A time-interleaved clock circuit, including circuitry to provide multiple clock components of a sampling clock. The clock components are corrected by averaging pairs of the multiple clock components in order to output averaged signals. The time-interleaved clock is applied to data conversion in which input signals of the analog signal domain or of the digital signal domain are sampled based on the corrected clock components and converted to the digital signal domain or the analog signal domain, respectively.

A continuous-time analog-to-digital converter (ADC) includes a plurality of integrators selectively coupled in series. The ADC may further include a quantizer with excess loop delay (ELD) compensation. The quantizer may be coupled in series to a least one integrator. The ELD compensation may be programmable based on a transfer function of the ADC. The ADC may further include parallel digital-to-analog converters (DACs). Each DAC may have an input coupled to an output of the quantizer, and an output coupled to an input of a corresponding integrator. The ADC may further include a bypass path coupled to an input or output of one of the integrators. The bypass path may be configured to selectively bypass one or more of the integrators to change the transfer function of the ADC.

A continuous-time analog-to-digital converter (ADC) includes a plurality of integrators selectively coupled in series. The ADC may further include a quantizer with excess loop delay (ELD) compensation. The quantizer may be coupled in series to a least one integrator. The ELD compensation may be programmable based on a transfer function of the ADC. The ADC may further include parallel digital-to-analog converters (DACs). Each DAC may have an input coupled to an output of the quantizer, and an output coupled to an input of a corresponding integrator. The ADC may further include a bypass path coupled to an input or output of one of the integrators. The bypass path may be configured to selectively bypass one or more of the integrators to change the transfer function of the ADC.

A controllable temperature coefficient bias (CTCB) circuit is disclosed. The CTCB circuit can provide a bias to an amplifier. The CTCB circuit includes a variable with temperature (VWT) circuit having a reference circuit and a control circuit. The control circuit has a control output, a first current control element and a second current control element. Each current control element has a controllable resistance. One of the two current control elements may have a relatively high temperature coefficient and another a relatively low temperature coefficient. A controllable resistance of one of the current control elements increases when the controllable resistance of the other current control element decreases. However, the total resistance of the current control circuit remains constant with a constant temperature. The VWT circuit has an output with a temperature coefficient that is determined by the relative amount of current that flows through each current control element of the control circuit. A Current Digital to Analog Converter (IDAC) scales the output of the VWT and provides the scaled output to an amplifier bias input.

A controllable temperature coefficient bias (CTCB) circuit is disclosed. The CTCB circuit can provide a bias to an amplifier. The CTCB circuit includes a variable with temperature (VWT) circuit having a reference circuit and a control circuit. The control circuit has a control output, a first current control element and a second current control element. Each current control element has a controllable resistance. One of the two current control elements may have a relatively high temperature coefficient and another a relatively low temperature coefficient. A controllable resistance of one of the current control elements increases when the controllable resistance of the other current control element decreases. However, the total resistance of the current control circuit remains constant with a constant temperature. The VWT circuit has an output with a temperature coefficient that is determined by the relative amount of current that flows through each current control element of the control circuit. A Current Digital to Analog Converter (IDAC) scales the output of the VWT and provides the scaled output to an amplifier bias input.

The noise power of an amplifier or buffer can increase towards the unity gain cross-over frequency of the amplifier. The inventor realized that many applications do not require the full bandwidth capability of the amplifier all of the time and hence step could be taken to reduce the bandwidth at the output of the amplifier and hence the noise power can be reduced when appropriate, taking other operating requirements into consideration.

The noise power of an amplifier or buffer can increase towards the unity gain cross-over frequency of the amplifier. The inventor realized that many applications do not require the full bandwidth capability of the amplifier all of the time and hence step could be taken to reduce the bandwidth at the output of the amplifier and hence the noise power can be reduced when appropriate, taking other operating requirements into consideration.

A digital-to-analog converter (DAC) controller system may be configured for controlling switching in an associated digital-to-analog converter (DAC), based on a plurality of system inputs that include at least a first system input corresponding to an input applied to the DAC for controlling switching therein, and a second system input that includes a reference control signal. The DAC controller system may include a logic gate circuit that generates a gate output based on two gate inputs that include the first system input and an input set based on the second system input; and a plurality of timing circuits that generate timing outputs for controlling timing of switching in the DAC, which include at least one timing circuit that generates a timing output based on the gate output, with the timing output configured for application in conjunction with and for adjusting a timing output of another timing circuit.

A correction system is configured to correct for duty cycle distortion and/or cross-point distortion in a pair of sample signals. A slope adjustment circuit is configured to generate a plurality of pairs of intermediate signals according to a plurality of drive strengths. A measurement circuit is configured to measure for duty cycle distortion and/or cross-point distortion, and the slope adjustment circuit is configured to set the plurality of drive strengths based on the measurement. The setting of the drive strengths may reduce certain rising and falling slopes of certain transitions of the plurality of intermediate signals, which in turn may reduce duty cycle distortion and/or cross-point distortion in the sample signals.

A correction system is configured to correct for duty cycle distortion and/or cross-point distortion in a pair of sample signals. A slope adjustment circuit is configured to generate a plurality of pairs of intermediate signals according to a plurality of drive strengths. A measurement circuit is configured to measure for duty cycle distortion and/or cross-point distortion, and the slope adjustment circuit is configured to set the plurality of drive strengths based on the measurement. The setting of the drive strengths may reduce certain rising and falling slopes of certain transitions of the plurality of intermediate signals, which in turn may reduce duty cycle distortion and/or cross-point distortion in the sample signals.