An electronic device includes a die stack having a plurality of die. The die stack includes a die parity path spanning the plurality of die and configured to alternatingly identify each die as a first type or a second type. The die stack further includes an inter-die signal path spanning the plurality of die and configured to propagate an inter-die signal through the plurality of die, wherein the inter-die signal path is configured to invert a logic state of the inter-die signal between each die. Each die of the plurality of die includes signal formatting logic configured to selectively invert a logic state of the inter-die signal before providing it to other circuitry of the die responsive to whether the die is designated as the first type or the second type.

A signal isolator integrated circuit package includes a first circuit having a first input and a first output, a second circuit having a second input and a second output, an isolation barrier layer between the first circuit and the second circuit, wherein the second output of the second circuit is coupled to the first input of the first circuit through the isolation barrier. The signal isolator includes a comparator configured to compare the first input of the first circuit to the second output of the second circuit. The second output can be configured to convey at least three states, including a first state indicative of a logical high of an input signal received at the first input, a second state indicative of a logical low of the input signal, and a third state indicative of a fault condition.

A sensor includes an output circuit configured to generate a sensor output signal based on an input signal having a logic high or low level, as may be provided by a Schmitt trigger circuit. During normal operation, the output switches between a first percentage of the supply voltage for logic high and a second percentage of the supply voltage for logic low. To convey a failure at the output, an output signal is output as either ground or the supply voltage when a fault is detected. As such, a fault can be communicated any time the output voltage is not equal to the first percentage or the second percentage of the supply voltage.

A memory system includes a stacked memory device and a controller. The stacked memory device includes a base die and a plurality of memory dies stacked on the base die. Each of the plurality of memory dies has a plurality of channels, and the base die is configured to function as an interface for transmitting signals and data of the pluralities of channels. The controller controls the stacked memory device such that first and second data move control operations are sequentially performed to transmit moving data from a target channel of the pluralities of channels to a destination channel of the pluralities of channels. The first data move control operation is performed to store the moving data in the target channel into the base die, and the second data move control operation is performed to write the moving data stored in the base die into the destination channel.

A reconfigurable circuit includes: a complementary resistive switch including a first resistive switch, a second resistive switch and a selection transistor, wherein a first terminal of the first resistive switch is connected to a first terminal of the second resistive switch and connected to a first terminal of the selection transistor; a first current source having a first terminal connected to a second terminal of the first resistive switch and a second terminal connected to a ground voltage line; a second current source having a first terminal connected to a second terminal of the second resistive switch and a second terminal connected to the ground voltage line; and a resistor having a first terminal connected to a second terminal of the selection transistor and a second terminal connected to a power voltage line.

An apparatus is provided which comprises: a first flip-flop (FF) cell with a data path multiplexed with a scan-data path, wherein the scan-data path is independent of a min-delay buffer, wherein the first FF cell has a memory element formed of at least two inverting cells, wherein the two inverting cells are coupled together via a common node; and a second FF cell with a data path multiplexed with a scan-data path, wherein the scan-data path of the second FF cell is independent of a min-delay buffer, and wherein the scan-data path of the second FF cell is coupled to the common node of the first FF cell.

A wide supply range digital level shifter circuit shifts between a variable desired output voltage ranging from a first voltage level and a second voltage level. The wide supply range digital level shifter circuit includes a latch circuit, a first bleeder circuit, and a second bleeder circuit. The latch circuit receives the first voltage level and the second voltage level, and includes first and second clocked differential switches. The first bleeder circuit is connected between the second voltage rail and the first differential switch and is configured to receive a first digital input voltage. The second bleeder circuit is connected between the second voltage rail and the second differential switch and is configured to receive a second digital input voltage. The first and second bleeder circuits isolate the first and second digital input voltages from the variable desired output voltage.

A PAM (Pulse Amplitude Modulation) modulator driver is configured to receive a PAM input signal having N input amplitude levels and provide a PAM output signal having N output amplitude levels, where N is an integer. The PAM modulator driver circuit configured to electrically adjust amplitude levels in the PAM output signal.

In accordance with embodiments of the present disclosure, a system may include a buffer and a switch coupled between the buffer and a voltage supply such that the switch controls a varying voltage at a varying voltage node coupled to the buffer.

A sensor includes an output circuit configured to generate a sensor output signal based on an input signal having a logic high or low level, as may be provided by a Schmitt trigger circuit. During normal operation, the output switches between a first percentage of the supply voltage for logic high and a second percentage of the supply voltage for logic low. To convey a failure at the output, an output signal is output as either ground or the supply voltage when a fault is detected. As such, a fault can be communicated any time the output voltage is not equal to the first percentage or the second percentage of the supply voltage.