A method and apparatus for generating a drive signal for driving a resolver sensor are provided. The method and apparatus implement a drive signal to be input to a resolver sensor. The method and apparatus perform counting in association with an incoming square wave signal and implement a drive signal after confirming that a specific point corresponding to a preset condition of the incoming square wave signal arrives.

A method and apparatus for generating a drive signal for driving a resolver sensor are provided. The method and apparatus implement a drive signal to be input to a resolver sensor. The method and apparatus perform counting in association with an incoming square wave signal and implement a drive signal after confirming that a specific point corresponding to a preset condition of the incoming square wave signal arrives.

A method and apparatus for generating a drive signal for driving a resolver sensor are provided. The method and apparatus implement a drive signal to be input to a resolver sensor. The method and apparatus perform counting in association with an incoming square wave signal and implement a drive signal after confirming that a specific point corresponding to a preset condition of the incoming square wave signal arrives.

A management controller is coupled to a plurality of external devices. The management controller includes a control circuit and a transmission circuit. The control circuit generates a control signal according to a first counting value and a second counting value. The transmission circuit is coupled to the external devices. In response to the first counting value not being equal to a first target value, the transmission circuit enters a circulating mode according to the control signal. In the circulating mode, the transmission circuit triggers the external devices in order. In response to the second counting value not being equal to a second target value, the transmission circuit continues to operate in the circulating mode. In response to the second counting value being equal to the second target value, the transmission circuit exits the circulating mode.

The system comprising a slave module and a master module. The master module comprises a master control module (CONTRM). The slave module comprises a determination module (DETER). The determination module (DETER) is configured to determine a value of a physical quantity of the slave module. The determination module (DETER) is configured to receive, from the master control module (CONTRM), a command to start counting and a command to end counting. The determination module (DETER) is configured to determine a number of oscillations, between reception of the command to start counting and reception of the command to end counting, of an oscillating signal of which a frequency depends on the value of the physical quantity.

The system comprising a slave module and a master module. The master module comprises a master control module (CONTRM). The slave module comprises a determination module (DETER). The determination module (DETER) is configured to determine a value of a physical quantity of the slave module. The determination module (DETER) is configured to receive, from the master control module (CONTRM), a command to start counting and a command to end counting. The determination module (DETER) is configured to determine a number of oscillations, between reception of the command to start counting and reception of the command to end counting, of an oscillating signal of which a frequency depends on the value of the physical quantity.

The invention concerns a frequency locked loop comprising: a digitally controlled oscillator (102) configured to generate a frequency signal (F); a frequency counter (310) configured to generate an estimate (f_EST) of the frequency of the frequency signal based on a reference clock signal (CLK_REF); and a controller (314) configured to generate a digital control signal (C_FREQ) for controlling the digitally controlled oscillator based on the estimated frequency, wherein the controller is clocked by a further clock signal (CLK) having a variable frequency, and the controller is configured to generate a trigger signal (AUTO_CLEAR) for triggering a counting phase of the frequency counter.

The invention concerns a frequency locked loop comprising: a digitally controlled oscillator (102) configured to generate a frequency signal (F); a frequency counter (310) configured to generate an estimate (f_EST) of the frequency of the frequency signal based on a reference clock signal (CLK_REF); and a controller (314) configured to generate a digital control signal (C_FREQ) for controlling the digitally controlled oscillator based on the estimated frequency, wherein the controller is clocked by a further clock signal (CLK) having a variable frequency, and the controller is configured to generate a trigger signal (AUTO_CLEAR) for triggering a counting phase of the frequency counter.

A stacked semiconductor device includes semiconductor chips, each including a signal transfer circuit respectively transferring a command, an address, and a chip select signal to first to third through electrodes, and respectively transferring a test address and a chip ID to the second and third through electrodes according to a test control signal; a command reception circuit transferring a test command or a signal transferred from the first through electrode to an internal circuit when a signal transferred from the third through electrode is identical to the chip ID coincide with each other; and a test control circuit activating the test control signal according to deactivation of a test control signal of an upper chip, and generating the test command and the test address according to the test control signal.

A stacked semiconductor device includes semiconductor chips, each including a signal transfer circuit respectively transferring a command, an address, and a chip select signal to first to third through electrodes, and respectively transferring a test address and a chip ID to the second and third through electrodes according to a test control signal; a command reception circuit transferring a test command or a signal transferred from the first through electrode to an internal circuit when a signal transferred from the third through electrode is identical to the chip ID coincide with each other; and a test control circuit activating the test control signal according to deactivation of a test control signal of an upper chip, and generating the test command and the test address according to the test control signal.