Patent classifications
H03M1/06
Interleaved analog-to-digital converter (ADC) gain calibration
An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.
ADC having adjustable threshold levels for PAM signal processing
An ADC system dynamically adjusts threshold levels used to resolve PAM signal amplitudes into digital values. The ADC circuitry includes an analog front end to receive and condition the PAM signal, a low-resolution ADC to digitize the conditioned signal according to a first set of threshold values, and a high-resolution ADC to subsample the conditioned signal to generate subsampled signals. A microprocessor in communication with the low-resolution ADC and the high-resolution ADC derives a statistical value from the subsampled signals, determines an updated set of threshold values, and dynamically replaces the first set of threshold values for the low-resolution ADC with the updated set of threshold values.
Analog-to-digital convertor pseudo periodic IL estimation
Aspects of the description provide for an analog-to-digital converter (ADC) operable to convert an analog input signal to an output signal at an output of the ADC. In some examples, the ADC includes multiple sub-ADCs coupled in parallel, each of the multiple sub-ADCs coupled to the output of the ADC and operable to receive the analog input signal. The ADC is configured to operate the sub-ADCs in a consecutive operation loop including a transition phase in which the ADC operates each of the sub-ADCs sequentially for a first number of sequences, an estimation phase in which the ADC operates each of the sub-ADCs sequentially for a second number of sequences following the first number of sequences, and a randomization phase in which the ADC operates subsets of the sub-ADCs for a third number of sequences following the second number of sequences.
Transition aware dynamic element matching
A system includes a digital-to-analog converter comprising a plurality of unit elements, and a dynamic element matching encoder coupled to the digital-to-analog converter. The dynamic element matching encoder includes a circuit configured to determine a number of unit elements of a digital-to-analog converter to be transitioned (N.sub.tm), determine a first number of unit elements to be turned on, and determine a second number of unit elements to be turned off. The circuit may further generate a first signal identifying individual unit elements of one or more unit elements of the digital-to-analog converter in the off state to be turned on, and a second signal identifying the individual unit elements of one or more unit elements of the digital-to-analog converter in the on state to be turned off.
DIGITAL-TO-ANALOG CONVERTER WITH DIGITALLY CONTROLLED TRIM
In described examples, a digital-to-analog converter includes an output, multiple most significant bit (MSB) connector resistors each having a resistance R−ΔR, multiple least significant bit (LSB) connector resistors each having a resistance R, and multiple binary arm resistors each having a resistance 2R. The MSB connector resistors are coupled in a series beginning with the output and ending with a first one of the LSB connector resistors, and the LSB connector resistors are coupled in a series beginning with the first LSB connector resistor. A terminal of one of the binary arm resistors is coupled to an ending of the LSB connector resistor series, and a terminal of each of different remaining ones of the binary arm resistors is coupled between a different pair of the MSB and/or LSB connector resistors.
DIGITAL-TO-ANALOG CONVERTER WITH DIGITALLY CONTROLLED TRIM
In described examples, a digital-to-analog converter (DAC) includes an output, a ground, a reference voltage terminal, an input code terminal, multiple switches, multiple resistors, and a controller. The switches couple to the reference voltage terminal when activated and to the ground when deactivated. The resistors are variously coupled between corresponding ones of the switches and the output, so that activating the switches causes the DAC to output an output voltage. The controller is coupled to the input code terminal and coupled to control the switches. The controller generates an output code based on an input code in response to at least one differential nonlinearity error greater than one least significant bit voltage. The input code corresponds to a first ideal output voltage, the output code corresponds to a second, different ideal output voltage. The controller generates an output voltage by controlling the switches using the output code.
THERMOMETER CODING FOR DRIVING NON-BINARY SIGNALS
Methods, systems, and devices for thermometer coding for driving non-binary signals are described. A set of drivers may be used to drive a signal line, with each of the drivers calibrated to have different individual drive strengths. To drive a signal line to successive voltages in accordance with a non-binary modulation scheme, additional individual drivers of the set may be used. The different drive strengths of the individual drivers of the set may scale in non-linear fashion, which may offset non-linearities associated with the individual drivers as additional individual drivers of the set are activated.
SIGNAL CONVERTER DEVICE, DYNAMIC ELEMENT MATCHING CIRCUIT, AND DYNAMIC ELEMENT MATCHING METHOD
A dynamic element method includes the following operations: summing up most significant bits of a digital code in a previous period and a pointer signal in the previous period, in order to generate a first signal; outputting the first signal to be an adjusted pointer signal according to a clock signal; and decoding the adjusted pointer signal to be control signals, in which the control signals are configured to set corresponding relations of components of a first digital to analog converter circuits and the most significant bits, in order to utilize the components to convert the most significant bits.
DIGITAL TO ANALOG CONVERTER CIRCUIT AND CURRENT STEERING DIGITAL TO ANALOG CONVERTER
An analog to digital convertor circuit includes an input circuit and a switched capacitor circuit. The input circuit is configured to selectively drain a first current from a first node or drain a second current from a second node according to a first bit and a second bit that have opposite logic values. The switched capacitor circuit is configured to compensate a capacitance value of one of the first node and the second node according to the first bit and the second bit.
System and methods for data compression and nonuniform quantizers
A method for differentiator-based compression of digital data includes (a) multiplying a tap-weight vector by an original data vector to generate a predicted signal, the original data vector comprising N sequential samples of an original signal, N being an integer greater than or equal to one, (b) using a subtraction module, subtracting the predicted signal from a sample of the original signal to obtain an error signal, (c) using a quantization module, quantizing the error signal to obtain a quantized error signal, and (d) updating the tap-weight vector according to changing statistical properties of the original signal.