An apparatus for detecting a neural spike includes: a preprocessing circuit configured to remove a low-frequency component from a neural signal to form a low-frequency component removed neural signal, and amplify the low-frequency component removed neural signal; a comparing circuit configured to compare an output signal of the preprocessing circuit to a threshold signal; a merging circuit configured to merge spikes within a reference interval of an output signal of the comparing circuit into one peak, and to generate, based on the merging of the spikes, an output signal comprising pulses; and a counting circuit configured to count the pulses.

The fault diagnosis circuit includes a first line including a first resistor, having one end connected to the positive (+) terminal of a battery, and having the other end connected to a first input unit of an analog to digital converter (ADC); a second line including a second resistor, having one end connected to the positive (+) terminal of the battery, and having the other end connected to a first input unit of a comparator; and a third line including a third resistor, having one end connected to the negative () terminal of the battery, having a first other end connected to a second input unit of the ADC, and having a second other end connected to a second input unit of the comparator. A fault in a battery management system can be efficiently diagnosed using a smaller number of elements.

The fault diagnosis circuit includes a first line including a first resistor, having one end connected to the positive (+) terminal of a battery, and having the other end connected to a first input unit of an analog to digital converter (ADC); a second line including a second resistor, having one end connected to the positive (+) terminal of the battery, and having the other end connected to a first input unit of a comparator; and a third line including a third resistor, having one end connected to the negative () terminal of the battery, having a first other end connected to a second input unit of the ADC, and having a second other end connected to a second input unit of the comparator. A fault in a battery management system can be efficiently diagnosed using a smaller number of elements.

Circuits comprising: digital-to-amplitude converter (DAC), comprising: binary weighted switching transistors (BWSTs), each having gate coupled to amplitude control bit ACB, and wherein the drain of each of the BWSTs are connected together and wherein the source of each of the BWSTs are connected together; transistor M1 having gate coupled to input signal and first bias voltage BV1 and source coupled to the drains of the BWSTs; transistor M2 having gate coupled to BV2 and source coupled to the drain of M1; transistor M3 having gate coupled to BV3 and source coupled to the drain of M2; transistor having gate coupled to BV4, source coupled to the drain of M3; and inverter having input coupled to another ACB and having output coupled to the output of the DAC and the drain of M4.

Circuits comprising: digital-to-amplitude converter (DAC), comprising: binary weighted switching transistors (BWSTs), each having gate coupled to amplitude control bit ACB, and wherein the drain of each of the BWSTs are connected together and wherein the source of each of the BWSTs are connected together; transistor M1 having gate coupled to input signal and first bias voltage BV1 and source coupled to the drains of the BWSTs; transistor M2 having gate coupled to BV2 and source coupled to the drain of M1; transistor M3 having gate coupled to BV3 and source coupled to the drain of M2; transistor having gate coupled to BV4, source coupled to the drain of M3; and inverter having input coupled to another ACB and having output coupled to the output of the DAC and the drain of M4.

Approaches useful to operation of scalable processors with ever larger numbers of logic devices (e.g., qubits) advantageously take advantage of QFPs, for example to implement shift registers, multiplexers (i.e., MUXs), de-multiplexers (i.e., DEMUXs), and permanent magnetic memories (i.e., PMMs), and the like, and/or employ XY or XYZ addressing schemes, and/or employ control lines that extend in a braided pattern across an array of devices. Many of these described approaches are particularly suited for implementing input to and/or output from such processors. Superconducting quantum processors comprising superconducting digital-analog converters (DACs) are provided. The DACs may use kinetic inductance to store energy via thin-film superconducting materials and/or series of Josephson junctions, and may use single-loop or multi-loop designs. Particular constructions of energy storage elements are disclosed, including meandering structures. Galvanic connections between DACs and/or with target devices are disclosed, as well as inductive connections.

Examples disclosed herein relate to a circuit having first and second analog processors and an analog-to-digital converter coupled to the first and second analog processors. The first analog processor provides a first analog signal having a voltage representing a function of a first vector and a second vector. The second analog processor provides a second analog signal having a voltage representing a function of a binary inverse of the first vector and the second vector. The analog-to-digital converter receives the first analog signal and the second analog signal, compares a signal selected from a group consisting of the first analog signal and the second analog signal to a reference voltage and based on the comparison to the reference voltage, determines a digital result representing the function of the first vector and the second vector.

Examples disclosed herein relate to a circuit having first and second analog processors and an analog-to-digital converter coupled to the first and second analog processors. The first analog processor provides a first analog signal having a voltage representing a function of a first vector and a second vector. The second analog processor provides a second analog signal having a voltage representing a function of a binary inverse of the first vector and the second vector. The analog-to-digital converter receives the first analog signal and the second analog signal, compares a signal selected from a group consisting of the first analog signal and the second analog signal to a reference voltage and based on the comparison to the reference voltage, determines a digital result representing the function of the first vector and the second vector.

A list of digital elements to be sorted are converted to a group of analog signals. The group of analog signals are simultaneously compared to each other to determine the largest analog signal in the group. The largest analog signal is then compared to each of the analog signals in the group to determine which one or more of the analog signals in the group matches the largest analog signal. The matching one or more of the analog signals is removed from the group and the process is repeated until the group of analog signals have been sorted.

An interface circuit, comprising: a signal line having signal, auxiliary and connection nodes defined therealong, the connection node for connection to a transmission line; signal-handling circuitry connected to the signal line at the signal node; an auxiliary circuit connected to the signal line at the auxiliary node; a signal pair of inductors connected in series along the signal line adjacent to and either side signal node; and an auxiliary pair of inductors connected in series along the signal line adjacent to and either side of the auxiliary node, wherein: the signal pair of inductors are configured to have a mutual coupling defined by a coupling coefficient kS; the pair of inductors are configured to have a mutual coupling defined by a coupling coefficient kA; and kS has a positive value and kA has a negative value.