Patent classifications
H01J63/02
SYNTHESIS AND USE OF MATERIALS FOR ULTRAVIOLET FIELD-EMISSION LAMPS
Processes for synthesizing the hexagonal polymorph of boron nitride (h-BN) produce h-BN of a grade that is highly suitable for ultraviolet (UV) field-emission lights and other UV applications.
SYNTHESIS AND USE OF MATERIALS FOR ULTRAVIOLET FIELD-EMISSION LAMPS
Processes for synthesizing the hexagonal polymorph of boron nitride (h-BN) produce h-BN of a grade that is highly suitable for ultraviolet (UV) field-emission lights and other UV applications.
Ultraviolet field-emission lamps and their applications
Improved ultraviolet field-emission lamps can be safely deployed close to people because they eliminate the use of toxic materials, mitigate heating issues, and emit light in a wavelength range that is safe for human exposure.
Reddish light emitting phosphorescent phosphor
Provided is a reddish light emitting phosphorescent phosphor, that is efficiently excited with visible light and is chemically stable. The phosphorescent phosphor comprises a compound represented by MSi.sub.2O.sub.2N.sub.2:Yb,R, wherein M is at least one metal element selected from strontium, calcium, barium, and magnesium, and R is at least one element selected front erbium, holmium, gadolinium, praseodymium, terbium, dysprosium, neodymium, bismuth, scandium, and chromium. The phosphorescent phosphor is an excellent phosphorescent phosphor having a reddish afterglow.
Reddish light emitting phosphorescent phosphor
Provided is a reddish light emitting phosphorescent phosphor, that is efficiently excited with visible light and is chemically stable. The phosphorescent phosphor comprises a compound represented by MSi.sub.2O.sub.2N.sub.2:Yb,R, wherein M is at least one metal element selected from strontium, calcium, barium, and magnesium, and R is at least one element selected front erbium, holmium, gadolinium, praseodymium, terbium, dysprosium, neodymium, bismuth, scandium, and chromium. The phosphorescent phosphor is an excellent phosphorescent phosphor having a reddish afterglow.
Electron guiding and receiving element
The invention relates to an electron antenna as an anode for a micro- or nano-focus X-ray generation comprising an antenna base and an antenna element arranged on the antenna base such that the antenna element protrudes from a front surface of the antenna base, wherein the antenna is arranged to guide and attract the electrons in its vicinity to the top the antenna element.
Electron guiding and receiving element
The invention relates to an electron antenna as an anode for a micro- or nano-focus X-ray generation comprising an antenna base and an antenna element arranged on the antenna base such that the antenna element protrudes from a front surface of the antenna base, wherein the antenna is arranged to guide and attract the electrons in its vicinity to the top the antenna element.
Field emission cathode structure for a field emission arrangement
The present disclosure generally relates to field emission cathode structure for a field emission arrangement, specifically adapted for enhance reliability and prolong the lifetime of the field emission arrangement by arranging a getter element underneath a gas permeable portion of the field emission cathode structure. The present disclosure also relates to a field emission lighting arrangement comprising such a field emission cathode structure and to a field emission lighting system.
Chip testing method and an apparatus for testing of a plurality of field emission light sources
The present invention generally relates to a method for operating a plurality of field emission light sources, specifically for performing a testing procedure in relation to a plurality of field emission light sources manufactured in a chip based fashion. The invention also relates to a corresponding testing system.
Chip testing method and an apparatus for testing of a plurality of field emission light sources
The present invention generally relates to a method for operating a plurality of field emission light sources, specifically for performing a testing procedure in relation to a plurality of field emission light sources manufactured in a chip based fashion. The invention also relates to a corresponding testing system.