Certain aspects of the present disclosure generally relate to circuitry and techniques for digital-to-analog conversion. For example, certain aspects provide an apparatus for digital-to-analog conversion. The apparatus generally includes a mixing-mode digital-to-analog converter (DAC), a duty cycle adjustment circuit having an input coupled to an input clock node and having an output coupled to a clock input of the mixing-mode DAC, and a current comparison circuit having inputs coupled to outputs of the mixing-mode DAC and having an output coupled to a control input of the duty cycle adjustment circuit.

An on-vehicle system comprises a Clock Extension Peripheral Interface (CXPI) bus and a device coupled to the CXPI bus as a slave node. The device comprises a transceiver configured to: generate a first signal by delaying an inverted signal of a transmission data signal: generate a second signal based on the transmission data signal, where the second signal has a low slew rate: selectively output the first signal or the second signal as a third signal, in response to a selector signal: and generate a clock signal in response to the third signal, where the clock signal is at a high level when the third signal is at a low level, and where the clock signal is at the low level when the third signal is at the high level.

Oscillators and methods for realignment of an oscillator are provided. An oscillator includes an inductor having first and second terminals and a capacitor electrically coupled in parallel to the inductor at the first and second terminals. A first transistor of a first conductivity type is electrically coupled to the first terminal and a voltage source. The first transistor includes a gate configured to receive a first realignment signal. When the first realignment signal is in a realignment state, the first transistor is turned on and a voltage of the first terminal is increased from a low level to a high level in order to align a phase of a waveform of the oscillator.

A spike generation circuit includes a first CMOS inverter connected between a first power supply and a second power supply, an output node of the first CMOS inverter being coupled to a first node that is an intermediate node coupled to an input terminal to which an input signal is input, a switch connected in series with the first CMOS inverter, between the first power supply and the second power supply, a first inverting circuit that outputs an inversion signal of a signal of the first node to a control terminal of the switch, and a delay circuit that delays the signal of the first node, outputs a delayed signal to an input node of the first CMOS inverter, and outputs an isolated output spike signal to an output terminal.

A semiconductor storage device includes a first chip and a second chip each including a memory cell and configured to receive a same toggle signal. Upon receiving a first command, the first chip executes a first calibration operation to calibrate a duty ratio of an output signal generated in response to the toggle signal while data is read out from the second chip in response to the toggle signal.

A multi-feedback circuit that compares a duty cycle corrected reference clock f.sub.REF, and controls a number of identical delay lines to generate a new clock with a frequency that is a multiple (e.g., 32×, 4×, etc.) of the frequency of f.sub.REF with approximately 50% duty cycle (DC). The new clock is used as a reference clock to a phase locked loop (PLL) or a multiplying delay locked loop (MDLL) resulting in shorter lock times for the PLL/MDLL, higher bandwidth for the PLL/MDLL, lower long-term output clock jitter. The multi-feedback circuit can also be used as a low power clock generator.

A semiconductor device includes a test clock generation circuit, a test data generation circuit, and a control code generation circuit. The test clock generation circuit delays a clock signal based on a delay selection signal in a test mode to generate a test clock signal. The test data generation circuit delays data to generate test data. The control code generation circuit latches the test data based on the delay selection signal and the test clock signal to generate a control code.

A correction circuit includes a first detection unit, a second detection unit, a delay unit, and a waveform shaping unit. The first detection unit is configured to measure a first period of a high level of a first clock. The second detection unit is configured to measure a second period of a high level of a second clock that is complementary to the first clock. The delay unit is configured to generate a first delay clock and a second delay clock according to a difference between the first period and the second period. The waveform shaping unit is configured to generate a third clock having a logic level which is switched based on an edge of the first delay clock and an edge of the second delay clock.

A delay circuit for a clock signal includes a first signal generator, a first inverting circuit, a second signal generator and a second inverting circuit. The first signal generator is configured to generate a plurality of first switching signals based on a delay code. The first inverting circuit includes a plurality of first inverters that are selectively turned on in response to the plurality of first switching signals, respectively, and is configured to adjust a first delay time for both of a first edge and a second edge of the clock signal. The second signal generator is configured to generate a plurality of second switching signals based on a duty code. The second inverting circuit includes a plurality of second pull-up units and a plurality of second pull-down units, respective ones of the plurality of second pull-up units or respective ones of the plurality of second pull-down units are selectively turned on in response to respective ones of the plurality of second switching signals. The second inverting circuit is configured to adjust a second delay time for the first edge, the second edge, or both of the first edge and the second edge of the clock signal.

A pulse-width modulation (PWM) circuit includes a partition circuit coupled to receive a PWM value representing a duty cycle of a PWM signal to be generated, and configured to accordingly generate a most-significant-bits (MSB) value representing higher-order bits of the PWM value and a least-significant-bits (LSB) value representing lower-order bits of the PWM value; a PWM generator coupled to receive the MSB value or a derivative thereof, and configured to accordingly generate a primary signal with a duty cycle corresponding to the MSB value; a delay circuit that generates a delay signal representing the primary signal with delay time determined according to the LSB value or a derivative thereof; and a combine circuit that generates the PWM signal according to the primary signal and the delay signal, by performing a logical operation on the primary signal and the delay signal.