conditions.

METHOD FOR ERROR CORRECTION CODING WITH MULTIPLE HASH GROUPINGS AND DEVICE FOR PERFORMING THE SAME
20230060621 · 2023-03-02 ·

Various aspects include methods and devices for implementing the methods for error checking a memory system. Aspects may include receiving, from a row buffer of a memory, access data corresponding to a column address of a memory access, in which the row buffer has data of an activation unit of the memory corresponding to a row address of the memory access, determining multiple error correction codes (ECCs) for the access data using the column address, and checking the access data for an error utilizing at least one of the multiple ECCs. In some aspects, the multiple ECCs may include a first ECC having data from an access unit of the memory corresponding with the column address, and at least one second ECC having data from the access unit and data from the activation unit other than from the access unit.

Memory address protection

A method for memory protection includes receiving a burst-write instruction that includes data and a burst-write address. The data are segmented into a plurality of data blocks. One or more bits of the burst-write address, or a hash of the burst-write address are concatenated to respective data blocks to obtain data-and-write-address-bit (DWAB) segments. A SECDED ECC is executed on respective DWAB segments to generate a corresponding plurality of sets of parity bits (DWAB-PB). Respective DWAB-PB are concatenated to the corresponding data block to generate corresponding forward-error-correction (FEC) blocks, none of the FEC blocks including the burst-write address or the hash of the burst-write address. A burst-write command and a respective portion of a respective FEC block is sent to respective memory devices during a plurality of beats until all of the beats of the burst-write have been sent.