H04N25/60

IMAGING ELEMENT AND IMAGING DEVICE
20220385844 · 2022-12-01 · ·

An imaging element includes a first substrate that is provided with a photoelectric conversion unit which generates an electric charge by photoelectric conversion, a signal line to which a signal based on the electric charge generated by the photoelectric conversion unit is output, and a supply unit which supplies a voltage to the signal line such that a voltage of the signal line does not fall below a predetermined voltage, and a second substrate that is provided with a processing unit which processes the signal output to the signal line and is stacked on the first substrate.

IMAGING APPARATUS AND METHOD

Provided are an imaging apparatus and a method capable of capturing a high-quality multi spectral image. The imaging apparatus includes: an optical system that has three or more aperture regions at a pupil position or near the pupil position, each of the aperture regions being provided with a different combination of a polarizing filter and a bandpass filter such that the aperture region transmits light having a combination of a different polarization angle and a different wavelength range; an image sensor in which three or more types of pixels that receive light having different polarization angles are arranged two-dimensionally; and a processor that performs interference removal processing on a signal output from the image sensor and generates an image signal for each of the aperture regions. In a case where the optical system has three or more types of the polarizing filters and the polarizing filters are arranged in an order of the polarization angles, at least one of differences in the polarization angles of the adjacent polarizing filters is different from the others.

IMAGE SENSOR INCLUDING IMAGE SIGNAL PROCESSOR AND OPERATING METHOD OF THE IMAGE SENSOR

An image sensor including an image signal processor and an operating method of the image sensor are provided. An image sensor may include a pixel array configured to convert a received optical signal into electrical signals, a readout circuit configured to analog-digital convert the electrical signals to generate image data, and an image signal processor configured to perform one-dimensional filtering in each of a first direction and a second direction on the image data to remove noise of the image data, the second direction being different than the first direction.

PIXEL NOISE CANCELLATION SYSTEM

Some embodiments include a system, comprising: a plurality of pixels; a plurality of data lines coupled to the pixels; a plurality of switches coupling the pixels to the data lines; a plurality of readout circuits coupled to the data lines; control logic coupled to the readout circuits, the control logic configured to, for one of the pixels: acquire a first value for the pixel while the corresponding switch is in an off state; reset the corresponding readout circuit corresponding for the pixel; acquire a second value for the pixel after resetting the readout circuit; turn on the corresponding switch; acquire a third value for the pixel after turning on the corresponding switch; and combine the first value, the second value, and the third value into a combined value for the pixel.

Image sensors for measuring distance including delay circuits for transmitting separate delay clock signals

An image sensor includes a plurality of pixels and photo gate controller circuitry. Each pixel may transmit a pixel signal, corresponding to a photoelectric signal, in response to a photo gate signal in a frame. The photo gate controller circuitry may generate photo gate signals and transmit photo gate signals to the pixels. The photo gate controller circuitry includes a first delay circuit configured to transmit first delay clock signals each being delayed with respect to a reference clock signal by a certain amount of time and a second delay circuit configured to transmit second delay clock signals each being delayed with respect to the reference clock signal by a certain amount of time. The pixels are each configured to selectively receive signals, as the photo gate signals, among the delay clock signals output from the first delay circuit and the delay clock signals output from the second delay circuit.

OBJECT RECOGNITION SYSTEM, SIGNAL PROCESSING METHOD OF OBJECT RECOGNITION SYSTEM, AND ELECTRONIC APPARATUS
20220375256 · 2022-11-24 ·

An object recognition system of the present disclosure includes: a light source section that irradiates a subject with dot light having a predetermined pattern; an event detection sensor that receives the dot light having the predetermined pattern reflected by the subject and detects, as an event, that a change in luminance of a pixel exceeds a predetermined threshold; and a signal processor that performs, in a case where a plurality of successive pixels in a pixel array section of the event detection sensor detects occurrence of an event in a certain period, processing of removing the event as noise, the plurality of successive pixels being equal to or greater than a predetermined number of pixels.

ELECTRONIC DEVICE AND HDR IMAGE GENERATION METHOD THEREFOR

An electronic device and a high dynamic range (HDR) image generation method therefore are provided. The electronic device includes an image sensor and a processor, wherein the processor can be configured to adjust the exposure of the image sensor so as to acquire a first image having a first brightness and a plurality of second images having a second brightness, perform, on the first image, brightness conversion and noise attenuation of at least a first intensity so as to provide a third image having the second brightness, and generate a second HDR image on the basis of the first image and the third image, and generate a second HDR image on the basis of the first HDR image and the plurality of second images.

Imaging device

An imaging device includes a photoelectric converter that converts light into signal charge, a charge accumulation region that accumulates the signal charge, a first transistor having a gate connected to the charge accumulation region, and a common gate amplifier circuit that amplifies an output of the first transistor to output to the charge accumulation region. The common gate amplifier circuit includes a second transistor. One of a source and a drain of the second transistor is connected to one of a source and a drain of the first transistor, and the other of the source and the drain of the second transistor is connected to the charge accumulation region.

Imaging device

An imaging device includes a photoelectric converter that converts light into signal charge, a charge accumulation region that accumulates the signal charge, a first transistor having a gate connected to the charge accumulation region, and a common gate amplifier circuit that amplifies an output of the first transistor to output to the charge accumulation region. The common gate amplifier circuit includes a second transistor. One of a source and a drain of the second transistor is connected to one of a source and a drain of the first transistor, and the other of the source and the drain of the second transistor is connected to the charge accumulation region.

Radiation imaging apparatus, radiation imaging system, method of controlling radiation imaging apparatus, and non-transitory computer-readable storage medium

A radiation imaging apparatus comprising a pixel array and a readout circuit is provided. The readout circuit includes an integrating amplifier configured to read out a signal from the pixel, a sample-and-hold circuit configured to sample an output from the integrating amplifier, and an A/D convertor configured to perform analog/digital conversion on an output from the sample-and-hold circuit and output the converted output. The apparatus performs first control and second control in parallel in an accumulation period for accumulating the signal in the pixel array. In the first control, the A/D convertor performs an analog/digital conversion operation, and in the second control, the integrating amplifier outputs a reference potential and the A/D convertor is electrically connected to a node configured to output the reference potential of the integrating amplifier.