An electronic device is provided. The electronic device integrates an enable function and an over-temperature protection function (OTP) on the same line, thereby reducing the PCB layout between a microcontroller and a mainboard circuit, and further reducing the circuit complexity and cost. In addition, the negative temperature coefficient (NTC) thermistor in the electronic device is also directly coupled to a circuit pin used for the enable function of the microcontroller to serve as an over-temperature protection application. Therefore, even if the microcontroller fails, the electronic device may still use the hardware circuit structure to automatically achieve the over-temperature protection function.

Electrical current sensing and monitoring methods include connecting sensing a voltage across a conductor having a non-linear resistance such as a fuse element. The current flowing in the conductor is calculated based on at least a first detected state of the sensed voltage and a thermal equilibrium characterization of the conductor.

A device for testing the operation of a protection unit of an electrical network. The test device includes a generator for generating a pulse train in a secondary winding of a current transformer according to a profile of frequencies such that a measurement of the pulse train after passage through a low-pass filter is lower than a selected trip threshold, and a processing circuit arranged to identify a presence of the pulse train in a signal delivered by a second secondary winding of the current transformer. A protection unit including such a test device and to a method for testing an electrical protection unit.

An electrical circuit is connected between a power source and a plurality of loads. A plurality of load protection devices is connected in parallel in a plurality of branches of a multi-branch, sub-circuit. Each one of the load protection devices is connected to each load in a respective branch. A single power protection device is connected in series between the power source and the sub-circuit. Each of the load protection devices in a respective branch and the single power protection device enable the circuit to have a Class 2 rating.

An EOS event detection circuit coupled to a power supply via a supply voltage rail and comprising a plurality of sub-circuits coupled to the supply voltage rail, each sub-circuit comprising a first transistor, a Zener diode coupled between the supply voltage rail and a first terminal of the first transistor, and a fusible element coupled between a second terminal of the first transistor and the supply voltage rail, wherein the first transistor is configured to cause the fusible element to open when an EOS event occurring on the supply voltage rail exceeds a reverse breakdown voltage of the Zener diode, and wherein the Zener diode in each sub-circuit has a different reverse breakdown voltage.

A thermal protector including a body integrally connected to a magnet wire terminating feature.

A protective circuit protects against overheating of the stator windings of an EC motor. The stator windings are connected to a semiconductor output stage which is designed for time-offset control of the stator windings using a driver circuit of a commutation controller. The protective circuit has two redundant sensor circuits, wherein two resistance-dependent sensor elements connected in series are provided in the first sensor circuit and one resistance-dependent sensor element is provided in the second sensor circuit. The first and the second sensor circuits are connected, respectively, to two evaluating circuits separated from each other and cause an interruption of the driver circuit using switch-off means when a system-specific resistance value of the first sensor element or the one sensor element associated with the second sensor circuit is reached.

A solid-state multi-channel protection circuit includes a microcontroller, a current sensor, a plurality of temperature sensors, and first and second multiplexers selectively connecting the current sensor to one of a plurality of solid-state devices and each of the plurality of temperature sensors to the microcontroller. The microcontroller selectively controls the second multiplexer to receive a temperature output associated with one of the plurality of solid-state devices, and selectively controls the first multiplexer to receiver a current output related to the measured current associated with the same solid-state device, wherein the microcontroller provide over-current protection and over-temperature protection based on the received temperature output and the received current output.

A leakage current detection and interruption (LCDI) device includes a leakage current detection module, including first and second leakage current detection lines, a signal line, and at least one resistive element and/or at least one semiconductor element, configured to detect a leakage current signal on the first or second current-carrying line and to generate a leakage fault signal in response thereto. The first and second leakage current detection lines are electrically insulated from each other, and respectively cover one of the first and second current-carrying lines. A point at which the first and second leakage current detection lines are coupled to each other is coupled to the signal line, to form respective current paths with the signal line, for detecting an open circuit fault in the leakage current detection module. The at least one resistive element and/or the at least one semiconductor element is coupled in the current paths.

A device and method for fuse protection of a line includes at least two sensors for sensing a corresponding electric variable in a first location and a second location along a conductor line, and for outputting a corresponding first value and second value of the electric variable at the first and second locations, respectively. An evaluation unit evaluates the generated first and second values in order to generate an evaluation result. The evaluation unit controls, based on the evaluation result, an isolating element to cause the isolating element to interrupt a current flow in the conductor line.