A system and method for a logic device is disclosed. A first substrate, a second substrate and a third substrate is provided. A first input nanomagnet is disposed over the first substrate, a second input nanomagnet is disposed over the second substrate, and a third input nanomagnet is disposed over the third substrate. A spacer layer is disposed over the first input nanomagnet, the second input nanomagnet, and the third input nanomagnet. An output magnet is disposed over the spacer layer.

A system and method for a logic device is disclosed. A first substrate, a second substrate and a third substrate is provided. A first input nanomagnet is disposed over the first substrate, a second input nanomagnet is disposed over the second substrate, and a third input nanomagnet is disposed over the third substrate. A spacer layer is disposed over the first input nanomagnet, the second input nanomagnet, and the third input nanomagnet. An output magnet is disposed over the spacer layer.

A power supply switch circuit includes a first transistor that switches supplying of a first power supply voltage to a power supply terminal of a power amplifier, a switch controller that controls the first transistor and to which a second power supply voltage is applied, and a voltage selector that selects a higher voltage among the first power supply voltage and the second power supply voltage. The selected higher voltage is applied to a body terminal of the first transistor or a gate terminal of the first transistor.

A power supply switch circuit includes a first transistor that switches supplying of a first power supply voltage to a power supply terminal of a power amplifier, a switch controller that controls the first transistor and to which a second power supply voltage is applied, and a voltage selector that selects a higher voltage among the first power supply voltage and the second power supply voltage. The selected higher voltage is applied to a body terminal of the first transistor or a gate terminal of the first transistor.

A signal sampling circuit includes the following: a signal input circuit, configured to determine a to-be-processed instruction signal and a to-be-processed chip select signal; a first instruction sampling circuit, configured to perform two-stage sampling and logic operation processing on the to-be-processed chip select signal according to a first clock signal to obtain a first chip select clock signal; a second instruction sampling circuit, configured to perform two-stage sampling and logic operation processing on the to-be-processed chip select signal according to the first clock signal to obtain a second chip select clock signal; and an instruction decoding circuit, configured to perform decoding and sampling processing on the to-be-processed instruction signal according to be to-be-processed chip select signal and one of the first chip select clock signal and the second chip select clock signal to obtain a target instruction signal.

A signal sampling circuit includes the following: a signal input circuit, configured to determine a to-be-processed instruction signal and a to-be-processed chip select signal; a first instruction sampling circuit, configured to perform two-stage sampling and logic operation processing on the to-be-processed chip select signal according to a first clock signal to obtain a first chip select clock signal; a second instruction sampling circuit, configured to perform two-stage sampling and logic operation processing on the to-be-processed chip select signal according to the first clock signal to obtain a second chip select clock signal; and an instruction decoding circuit, configured to perform decoding and sampling processing on the to-be-processed instruction signal according to be to-be-processed chip select signal and one of the first chip select clock signal and the second chip select clock signal to obtain a target instruction signal.

An integrated circuit includes a pipeline of compare logic stages. The pipeline, at successive pipeline stages, determines whether each of a set of input symbols meets a corresponding programmable criteria. The compare logic stages each compare the set of input symbols to a respective programmable value. The compare logic stages also each provide, to a respective successive compare logic stage, a corresponding plurality of indicators of whether respective ones of the set of input symbols met the corresponding programmable criteria for that compare logic stage. The corresponding programmable criteria are configurable to be based at least in part on the corresponding plurality of indicators from a respective previous compare logic stage.

An integrated circuit includes a pipeline of compare logic stages. The pipeline, at successive pipeline stages, determines whether each of a set of input symbols meets a corresponding programmable criteria. The compare logic stages each compare the set of input symbols to a respective programmable value. The compare logic stages also each provide, to a respective successive compare logic stage, a corresponding plurality of indicators of whether respective ones of the set of input symbols met the corresponding programmable criteria for that compare logic stage. The corresponding programmable criteria are configurable to be based at least in part on the corresponding plurality of indicators from a respective previous compare logic stage.

A computing device (e.g., an FPGA or integrated circuit) processes an incoming packet comprising data to compute a Galois hash. The computing device includes a plurality of circuits, each circuit providing a respective result used to determine the Galois hash, and each circuit including: a first multiplier configured to receive a portion of the data; a first exclusive-OR gate configured to receive an output of the first multiplier as a first input, and to provide the respective result; and a second multiplier configured to receive an output of the first exclusive-OR gate, wherein the first exclusive-OR gate is further configured to receive an output of the second multiplier as a second input. In one embodiment, the computing device further comprises a second exclusive-OR gate configured to output the Galois hash, wherein each respective result is provided as an input to the second exclusive-OR gate.

Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.