Patent classifications
G06F11/1016
Memory repair using external tags
A memory device (100) includes an extra column (114) of repair memory tiles. These repair memory tiles are accessed at the same time, and in the same manner as the main array of memory tiles. The output of the repair column is substituted for the output of a column of the main array (112). The main array column that is substituted is determined by tags (121) stored externally to the memory device. The external tags are queried with a partial address of the access. If the address of the access corresponds to an address in the external tags, the tag information is supplied to the memory device. The tag information determines which column in the main array is replaced by the output of the repair column. Since each column of the main array supplies one bit during the access, the repair column enables cell-by-cell replacement of main array cells.
Error correction code management of write-once memory codes
A system for error correction code (ECC) management of write-once memory (WOM) codes includes, for example, a host processor is arranged to send a data word that is to be stored in a WOM (Write-Once Memory) device. A host interface is arranged to receive the first data word for processing by a WOM controller and an ECC controller. The WOM controller is for generating a first WOM-encoded word in response to an original symbol of the first data word, while the ECC controller is for generating a first set of ECC bits in response to the original symbol of the first data word. A memory device interface is for writing the first WOM-encoded word and the first set of ECC bits to the WOM device in accordance with the memory address associated with the first data word.
Data storage devices and methods for rebuilding a memory address mapping table
A data storage device including a non-volatile memory and a micro-controller is provided. The non-volatile memory includes a plurality of data blocks. The micro-controller selects one of the data blocks as a source block and another one of the data blocks as a destination block. Also, the micro-controller duplicates data in the source block to the destination block, and when the data is corrupted and unrecoverable, stores an unrecoverable-error bit corresponding to the data into the destination block.
Data storage device and data access-method
The present invention provides a data-storage device including a flash memory and a controller. The flash memory includes a plurality of blocks, and each of the blocks has a plurality of pages, wherein each of the pages has a plurality of sub-pages and a plurality of spare areas, each of the spare areas is arranged to store a spare data sector, and the spare data sector respectively corresponds to the sub-pages. The controller is arranged to access the sub-pages according to the spare data sector.
Flash memory device, flash memory system, and methods of operating the same during an authentication challenge
Provided are a flash memory device, a flash memory system, and methods of operating the same. A method of operating a flash memory system includes selecting memory cells of a flash memory in response to an authentication challenge, programming pieces of input data into the selected memory cells, respectively, reading the selected memory cells and generating and storing control information, dividing the selected memory cells into at least one first region memory cell and at least one second region memory cell based on the control information, and setting read values of the at least one first region memory cell and the at least one second region memory cell as a first value and a second value, respectively, and generating an authentication response in the response to the authentication challenge.
SEMICONDUCTOR DEVICE AND MEMORY ACCESS CONTROL METHOD
The detection of a fault of the address signal system in memory access is aimed at. A semiconductor device according to the present invention includes an address conversion circuit which generates the second address for storing an error detecting code in a memory based on the first address for storing data; a write circuit which writes data at the first address and writes an error detecting code at the second address; and a read circuit which reads data from the first address, reads the error detecting code from the second address, and detects an error based on the data and the error detecting code. The address conversion circuit generates an address as the second address by modifying the value of at least one bit of the first address so as to offset the storing position of the error detecting code to the storing position of the data, and by inverting the value of or permutating the order of the prescribed number of bits among the other bits.
MEMORY DEVICE PROTECTION
Systems, apparatuses, and methods related to memory device protection are described. A quantity of errors within a memory device can be determined and the determined quantity can be used to further determine whether to utilize single or multiple memory devices for an error correction and/or detection operation. Multiple memory devices need not be utilized for the error correction and/or detection operation unless a quantity of errors within the memory device exceeds a threshold quantity.
Memory controller implemented error correction code memory
Devices and techniques for memory controller implemented error correction code (ECC) memory are disclosed herein. ECC groups may be placed across banks of the memory. In some examples, an ECC group is a collection of bytes equal to one row in one bank. Also, the placement may restrict a given bank to a single member of the ECC group. A memory operation can be received and executed using the ECC groups.
PARITY PROTECTION
A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
Data integrity for persistent memory systems and the like
A data processing system includes a memory channel, a memory coupled to the memory channel, and a data processor. The data processor is coupled to the memory channel and accesses the memory over the memory channel using a packet structure defining a plurality of commands and having corresponding address bits, data bits, and user bits. The data processor communicates with the memory over the memory channel using a first type of error code. In response to a write access request, the data processor calculates a different, second type of error code and appends each bit of the second type of error code as a corresponding one of the user bits. The memory stores the user bits in the memory in response to a write command, and transfers the user bits to the data processor in a read response packet in response to a read command.