H10N50/20

MAGNETIC MEMORY DEVICE

According to one embodiment, a magnetic memory device includes a first ferromagnetic layer, a first nonmagnetic layer provided on the first ferromagnetic layer, a second ferromagnetic layer provided on the first nonmagnetic layer, an oxide layer containing magnesium (Mg), a rare-earth element, and a noble-metal element and provided on the second ferromagnetic layer, and a second nonmagnetic layer provided on the oxide layer.

SWITCHING OF PERPENDICULARLY MAGNETIZED NANOMAGNETS WITH SPIN-ORBIT TORQUES IN THE ABSENCE OF EXTERNAL MAGNETIC FIELDS

A base element for switching a magnetization state of a nanomagnet includes a heavy-metal strip having a surface. A ferromagnetic nanomagnet is disposed adjacent to the surface. The ferromagnetic nanomagnet has a first magnetization equilibrium state and a second magnetization equilibrium state. The first magnetization equilibrium state or the second magnetization equilibrium state is settable in an absence of an external magnetic field by a flow of electrical charge through the heavy-metal strip. A method for switching a magnetization state of a nanomagnet is also described.

Magnetoresistive sensor with enhanced uniaxial anisotropy

A read sensor that includes a free layer having a magnetization that changes according to an external magnetic field. The read sensor also includes an additional magnetic layer and a non-magnetic layer. The non-magnetic layer may include a corrugated surface facing the additional magnetic layer. The corrugated surface is configured to enhance uniaxial anisotropy in the read sensor.

Skyrmion generation system

Disclosed is a system (10) for generating skyrmions, including: a gun (12) including a wall-forming region (14) made from a first material, the region (14) defining an outer space (16) made from a second material different from the first material and an inner space (18) made from a third material different from the first material, the second material and the third material being magnetic materials; and a magnetization reversal device (26) that can reverse the magnetization at the interface between the region (14) and the inner space (18).

Spin transistors based on voltage-controlled magnon transport in multiferroic antiferromagnets

Voltage-controlled spin field effect transistors (spin transistors) and methods for their use in switching applications are provided. In the spin transistors, spin current is transported from a spin injection contact to a spin detection contact through a multiferroic antiferromagnetic channel via magnon propagation. The spin current transport is modulated by the application of a gate voltage that increases the number of domain boundaries the multiferroic antiferromagnetic material.

Spin transistors based on voltage-controlled magnon transport in multiferroic antiferromagnets

Voltage-controlled spin field effect transistors (spin transistors) and methods for their use in switching applications are provided. In the spin transistors, spin current is transported from a spin injection contact to a spin detection contact through a multiferroic antiferromagnetic channel via magnon propagation. The spin current transport is modulated by the application of a gate voltage that increases the number of domain boundaries the multiferroic antiferromagnetic material.

MAGNETIC MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

A magnetic memory device may include a substrate, a lower interconnection line on the substrate, a data storage structure on the lower interconnection line, and a lower contact plug between the lower interconnection line and the data storage structure and extended in a first direction perpendicular to a top surface of the substrate to connect the lower interconnection line to the data storage structure. An upper portion of the lower contact plug may have a first width in a second direction parallel to the top surface of the substrate, and a lower portion of the lower contact plug may have a second width in the second direction. The first width may be larger than the second width.

MAGNETIC MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

A magnetic memory device may include a substrate, a lower interconnection line on the substrate, a data storage structure on the lower interconnection line, and a lower contact plug between the lower interconnection line and the data storage structure and extended in a first direction perpendicular to a top surface of the substrate to connect the lower interconnection line to the data storage structure. An upper portion of the lower contact plug may have a first width in a second direction parallel to the top surface of the substrate, and a lower portion of the lower contact plug may have a second width in the second direction. The first width may be larger than the second width.

MAGNETIC MEMORY DEVICE
20240324241 · 2024-09-26 ·

According to one embodiment, there is provided a magnetic memory device including a first conductive layer; and a first magnetoresistive effect element and a second magnetoresistive effect element that each extends in a first direction, are provided apart from each other in a second direction crossing the first direction, and are each in contact with the first conductive layer, wherein the first conductive layer includes a first portion that does not overlap with any of the first magnetoresistive effect element and the second magnetoresistive effect element when viewed in the first direction, a second portion that overlaps with a central region of the first magnetoresistive effect element when viewed in the first direction, and a third portion that overlaps with an edge region of the first magnetoresistive effect element when viewed in the first direction.

MAGNETIC MEMORY DEVICE
20240324241 · 2024-09-26 ·

According to one embodiment, there is provided a magnetic memory device including a first conductive layer; and a first magnetoresistive effect element and a second magnetoresistive effect element that each extends in a first direction, are provided apart from each other in a second direction crossing the first direction, and are each in contact with the first conductive layer, wherein the first conductive layer includes a first portion that does not overlap with any of the first magnetoresistive effect element and the second magnetoresistive effect element when viewed in the first direction, a second portion that overlaps with a central region of the first magnetoresistive effect element when viewed in the first direction, and a third portion that overlaps with an edge region of the first magnetoresistive effect element when viewed in the first direction.