Disclosed in some examples are improvements to data placement architectures in NAND that provide additional data protection through an improved NAND data placement schema that allows for recovery from certain failure scenarios. The present disclosure stripes data diagonally across page lines and planes to enhance the data protection. Parity bits are stored in SLC blocks for extra protection until the block is finished writing and then the parity bits may be deleted.

Disclosed in some examples are improvements to data placement architectures in NAND that provide additional data protection through an improved NAND data placement schema that allows for recovery from certain failure scenarios. The present disclosure stripes data diagonally across page lines and planes to enhance the data protection. Parity bits are stored in SLC blocks for extra protection until the block is finished writing and then the parity bits may be deleted.

An integrated circuit designing system includes a non-transitory storage medium encoded with a first set of standard cell layouts and a second set of standard cell layouts both being configured to perform a predetermined function. The predetermined manufacturing process having a nominal minimum pitch (T) of metal lines. Each standard cell layout of the first set of standard cell layouts and the second set of standard cell layouts having a cell height (H) wherein the cell height is a non-integral multiple of the nominal minimum pitch. A hardware processor communicatively is coupled with the non-transitory storage medium and is configured to execute a set of instructions for generating an integrated circuit layout based on the first set of standard cell layouts, the second set of standard cell layouts and the nominal minimum pitch; and creating a data file corresponding to the integrated circuit layout.

An integrated circuit designing system includes a non-transitory storage medium encoded with a first set of standard cell layouts and a second set of standard cell layouts both being configured to perform a predetermined function. The predetermined manufacturing process having a nominal minimum pitch (T) of metal lines. Each standard cell layout of the first set of standard cell layouts and the second set of standard cell layouts having a cell height (H) wherein the cell height is a non-integral multiple of the nominal minimum pitch. A hardware processor communicatively is coupled with the non-transitory storage medium and is configured to execute a set of instructions for generating an integrated circuit layout based on the first set of standard cell layouts, the second set of standard cell layouts and the nominal minimum pitch; and creating a data file corresponding to the integrated circuit layout.

A signal transmission circuit and method for testing an integrated circuit (IC) are disclosed. The signal transmission circuit includes: an input circuit, configured to generate a first test signal in response to a first control signal and a clock signal; a transfer chain, including multiple stages of serially-connected transfer circuits, where adjacent transfer circuits in the transfer chain are connected via a through silicon via (TSV), the transfer circuit on one end of the transfer chain is connected to the input circuit, and the multiple stages of transfer circuits transfer the first test signal in stage by stage in response to the clock signal; and multiple signal output ends, where a first test signal input end of each stage of transfer circuit is correspondingly connected to one signal output end. The signal transmission circuit improves the effective utilization rate of a chip in an IC having a TSV test circuit.

A signal transmission circuit and method for testing an integrated circuit (IC) are disclosed. The signal transmission circuit includes: an input circuit, configured to generate a first test signal in response to a first control signal and a clock signal; a transfer chain, including multiple stages of serially-connected transfer circuits, where adjacent transfer circuits in the transfer chain are connected via a through silicon via (TSV), the transfer circuit on one end of the transfer chain is connected to the input circuit, and the multiple stages of transfer circuits transfer the first test signal in stage by stage in response to the clock signal; and multiple signal output ends, where a first test signal input end of each stage of transfer circuit is correspondingly connected to one signal output end. The signal transmission circuit improves the effective utilization rate of a chip in an IC having a TSV test circuit.

An integrated circuit designing system includes a non-transitory storage medium that is encoded with first and second sets of standard cell layouts that are configured for performing a selected function and which correspond to a specific manufacturing process. The manufacturing process is characterized by a nominal minimum pitch (T) for metal lines with each of the standard cell layouts being characterized by a cell height (H) that is a non-integral multiple of the nominal minimum pitch. The system also includes a hardware processor coupled to the storage medium for executing a set of instructions for generating an integrated circuit layout utilizing a combination of the first and second set of standard cell layouts and the nominal minimum pitch. The first and second sets of standard layouts are related in that each of the second set of standard cell layouts corresponds to a transformed version of a corresponding standard cell layout from the first set of standard cell layouts.

An integrated circuit designing system includes a non-transitory storage medium that is encoded with first and second sets of standard cell layouts that are configured for performing a selected function and which correspond to a specific manufacturing process. The manufacturing process is characterized by a nominal minimum pitch (T) for metal lines with each of the standard cell layouts being characterized by a cell height (H) that is a non-integral multiple of the nominal minimum pitch. The system also includes a hardware processor coupled to the storage medium for executing a set of instructions for generating an integrated circuit layout utilizing a combination of the first and second set of standard cell layouts and the nominal minimum pitch. The first and second sets of standard layouts are related in that each of the second set of standard cell layouts corresponds to a transformed version of a corresponding standard cell layout from the first set of standard cell layouts.

Various examples of reprogrammable universal logic devices are provided. In one example, the device can include a tunable AC input to an oscillator/resonator; a first logic input and a second logic input to the oscillator/resonator, the first and second logic inputs provided by separate DC voltage sources (VA, VB), each of the first and second logic inputs including an on/off switch (A, B); and the oscillator/resonator including an output terminal. The tunable oscillator/resonator can be a MEMS/NEMS resonator. Switching of one or both of the first or second logic inputs on or off in association with the tuning of the AC input can provide logic gate operation. The device can easily be extended to a 3-bit or n-bit device by providing additional logic inputs. Binary comparators and encoders can be implemented using a plurality of oscillators/resonators.

Various examples of reprogrammable universal logic devices are provided. In one example, the device can include a tunable AC input to an oscillator/resonator; a first logic input and a second logic input to the oscillator/resonator, the first and second logic inputs provided by separate DC voltage sources (VA, VB), each of the first and second logic inputs including an on/off switch (A, B); and the oscillator/resonator including an output terminal. The tunable oscillator/resonator can be a MEMS/NEMS resonator. Switching of one or both of the first or second logic inputs on or off in association with the tuning of the AC input can provide logic gate operation. The device can easily be extended to a 3-bit or n-bit device by providing additional logic inputs. Binary comparators and encoders can be implemented using a plurality of oscillators/resonators.