An electronic device includes a module that delivers a positive temperature coefficient output voltage at an output terminal. A thermistor includes a first MOS transistor operating in weak inversion mode and having a negative temperature coefficient drain-source resistance and whose source is coupled to the output terminal. A current source coupled to the output terminal operates to impose the drain-source current of the first transistor.

An electronic circuit is disclosed. The electronic circuit includes a reference voltage generator, which includes a first candidate circuit configured to generate a first candidate reference voltage, a second candidate circuit configured to generate a second candidate reference voltage, and a selector circuit configured to select one of the first and second candidate reference voltages. The reference voltage generator also includes a third circuit configured to generate a power supply voltage based on the selected candidate reference voltage.

A bandgap reference voltage generating circuit includes a first current generator generating a first complementary-to-absolute temperature (CTAT) current and a first proportional-to-absolute temperature (PTAT) current, a second current generator generating a second CTAT current and a second PTAT current, and an output circuit outputting a reference voltage based on a difference between a first voltage based on the first CTAT current and the first PTAT current and a second voltage based on the second CTAT current and the second PTAT current, wherein the first CTAT current is cancelled by the second CTAT current.

During operation of an IC component within a first range of temperatures, a first bias voltage is applied to a first substrate region disposed adjacent a first plurality of transistors to effect a first threshold voltage for the first plurality of transistors. During operation of the IC component within a second range of temperatures that is distinct from and lower than the first range of temperatures, a second bias voltage is applied to the first substrate region to effect a second threshold voltage for the first plurality of transistors that is at least as low as the first threshold voltage.

The invention provides a voltage-generating circuit with a simple configuration capable of saving space and generating reliable voltage. The voltage-generating circuit of the invention includes a reference voltage-generating unit, a PTAT voltage-generating unit, a comparison unit, and a selection unit. The reference voltage-generating unit generates a reference voltage essentially without dependency on temperature. The PTAT voltage-generating unit generates a temperature-dependent voltage with a positive or negative dependency on temperature. The temperature-dependent voltage is equal to the reference voltage at a target temperature. The comparison unit compares the reference voltage with the temperature-dependent voltage. The selection unit selects and outputs either the reference voltage or the temperature-dependent voltage.

A voltage generation circuit may include: a first transistor coupled to an internal supply voltage terminal, and configured as a diode-connected transistor; a second transistor coupled to the first transistor and configured as a diode-connected transistor; and a third transistor coupled between the second transistor and a ground voltage terminal, and configured to operate according to a first reference voltage generated based on an external supply voltage. The voltage generation circuit may limit a variation in level of a second reference voltage which is generated through a drain terminal of the second transistor as a threshold voltage of the second transistor rises according to a rise in level of the internal supply voltage.

In certain aspects, a bias generation circuit comprises a bias voltage generator. The bias voltage generator has a main NMOS transistor having a drain and a gate of the main NMOS transistor both coupled to a first terminal, a main resistor having a first main resistor terminal and a second main resistor terminal, wherein the first main resistor terminal couples to a source of the main NMOS transistor; and a main PMOS transistor having a source of the main PMOS transistor coupled to the second main resistor terminal and a drain and a gate of the main PMOS transistor both coupled to a second terminal, wherein the second terminal couples to a main ground. The bias generation circuit further comprises an array of sensors coupled to the first terminal and the second terminal.

Provided are an LDO, an MCU, a fingerprint module and a terminal device. The LDO includes: a reference voltage generating circuit and a source follower connected to the reference voltage generating circuit. The reference voltage generating circuit is used to generate a reference voltage that changes with temperature to offset a voltage change caused by a voltage between a first terminal and a second terminal of the source follower changing with time, so that an output voltage of the second terminal of the source follower does not change with temperature. The LDO omits an operational amplifier EA and a resistor divider feedback network in the prior art, which not only has a simple circuit structure, but also can achieve ultra-low power consumption.

The present invention provides a reference voltage buffer comprises a reference voltage generator, a first operational amplifier, a first transistor, a first group of resistors, a first load, a second transistor, a second group of resistors and a second load. In the reference voltage buffer, the first load and the second load use active device to increase the settling time, and the first load, the second load and the reference voltage generator of the reference voltage buffer are resigned to have the same characteristics in response to the temperature variation to overcome the PVT issue, and the first load and the second load of the reference voltage buffer use the open-loop design to have large full-scale of the output reference voltages.

Embodiments of a method and a device are disclosed. In an embodiment, a method for operating a bias controller for an amplifier circuit involves obtaining temperature data corresponding to a temperature of the amplifier circuit, generating a proportional to absolute temperature (PTAT) bias voltage based on a first PTAT slope when the temperature is within a first range of temperatures or a second PTAT slope when the temperature is within a second range of temperatures, wherein the second PTAT slope is greater than the first PTAT slope, and biasing the amplifier circuit based on the generated PTAT bias voltage.