Improvement of noise characteristics is achievable. A solid-state imaging device according to an embodiment includes a plurality of photoelectric conversion elements (333) arranged in a two-dimensional grid shape in a matrix direction and each generating a charge corresponding to a received light amount, and a detection unit (400) that detects a photocurrent produced by the charge generated in each of the plurality of photoelectric conversion elements. A chip (201a) on which the photoelectric conversion elements are disposed and a chip (201b) on which at least a part of the detection unit is disposed are different from each other.

Improvement of noise characteristics is achievable. A solid-state imaging device according to an embodiment includes a plurality of photoelectric conversion elements (333) arranged in a two-dimensional grid shape in a matrix direction and each generating a charge corresponding to a received light amount, and a detection unit (400) that detects a photocurrent produced by the charge generated in each of the plurality of photoelectric conversion elements. A chip (201a) on which the photoelectric conversion elements are disposed and a chip (201b) on which at least a part of the detection unit is disposed are different from each other.

An imaging device including pixels each including: a photoelectric converter including a first electrode, a second electrode, and a photoelectric conversion layer between the first electrode and the second electrode, the second electrode of each of the pixels being electrically connected to each other; and a transistor having a gate electrically connected to the first electrode. The imaging device further including voltage supply circuitry electrically connected to the second electrode, in which the voltage supply circuitry supplies a first voltage to the second electrode in an exposure period, the voltage supply circuitry supplies a second voltage to the second electrode in a non-exposure period, an a potential difference between the first electrode and the second electrode in the non-exposure period is less than a potential difference between the first electrode and the second electrode in the exposure period.

An imaging device including a semiconductor substrate; a first pixel including a first photoelectric converter configured to convert incident light into charge, and a first diffusion region in the semiconductor substrate, configured to electrically connected to the first photoelectric converter and a second pixel including a second photoelectric converter, configured to convert incident light into charge, and a second diffusion region in the semiconductor substrate, configured to electrically connected to the second photoelectric converter, wherein an area of the first photoelectric converter is greater than an area of the second photoelectric converter in a plan view, both the first diffusion region and the second diffusion region overlap with the first photoelectric converter in the plan view, and neither the first diffusion region nor the second diffusion region overlaps with the second photoelectric converter in the plan view.

A method including collecting analog image data from an imaging array wherein the analog image data includes analog image data from a plurality of imaging pixels and from a plurality of opaque pixels. Each row of the imaging array includes both imaging pixels and opaque pixels. Opaque subtraction is performed in an analog domain, wherein biases determined in the opaque pixels for a given row of the imaging array are subtracted from the analog image data of the imaging pixels of that given row for each row of the imaging array. Performing opaque subtraction includes suppressing outliers in the analog image data from the plurality of opaque pixels. The method includes performing analog to digital conversion (ADC) on the analog image data to produce digital image data for the imaging pixels. ADC is performed after opaque subtraction in the analog domain.

A method including collecting analog image data from an imaging array wherein the analog image data includes analog image data from a plurality of imaging pixels and from a plurality of opaque pixels. Each row of the imaging array includes both imaging pixels and opaque pixels. Opaque subtraction is performed in an analog domain, wherein biases determined in the opaque pixels for a given row of the imaging array are subtracted from the analog image data of the imaging pixels of that given row for each row of the imaging array. Performing opaque subtraction includes suppressing outliers in the analog image data from the plurality of opaque pixels. The method includes performing analog to digital conversion (ADC) on the analog image data to produce digital image data for the imaging pixels. ADC is performed after opaque subtraction in the analog domain.

An image processing apparatus includes a correction factor calculating unit configured to calculate a correction factor for correcting a difference in pixel values corresponding to a difference between a spectral sensitivity and a preset reference spectral sensitivity in a predetermined wavelength range at a pixel of interest, based on image data generated by an image sensor, the image sensor having a plurality of pixels on which color filters of a plurality of colors with different spectral transmittances are respectively disposed, the color filters forming a predetermined array pattern, the correction factor calculating unit being configured to calculate the correction factor for each of the plurality of pixels on which at least a predetermined color filter of the color filters is disposed.

Disclosed are a system, apparatus, and method for rolling shutter compensation. An image having a plurality of scanlines captured at different times may be received from a rolling shutter camera where each scanline includes a plurality of 2D pixels, and where each scanline has an associated camera pose. One or more 2D pixels in a first scanline of the received image to 3D coordinates may be unprojected and the 3D coordinates may be transformed from the first scanline to a reference pose. The transformed 3D coordinates may be reprojected, and in response to the reprojecting, reference timeframe corrected 2D coordinates for the one or more 2D pixels in the first scanline may be provided.

An imaging apparatus includes: an imaging element; an imaging element driving unit that directs the imaging element to alternately perform imaging operations at a first frame rate and a second frame rate being different from the first frame rate; and a flicker detection unit that detects whether a first flicker of a light source with a first frequency is present and whether a second flicker of a light source with a second frequency is present, based on a captured image signal obtained by an imaging operation at the first frame rate, a captured image signal obtained by an imaging operation at the second frame rate following the imaging operation at the first frame rate and a captured image signal obtained by an another imaging operation at the first frame rate or the second frame rate, wherein the first frame rate and the second frame rate are as defined herein.

An imaging apparatus includes: an imaging element; an imaging element driving unit that directs the imaging element to alternately perform imaging operations at a first frame rate and a second frame rate being different from the first frame rate; and a flicker detection unit that detects whether a first flicker of a light source with a first frequency is present and whether a second flicker of a light source with a second frequency is present, based on a first captured image signal obtained by an imaging operation at the first frame rate and a second captured image signal obtained by an imaging operation at the second frame rate as defined herein, and a sum of a duration of a first frame period based on the first frame rate and a duration of a second frame period based on the second frame rate is a value as defined herein