A circuit arrangement is disclosed for controlling the switching of a field effect transistor (FET). A current controlled amplifier may be configured to amplify a current in a current sense device to generate an amplified current, wherein the current in the current sense device indicates a current through the FET. A comparator may be coupled to the current sense amplifier to compare a voltage corresponding to the amplified current with a voltage reference and to generate a comparator output based on the comparison, wherein the comparator output controls whether the FET is on or off.

A circuit and method for controlling charge injection in a circuit are disclosed. In one embodiment, the circuit and method are employed in a semiconductor-on-insulator (SOI) Radio Frequency (RF) switch. In one embodiment, an SOI RF switch comprises a plurality of switching transistors coupled in series, referred to as “stacked” transistors, and implemented as a monolithic integrated circuit on an SOI substrate. Charge injection control elements are coupled to receive injected charge from resistively-isolated nodes located between the switching transistors, and to convey the injected charge to at least one node that is not resistively-isolated. In one embodiment, the charge injection control elements comprise resistors. In another embodiment, the charge injection control elements comprise transistors. A method for controlling charge injection in a switch circuit is disclosed whereby injected charge is generated at resistively-isolated nodes between series coupled switching transistors, and the injected charge is conveyed to at least one node of the switch circuit that is not resistively-isolated.

An apparatus includes a first leg having a plurality of transistors connected in series between a first node and a second node. Each of the plurality of transistors includes a respective body diode. The apparatus further includes a second leg connected between the first node and the second node and in parallel to the series connection of the plurality of transistors of the first leg. The second leg includes a first transistor. The second leg has lower reverse recovery losses relative to the first leg.

A switched power circuit to control a common-mode signal. The switched power circuit includes a first switch and a second switch configured to generate switch mode voltage between a first node and a second node. The switched power circuit further includes a feedback circuit that is configured to detect common-mode voltage generated between the first node and the second node by a first signal generated by the first switch and a second signal generated by the second switch, and incrementally adjust a timing parameter of the first signal to adjust the common-mode signal.

A drive circuit of a power semiconductor element comprises a gate drive voltage generator to generate, based on an ON/OFF drive timing signal input to an input terminal, a gate drive voltage to be applied to a gate electrode of a switching element having the gate electrode for controlling a main current that flows between a first main electrode and a second main electrode, wherein the gate drive voltage generator includes a gate current limiting circuit in which a current limiter to limit a current and a voltage limiter to limit the magnitude of a voltage applied to both ends of the current limiter are connected in parallel.

Disclosed is a semiconductor integrated circuit for a regulator for forming a low current consumption type DC power supply device. The semiconductor integrated circuit includes an output transistor, a control circuit, an operation control transistor and a soft start circuit. The output transistor is connected between an output terminal and a voltage input terminal to which a DC voltage is input. The control circuit controls the output transistor according to a feedback voltage of an output. The operation control transistor controls an operation state of the control circuit. The soft start circuit gradually changes a voltage applied to a control terminal of the operation control transistor and delays activation of the control circuit at a time of applying a power supply voltage to the voltage input terminal.

A method includes detecting a signal on a switching node connected to a power switch, detecting a gate drive voltage of the power switch, during a gate drive process of the power switch, reducing a gate drive current based on a first comparison result obtained from comparing the signal with a first threshold, and during the gate drive process of the power switch, increasing the gate drive current based on a second comparison result obtained from comparing the gate drive voltage with a second threshold.

A damage predicting device of a power semiconductor switching element includes a resistor connected to a gate of the power semiconductor switching element, and control circuitry. The control circuitry compares a detection voltage matching a voltage generated between two ends of the resistor and a reference voltage, and predicts that predetermined damage has been accumulated in a gate insulating layer in the power semiconductor switching element when the detection voltage exceeds the reference voltage.

A driver circuit may be configured to control a power switch. The driver circuit may comprise an output pin configured to deliver signals to a gate of the power switch to control an ON/OFF state of the power switch, and a comparator configured to compare a gate-to-source voltage of the power switch to a first threshold when the power switch is ON and to compare the gate-to-source voltage of the power switch to a second threshold when the power switch is OFF.

A gate drive device drives a gate of each of two semiconductor switching elements constituting upper and lower arms of a half bridge circuit. The gate drive device detects a peak value of an element voltage that is a voltage of a main terminal of one of the two semiconductor switching elements, as one semiconductor switching element, or a change rate of the element voltage during a change period in which the element voltage changes. The gate drive device determines whether an energization to the one semiconductor switching element during the change period is a forward energization in which a current flows in a forward direction or a reverse energization in which the current flows in a reverse direction.