A circuit for analog-digital conversion, which includes a first connection and a second connection and a third connection and a fourth connection for connecting a sensor, an analog-digital converter (ADC), whose first input is connected to the first connection and whose second input is connected to the second connection, a first current source circuit for outputting a first output current, a first switching device for the switchable connection of the first current source circuit to the first connection or to the third connection, a current source/sink circuit for outputting a second output current, a second switching device for the switchable connection of the current source/sink circuit to a reference potential or to the second connection, and a third switching device for the switchable connection of the reference potential to the second connection or to the fourth connection.

An ADC circuit (50) is disclosed. It comprises a global input configured to receive an input voltage (V.sub.in) and a plurality of converter circuits (105.sub.1-105.sub.N). Each converter circuit (105.sub.j) comprises a comparator circuit (70.sub.j) having a first input connected to the global input, a second input, and an output configured to output a one-bit output signal of the comparator circuit (70.sub.j). Furthermore, each converter circuit (105.sub.j) comprises a one-bit current-output DAC (110.sub.j) having an input directly controlled from the output of the comparator circuit (70.sub.j) and an output connected to the second input of the comparator circuit (70.sub.j). The second inputs of all comparator circuits are interconnected. The ADC circuit (50) further comprises a digital output circuit (130) configured to generate an output signal z[n] of the ADC circuit (50) in response to the one-bit output signals of the comparator circuits (70.sub.j).

Disclosed are techniques for wireless communication. In an aspect, a band-pass filter of a radio frequency front end (RFFE) of a user equipment (UE) receives an analog radio frequency (RF) signal having a first bandwidth associated with a first sampling rate, the analog RF signal comprising a positioning reference signal (PRS). An analog-to-digital converter (ADC) of the UE samples the analog RF signal at a second sampling rate to generate a digital RF signal representing the analog RF signal, wherein the ADC operates at a second bandwidth lower than the first bandwidth, and wherein the second sampling rate is lower than the first sampling rate by an inverse of a folding factor for the first bandwidth. The digital RF signal is then output to a baseband processor of the UE.

Disclosed are techniques for wireless communication. In an aspect, a band-pass filter of a radio frequency front end (RFFE) of a user equipment (UE) receives an analog radio frequency (RF) signal having a first bandwidth associated with a first sampling rate, the analog RF signal comprising a positioning reference signal (PRS). An analog-to-digital converter (ADC) of the UE samples the analog RF signal at a second sampling rate to generate a digital RF signal representing the analog RF signal, wherein the ADC operates at a second bandwidth lower than the first bandwidth, and wherein the second sampling rate is lower than the first sampling rate by an inverse of a folding factor for the first bandwidth. The digital RF signal is then output to a baseband processor of the UE.

A voltage regulator circuit included in a computer system may include multiple phase circuits each coupled to a regulated power supply node via a corresponding inductor. The phase circuits may modify a voltage level of the regulated power supply node using respective control signals generated by a digital control circuit that processes multiple data bits. An analog-to-digital converter circuit may compare the voltage level of the regulated power supply node to multiple reference voltage levels and sample the resultant comparisons to generate the multiple data bits.

A voltage regulator circuit included in a computer system may include multiple phase circuits each coupled to a regulated power supply node via a corresponding inductor. The phase circuits may modify a voltage level of the regulated power supply node using respective control signals generated by a digital control circuit that processes multiple data bits. An analog-to-digital converter circuit may compare the voltage level of the regulated power supply node to multiple reference voltage levels and sample the resultant comparisons to generate the multiple data bits.

Disclosed are an analog-to-digital converter error shaping circuit and a successive approximation analog-to-digital converter. The analog-to-digital converter error shaping circuit includes a decentralized capacitor array, a data weighted average module, a mismatch error shaping module, a control logic generation circuit, a digital filter and a decimator. The decentralized capacitor array includes two symmetrically arranged capacitor array units, each capacitor array unit includes a first sub-capacitor array of a high segment bit and a second sub-capacitor array of a low segment bit. The data weighted average module is configured to eliminate correlation between the first sub-capacitor array and an input signal, and the mismatch error shaping module is configured to eliminate correlation between the second sub-capacitor array and the input signal.

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

An input stage for an analog/digital converter, an analog/digital converter and a method for testing analog/digital converters with successive approximation are disclosed. At an input stage, an input signal is supplied via a first transistor arrangement of a sampling capacitor arrangement. The sampling capacitor arrangement can be optionally connected to ground or to a reference voltage by way of a second transistor arrangement and a switch apparatus.

A memory device performs a convolution operation. The memory device includes first to N-th processing elements (PEs), a first analog-to-digital converter (ADC), a first shift adder, and a first accumulator. The first to N-th PEs, where N is a natural number equal to or greater than 2, are respectively associated with at least one weight data included in a weight feature map and are configured to perform a partial convolution operation with at least one input data included in an input feature map. The first ADC is configured to receive a first partial convolution operation result from the first to N-th PEs. The first shift adder shifts an output of the first ADC. The first accumulator accumulates an output from the first shift adder.