Patent classifications
G11C11/4078
DYNAMIC RANDOM-ACCESS MEMORY ARRAY INCLUDING SENSOR CELLS
A dynamic random-access memory array includes a plurality of memory cells and sensor cells physical arranged in a row. The sensor cells include a transistor and a capacitor having an input terminal connected to a first non-gate terminal of the transistor. A wordline is connected to transistor gates of both the memory cells and sensor cells in the row. A sensor amplifier has inputs connected to the sensor cell, a high voltage reference line, and a low voltage reference line, and an output in communication with a row refresh circuit. If the sensor amplifier detects that the sensor cell voltage falls outside of the range of the high and low voltage reference lines, then a trigger signal is output to request that the row refresh circuit perform a priority row refresh of the memory cells and the sensor cell in the row.
Memory row recording for mitigating crosstalk in dynamic random access memory
A method includes adding a set of one or more victim rows to a first probabilistic filter and to a second probabilistic filter, in response to a memory access request, identifying a candidate victim row adjacent to a memory address specified by a memory access request, identifying the candidate victim row as a victim row in the set of victim rows based on performing a lookup of the candidate victim row in a selected filter, where the selected filter includes one of the first probabilistic filter and the second probabilistic filter, in response to identifying the candidate row as the victim row, enabling a row hammering countermeasure, clearing the first probabilistic filter in each of a first set of time periods, and clearing the second probabilistic filter in each of a second set of time periods interleaved with the first set of time periods.
Memory row recording for mitigating crosstalk in dynamic random access memory
A method includes adding a set of one or more victim rows to a first probabilistic filter and to a second probabilistic filter, in response to a memory access request, identifying a candidate victim row adjacent to a memory address specified by a memory access request, identifying the candidate victim row as a victim row in the set of victim rows based on performing a lookup of the candidate victim row in a selected filter, where the selected filter includes one of the first probabilistic filter and the second probabilistic filter, in response to identifying the candidate row as the victim row, enabling a row hammering countermeasure, clearing the first probabilistic filter in each of a first set of time periods, and clearing the second probabilistic filter in each of a second set of time periods interleaved with the first set of time periods.
KEY STORAGE DEVICE AND KEY GENERATION METHOD
A key storage device comprising a first key unit and a second key unit is disclosed. The first key unit is configured to output a first logic value through, comprising: a first setting circuit configured to output a first setting voltage; and a first inverter comprising a first output transistor having a first threshold voltage, configured to receive the first setting voltage and generate the first logic value. The second key unit is configured to output a second logic value through a second node, comprising: a second setting circuit configured to output a second setting voltage; and a second inverter comprising a second output transistor having a second threshold voltage, configured to receive the second setting voltage and generate the second logic value. The absolute value of first threshold voltage is lower than which of the second threshold voltage. The first setting voltage is higher than the second setting voltage.
Apparatuses and methods for staggered timing of skipped refresh operations
Embodiments of the disclosure are drawn to apparatuses and methods for staggering the timing of skipped refresh operations on a memory. Memory cells of memories may need to periodically perform refresh operations. In some instances, auto-refresh operations may be periodically skipped when charge retention characteristics of the memory cells of the memory exceed the auto-refresh frequency. To reduce peak current draw during refresh operations, the skipped refresh operations may be staggered across different portions of the memory. In one example, the skipped refresh operation may be staggered in time among memory dies of the memory to limit a number of memory dies that are performing an auto-refresh operation to a maximum number. In another example, the skipped refresh operation may be staggered in time among memory banks of a single memory array to limit a number of memory banks that are performing an auto-refresh operation to a maximum number.
MEMORY DEVICE INCLUDING ROW HAMMER PREVENTING CIRCUITRY AND AN OPERATING METHOD OF THE MEMORY DEVICE
A row hammer preventing circuitry including: a first table storing a count value representing a hit count and an address bit of multiple entries, each entry corresponding to access-requested target rows; a second table including safe bits and a safe bit counter; and a row hammer preventing logic to identify masking entries, on which a masking comparison is to be performed, among the entries on the basis of the safe bit counter, to determine a hit or miss on the basis of whether other bits except an MSB among address bits of an access-requested target row match other bits except an MSB among address bits of the masking entries, and to generate a control signal indicating an additional refresh on rows adjacent to rows corresponding to a masking entry whose hit count is greater than a threshold value.
MEMORY DEVICE INCLUDING ROW HAMMER PREVENTING CIRCUITRY AND AN OPERATING METHOD OF THE MEMORY DEVICE
A row hammer preventing circuitry including: a first table storing a count value representing a hit count and an address bit of multiple entries, each entry corresponding to access-requested target rows; a second table including safe bits and a safe bit counter; and a row hammer preventing logic to identify masking entries, on which a masking comparison is to be performed, among the entries on the basis of the safe bit counter, to determine a hit or miss on the basis of whether other bits except an MSB among address bits of an access-requested target row match other bits except an MSB among address bits of the masking entries, and to generate a control signal indicating an additional refresh on rows adjacent to rows corresponding to a masking entry whose hit count is greater than a threshold value.
Power circuit that interrupts supply of power to a volatile memory in response to a signal indicating a malfunction of a processor
The present description relates to a method and a circuit for powering a volatile memory in which power pulses are sent to the memory, the duration between two pulses being shorter than a remanence time of said volatile memory.
MEMORY CONTROL CIRCUIT, INFORMATION PROCESSING SYSTEM, AND MEMORY CONTROL METHOD
A memory control circuit includes an access storage unit configured to store access requests for a memory, a status management unit configured to, based on the access requests stored in the access storage unit, perform priority access type switching between two access types obtained by classifying the access requests, and an access selection unit configured to select and execute an access request stored in the storage unit. The access selection unit performs, if the priority access type switching is in progress and there is time for executing an access request of a priority access type before the priority access type switching, selecting the access request of the priority access type before the priority access type switching, and if the priority access type switching is not in progress, selecting an access request of the priority access type.
DRAM security erase
A block of dynamic memory in a DRAM device is organized to share a common set of bitlines may be erased/destroyed/randomized by concurrently activating multiple (or all) of the wordlines of the block. The data held in the sense amplifiers and cells of an active wordline may be erased by precharging the sense amplifiers and then writing precharge voltages into the cells of the open row. Rows are selectively configured to either be refreshed or not refreshed. The rows that are not refreshed will, after a time, lose their contents thereby reducing the time interval for attack. An external signal can cause the isolation of a memory device or module and initiation of automatic erasure of the memory contents of the device or module using one of the methods disclosed herein. The trigger for the external signal may be one or more of temperature changes/conditions, loss of power, and/or external commands from a controller.