An impedance measurement circuit and an operating method thereof are provided. The impedance measurement circuit includes a current source, a voltage controlled oscillator (VCO), an operation circuit, and a first delay circuit. The current source, electrically connected to a power rail, is able to sink a current from the power rail according to the delayed clock signal. The VCO is configured to generate an oscillation signal according to a power voltage on the power rail. The operation circuit is electrically connected to the VCO and is configured to receive a sampling clock signal and the oscillation signal, sense the power voltage to generate a sampled signal, and accumulate the sampled signal to generate a measurement result. The first delay circuit, electrically connected to the current source and the operation circuit, is able to receive the sampling clock signal and transmit the delayed clock signal to the current source.

A circuit portion comprises a load circuit portion and a bias circuit portion. The load circuit portion comprises a load transistor. The bias circuit portion comprises a replica transistor matched to the load transistor and connected to the load transistor at a node such that when a current flows through the replica transistor, a current proportional to the current through the replica transistor flows through the load transistor. The bias circuit portion also comprises a current input for receiving an input current, a supply voltage input for receiving a supply voltage, and a feedback loop arranged to: adjust a voltage at the node connecting the replica transistor and the load transistor such that the replica transistor conducts a current proportional to the input current, and counteract variations in the voltage at the node connecting the replica transistor and the load transistor arising from changes in the supply voltage.

A circuit portion comprises a load circuit portion and a bias circuit portion. The load circuit portion comprises a load transistor. The bias circuit portion comprises a replica transistor matched to the load transistor and connected to the load transistor at a node such that when a current flows through the replica transistor, a current proportional to the current through the replica transistor flows through the load transistor. The bias circuit portion also comprises a current input for receiving an input current, a supply voltage input for receiving a supply voltage, and a feedback loop arranged to: adjust a voltage at the node connecting the replica transistor and the load transistor such that the replica transistor conducts a current proportional to the input current, and counteract variations in the voltage at the node connecting the replica transistor and the load transistor arising from changes in the supply voltage.

A digital step attenuator (DSA) cell and related method are provided. The DSA cell includes a first branch comprising a first resistor connected, at a first side, to an input port and, at a second side, to an output port; a second resistor connected, at a first side, to the first resistor and, at a second side, to a first transistor and a third resistor connected, at a first side, to the first resistor and, at a second side, to a second transistor. Also included in the DSA cell is a second branch, in a parallel configuration with the first resistor, that includes a fourth resistor and a third transistor. Also included is a third branch, in a parallel configuration with the first resistor, that includes a fourth transistor. The first transistor, the second transistor, the third transistor, and the fourth transistor are configured to be operated independently.

A digital step attenuator (DSA) cell and related method are provided. The DSA cell includes a first branch comprising a first resistor connected, at a first side, to an input port and, at a second side, to an output port; a second resistor connected, at a first side, to the first resistor and, at a second side, to a first transistor and a third resistor connected, at a first side, to the first resistor and, at a second side, to a second transistor. Also included in the DSA cell is a second branch, in a parallel configuration with the first resistor, that includes a fourth resistor and a third transistor. Also included is a third branch, in a parallel configuration with the first resistor, that includes a fourth transistor. The first transistor, the second transistor, the third transistor, and the fourth transistor are configured to be operated independently.

First and second switches are connected in series between first and second terminals. A third switch is provided between a first node between the first terminal and the first switch, and a first resistive-element. A fourth switch is provided between a second node between the first and second switches, and the reference power-source. A controller switches the first to fourth switches between conduction and non-conduction states. First, third, fifth, and seventh delay-circuits are provided between the first to fourth switches and the controller and delay first, second, third, fourth control signals for switching the first to fourth switches from a conduction state to a non-conduction state, respectively. Second, fourth, sixth, and eighth delay-circuits are provided between the first to fourth switches and the controller and delay the first, second, third, fourth control signals for switching the first to fourth switches to a non-conduction state to a conduction state, respectively.

First and second switches are connected in series between first and second terminals. A third switch is provided between a first node between the first terminal and the first switch, and a first resistive-element. A fourth switch is provided between a second node between the first and second switches, and the reference power-source. A controller switches the first to fourth switches between conduction and non-conduction states. First, third, fifth, and seventh delay-circuits are provided between the first to fourth switches and the controller and delay first, second, third, fourth control signals for switching the first to fourth switches from a conduction state to a non-conduction state, respectively. Second, fourth, sixth, and eighth delay-circuits are provided between the first to fourth switches and the controller and delay the first, second, third, fourth control signals for switching the first to fourth switches to a non-conduction state to a conduction state, respectively.

An electronic device may include wireless circuitry. The wireless circuitry may include a quadratic phase generator for outputting a perfectly interpolated constant amplitude zero autocorrelation (CAZAC) sequence for a transmit path. The quadratic phase generator may include a numerically controlled oscillator, a switch controlled based on a value output from the numerically controlled oscillator, a first integrator stage, and a second integrator stage connected in series with the first integrator stage. The numerically controlled oscillator may receive as inputs a chirp count and a word length. The switch may be configured to switchably feed one of two input values that are a function of the chirp count and the word length to the first integrator stage. The quadratic phase generator may output full-bandwidth chirps or reduced-bandwidth chirps. Bandwidth reduction can be achieved by scaling the two input values of the switches.

An electronic device may include wireless circuitry. The wireless circuitry may include a quadratic phase generator for outputting a perfectly interpolated constant amplitude zero autocorrelation (CAZAC) sequence for a transmit path. The quadratic phase generator may include a numerically controlled oscillator, a switch controlled based on a value output from the numerically controlled oscillator, a first integrator stage, and a second integrator stage connected in series with the first integrator stage. The numerically controlled oscillator may receive as inputs a chirp count and a word length. The switch may be configured to switchably feed one of two input values that are a function of the chirp count and the word length to the first integrator stage. The quadratic phase generator may output full-bandwidth chirps or reduced-bandwidth chirps. Bandwidth reduction can be achieved by scaling the two input values of the switches.

Embodiments herein describe a self-biased divider for a clock in an integrated circuit. In one embodiment, the clock includes a VCO that generates a clock signal that is output to the self-biased divider. However, because the VCO may generate an analog clocking signal (e.g., a low amplitude sine wave of unknown common mode) to reduce jitter, the amplitude can vary which means it may not sufficiently track CMOS parameters. The clocking signals generated by the self-biased divider are used as feedback signals for DC biasing (or DC leveling). In this manner, the divider is referred to a self-biased divider since signals generated by the divider are used to perform DC biasing/leveling.