An X-ray radiation sensor device may include a direct X-ray conversion layer, a plurality of electrodes to provide an electric charge in response to an interaction of an X-ray photon within the direct X-ray conversion layer, a plurality of pixel sensor arrays, and at least one interposer. The direct X-ray conversion layer and the plurality of electrodes are disposed on the top surface of the interposer(s). The plurality of the pixel sensor arrays is disposed on the bottom surface of the interposer(s), and the interposer(s) is configured to electrically couple each of the pixel sensor arrays to a respective portion of the plurality of electrodes.

Techniques are provided for x-ray onset detection for an intraoral dental sensor. A methodology implementing the techniques according to an embodiment includes calculating a plurality of superpixel values for each of a plurality of rows of detector pixels of a sensor. Each of the superpixel values is based on a sum of pixel values of a set of pixels associated with the superpixel value, the set of pixels selected from the detection row of a current frame of the sensor. The method also includes calculating a difference between each of the superpixel values and a corresponding stored superpixel value generated from a previous sensor frame and determining if the differences exceed a superpixel threshold value. The method further includes incrementing a hit counter in response to the determination and generating a detection signal if the hit counter exceeds a hit count threshold, otherwise proceeding to process the next detection row.

An apparatus includes: a first pixel for acquiring an image, the first pixel including a first conversion element and a first thin-film transistor and connected to a first signal line; and a second pixel for correcting an output of the first pixel, the second pixel including an element and a second thin-film transistor and connected to a second signal line, in which a ratio between a plurality of capacitances related to the first signal line and a ratio between a plurality of capacitances related to the second signal line are approximately equivalent.

An apparatus includes: a first pixel for acquiring an image, the first pixel including a first conversion element and a first thin-film transistor and connected to a first signal line; and a second pixel for correcting an output of the first pixel, the second pixel including an element and a second thin-film transistor and connected to a second signal line, in which a ratio between a plurality of capacitances related to the first signal line and a ratio between a plurality of capacitances related to the second signal line are approximately equivalent.

Some embodiments include a method, comprising: integrating an input signal using an integrator to generate an integrated signal; comparing the integrated signal to a threshold; and injecting an offset signal into the integrator in response to comparing the integrated signal to the threshold such that the integrated signal passes the threshold.

The present invention is related to an X-ray detector and to an X-ray detector system comprising the X-ray detector. It is further related to an X-ray system and to a method for obtaining an X-ray image.

According to the invention, the X-ray detector is configured to be operable in a mixed read-out mode in which an output of the X-ray sensor comprises sequentially obtained first blocks, each first block comprising a plurality of sequentially obtained different second blocks, wherein each second block comprises a read-out of the target segment, and wherein more than one of the second blocks comprises a different part of the additional segments such that each first block comprises a read-out for each of the plurality of segments.

A radiographic image capturing apparatus, includes the following. A sensor panel includes scanning lines, signal lines, a two-dimensional array of radiation detecting elements each having a first electrode and a second electrode, bias lines each applying a reverse bias voltage to the corresponding radiation detecting element, and switching elements. The first electrode of each radiation detecting element is connected to the corresponding bias line. The second electrode of the radiation detecting element is connected to the corresponding signal line via the corresponding switch element. A determination unit determines any defect in the sensor panel based on a signal value read after varying a potential difference between each signal line and the corresponding bias line or a signal value read after turning-on or turning-off of each switching element during a readout operation from the corresponding radiation detecting element.

A method for calibrating an imaging device comprising a photon counting detector (PCD), the method comprising: providing (i) an X-ray source configured to emit an X-ray beam, (ii) a first detector array configured to be in alignment with the X-ray beam, wherein the first detector array comprises a plurality of energy integrating detectors (EID) for detecting the X-ray beam emitted by the X-ray source, and (iii) a second detector array configured to be in alignment with the X-ray beam, wherein the second detector array comprises a plurality of photo counting detectors (PCD) for detecting the X-ray beam emitted by the X-ray source; detecting an X-ray beam passed through an object to be scanned with the plurality of energy integrating detectors (EID); recording the X-ray beam passed through the object to be scanned and detected by the plurality of energy integrating detectors (EID) as a first data set; detecting an X-ray beam passed through the object to be scanned with the plurality of photo counting detectors (PCD); recording the X-ray beam passed through the object to be scanned and detected by the plurality of photo counting detectors (PCD) as a second data set; generating a mathematical model from the first data set and the second data set so as to derive an attenuation factor; and applying the attenuation factor to the second data set to calibrate the imaging device.

A method for calibrating an imaging device comprising a photon counting detector (PCD), the method comprising: providing (i) an X-ray source configured to emit an X-ray beam, (ii) a first detector array configured to be in alignment with the X-ray beam, wherein the first detector array comprises a plurality of energy integrating detectors (EID) for detecting the X-ray beam emitted by the X-ray source, and (iii) a second detector array configured to be in alignment with the X-ray beam, wherein the second detector array comprises a plurality of photo counting detectors (PCD) for detecting the X-ray beam emitted by the X-ray source; detecting an X-ray beam passed through an object to be scanned with the plurality of energy integrating detectors (EID); recording the X-ray beam passed through the object to be scanned and detected by the plurality of energy integrating detectors (EID) as a first data set; detecting an X-ray beam passed through the object to be scanned with the plurality of photo counting detectors (PCD); recording the X-ray beam passed through the object to be scanned and detected by the plurality of photo counting detectors (PCD) as a second data set; generating a mathematical model from the first data set and the second data set so as to derive an attenuation factor; and applying the attenuation factor to the second data set to calibrate the imaging device.

A radiation imaging apparatus includes an imaging unit having sensors configured to detect radiation, and configured to output an analog signal from each sensor, an AD converter configured to, in each AD conversion period corresponding to a frame, convert the analog signals from the imaging unit into digital signals and output the digital signals as a serial data string of bits, a serial-parallel conversion unit configured to convert, into parallel data, the serial data string of the bits from the AD converter, and an alignment unit configured to perform alignment for the serial-parallel conversion unit to identify the serial data string. The alignment unit performs the alignment in at least a period between one AD conversion period and another analog-to-digital conversion period, in addition to performing the alignment before a first AD conversion period.