Patent classifications
H01J43/28
MICROCHANNEL PLATE AND METHOD OF MAKING THE MICROCHANNEL PLATE WITH METAL CONTACTS SELECTIVELY FORMED ON ONE SIDE OF CHANNEL OPENINGS
A night vision system, a microchannel plate (MCP), and a planetary deposition system and methodology are provided for selectively depositing an electrode contact metal on one side of MCP channel openings. One or more MCPs can be releasably secured to a face of a platter that rotates about its central platter axis. The rotating platter can be tilted on a rotating ring fixture surrounding an evaporative source of contact metal. Therefore, the rotating platter further rotates so that it orbits around the evaporative source of contact metal. A mask with a variable size mask opening is arranged between the rotating platter and the evaporative source. While the mask orbits around the evaporative source with the rotating platter, the mask does not rotate along its own axis as does the rotating platter.
Detector Comprising Transmission Secondary Electron Emmission Means
Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.
Detector Comprising Transmission Secondary Electron Emmission Means
Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.
Electron multipliers internal regions
An electron multiplier apparatus of the type used in ion detectors, and modifications thereto for extending the operational lifetime or otherwise improving performance. The electron multiplier includes a series of discrete electron emissive surfaces configured to provide an electron amplification chain, the electron multiplier being configured so as to inhibit or prevent a contaminant from entering into, or passing partially through, or passing completely through the electron multiplier. The electron multiplier may include one or more baffles configured so as to decrease vacuum conductance of the electron multiplier compared to the same or similar electron multiplier not having one or more baffles.
Electron multipliers internal regions
An electron multiplier apparatus of the type used in ion detectors, and modifications thereto for extending the operational lifetime or otherwise improving performance. The electron multiplier includes a series of discrete electron emissive surfaces configured to provide an electron amplification chain, the electron multiplier being configured so as to inhibit or prevent a contaminant from entering into, or passing partially through, or passing completely through the electron multiplier. The electron multiplier may include one or more baffles configured so as to decrease vacuum conductance of the electron multiplier compared to the same or similar electron multiplier not having one or more baffles.
Long life electron multiplier
An electron multiplier includes a series of discrete electron emissive surfaces or a continuous electron emissive resistive surface configured to provide an electron amplification chain; and a housing surrounding the series of electron emissive surfaces or the continuous electron emissive resistive surface and separating the environment inside the housing from the environment outside the housing. The housing includes an electron-transparent, gas-impermeable barrier configured to allow electrons to pass through into the housing to reach a first discrete electron emissive surface of the series of discrete electron emissive surfaces or a first portion of the continuous electron emissive resistive surface.
DISCHARGE REDUCTION IN SEALED COMPONENTS
Systems and methods for partial discharge reduction are provided. The systems and methods can receive an input voltage at a high voltage sensor configured within a sealed sensor assembly. The input voltage can be received via a discharge reduction of the sealed sensor assembly. The discharge reduction circuit can reduce an incidence of discharge associated with an ionization breakdown of an air gap between an output circuit of the sealed sensor assembly and an insulator conveying the output circuit through a hermetic barrier of the sealed sensor assembly.
LONG LIFE ELECTRON MULTIPLIER
An electron multiplier includes a series of discrete electron emissive surfaces or a continuous electron emissive resistive surface configured to provide an electron amplification chain; and a housing surrounding the series of electron emissive surfaces or the continuous electron emissive resistive surface and separating the environment inside the housing from the environment outside the housing. The housing includes an electron-transparent, gas-impermeable barrier configured to allow electrons to pass through into the housing to reach a first discrete electron emissive surface of the series of discrete electron emissive surfaces or a first portion of the continuous electron emissive resistive surface.
MCP assembly and charged particle detector
The MCP assembly of this embodiment is formed at least of a conductive upper support member, an MCP unit, an output electrode, a flexible sheet electrode, and a conductive lower support member as a structure for improving handleability of a flexible sheet electrode having a mesh area. The flexible sheet electrode includes the mesh area provided with plural openings. The flexible sheet electrode and the lower support member are physically and electrically connected to each other, and the flexible sheet electrode is sandwiched between the upper support member and the lower support member. As a result, even if the flexible sheet electrode becomes thin as an opening ratio of the mesh area increases, potential is set while the flexible sheet electrode is firmly held in the MCP assembly.
MCP assembly and charged particle detector
The MCP assembly of this embodiment is formed at least of a conductive upper support member, an MCP unit, an output electrode, a flexible sheet electrode, and a conductive lower support member as a structure for improving handleability of a flexible sheet electrode having a mesh area. The flexible sheet electrode includes the mesh area provided with plural openings. The flexible sheet electrode and the lower support member are physically and electrically connected to each other, and the flexible sheet electrode is sandwiched between the upper support member and the lower support member. As a result, even if the flexible sheet electrode becomes thin as an opening ratio of the mesh area increases, potential is set while the flexible sheet electrode is firmly held in the MCP assembly.