A register file module comprising at least one register array comprising a plurality of latch devices is described. The plurality of latch devices is arranged to individually provide memory bit-cells when the register file module is configured to operate in a first, functional operating mode, and at least one clock control component is arranged to receive a clock signal and to propagate the clock signal to the latch devices within the at least one register array. The register file module is configurable to operate in a second, scan mode in which the latch devices within the at least one register array are arranged into at least one scan chain. The at least one clock control component is arranged to propagate the clock signal to the latch devices within the at least one register array such that alternate latch devices within the at least one scan chain receive an inverted form of the clock signal.

A register file module comprising at least one register array comprising a plurality of latch devices is described. The plurality of latch devices is arranged to individually provide memory bit-cells when the register file module is configured to operate in a first, functional operating mode, and at least one clock control component is arranged to receive a clock signal and to propagate the clock signal to the latch devices within the at least one register array. The register file module is configurable to operate in a second, scan mode in which the latch devices within the at least one register array are arranged into at least one scan chain. The at least one clock control component is arranged to propagate the clock signal to the latch devices within the at least one register array such that alternate latch devices within the at least one scan chain receive an inverted form of the clock signal.

An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.

An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.

An integrated circuit includes a built-in-self-test circuit that generates output test signals and a circuit tested by the built-in-self-test circuit. The circuit tested by the built-in-self-test circuit generates test results in response to the output test signals during a test. Pipeline register circuits are coupled together to form a signal path for transmitting the output test signals from the built-in-self-test circuit to the circuit tested by the built-in-self-test circuit. A functional circuit block is located in a reserved die area of the integrated circuit. The signal path is routed around the reserved die area to the circuit tested by the built-in-self-test circuit. At least a subset of the pipeline register circuits are located adjacent to at least two sides of the reserved die area.

An integrated circuit includes a built-in-self-test circuit that generates output test signals and a circuit tested by the built-in-self-test circuit. The circuit tested by the built-in-self-test circuit generates test results in response to the output test signals during a test. Pipeline register circuits are coupled together to form a signal path for transmitting the output test signals from the built-in-self-test circuit to the circuit tested by the built-in-self-test circuit. A functional circuit block is located in a reserved die area of the integrated circuit. The signal path is routed around the reserved die area to the circuit tested by the built-in-self-test circuit. At least a subset of the pipeline register circuits are located adjacent to at least two sides of the reserved die area.

A method for constructing a scan chain for a memory sequential test, including determining an input boundary register of the memory; determining a number N of test vectors required according to the type of the memory input pins to which the input boundary register is connected; arranging the scan chain based on the number N, such that in the scan chain, upstream of the input boundary register and immediately adjacent to the input boundary register, there are at least (N−1) continuous non-boundary registers; and setting control signals of the input boundary register and the (N−1) non-boundary registers to make them receive scan test input as test vectors under memory sequential test mode.

A method for constructing a scan chain for a memory sequential test, including determining an input boundary register of the memory; determining a number N of test vectors required according to the type of the memory input pins to which the input boundary register is connected; arranging the scan chain based on the number N, such that in the scan chain, upstream of the input boundary register and immediately adjacent to the input boundary register, there are at least (N−1) continuous non-boundary registers; and setting control signals of the input boundary register and the (N−1) non-boundary registers to make them receive scan test input as test vectors under memory sequential test mode.

Aspects include techniques for bypassing an encoded latch on a chip during a test-pattern scan and using on-chip circuitry to generate a desired encoded pattern, which is inserted into a scan-bypassed latch, to test the on-chip circuitry for defects. A computer-implemented method may include applying a global control bit to the chip; initializing a scan of the chip while bypassing the encoded latch; and applying an extra scan clock to initiate the encoded latch after completing the scan, wherein the encoded latch is updated with check bits generated by the on-chip circuitry.

A semiconductor system may include a controller and a semiconductor device. The controller may output command/address signals. The semiconductor device may generate a plurality of control codes from the command/address signals in a test mode according to a combination of the command/address signals. The semiconductor device may output a first output datum generated by serializing the plurality of control codes, and the first output datum, through a single pad.