An ion detection current conversion circuit includes a conversion amplifier coupled with a conversion resistor assembly for converting an ion detection current produced by an ion detector into an ion detection voltage, the conversion resistor assembly comprising a resistor having a high resistance and a capacitive compensation element, and a compensation voltage circuit for deriving a compensation voltage from the ion detection voltage and feeding the compensation voltage to the capacitive compensation element, the compensation voltage circuit comprising a variable resistor for adjusting the compensation voltage.

The probe drive unit (21) collects a sample (8) at the tip of the probe (6) by lowering and raising the probe (6) under the control of the control unit (25). After that, the high voltage generating unit (20) applies a high voltage whose voltage value increases in a slope shape to the probe (6), and meanwhile, the mass spectrometry unit behind the capillary tube (10) performs product ion scan measurements on the two-step probe voltage, and the mass spectrum data obtained in each measurement is stored in the first and the second probe voltage corresponding data storage units (301 and 302). When the ionization efficiencies of the plurality of types of components contained in the sample (8) have a probe voltage dependence, ion peaks derived from different types of components appear in the two mass spectra. Thus, a plurality of types of components contained in the sample can be roughly separated, and the identification performance based on the mass spectrum and the quantitative performance based on the chromatogram can be improved.

An ion-optical device comprising: a plurality of electrodes (2); a first AC voltage supply (6); and a transformer (4) having: a toroidal core (8); a primary winding (10) connected to the AC voltage supply (6) and passing through the aperture within the toroidal core (8); and at least one secondary winding (13,15) wound around the toroidal core 8 and electrically connected to multiple ones of said plurality of electrodes.

An electrostatic linear ion trap (ELIT) array includes a plurality of ion mirrors and a plurality of elongated charge detection cylinders each defining an axial passageway centrally therethrough, the ion mirrors and the charge detection cylinders arranged relative to one another such that each charge detection cylinder is positioned between a different respective pair of the ion mirrors with the respective axial passageways of each coaxial with one another, wherein the axial passageways of the ELITs are not coaxial with one another, means for selectively directing at least one ion into each of the plurality of ELITs, and means for controlling each of the ion mirrors in a manner which causes the at least one ion in at least two of the ELITs to become trapped therein and to simultaneously oscillate back and forth between the respective ion mirrors each time passing through the respective charge detection cylinder.

In one aspect, a curtain and orifice plate assembly for use in a mass spectrometry system is disclosed, which comprises a curtain plate including a first printed circuit board (PCB) having an aperture configured for receiving ions generated by an ion source of the mass spectrometry system and at least one gas-flow channel, where said first PCB has at least one metal coating disposed on at least a portion thereof. The assembly further includes an orifice plate coupled to the curtain plate, which includes a PCB providing an orifice that is substantially aligned with the aperture of the curtain plate so that the ions entering the assembly via said aperture of the curtain plate can exit the assembly via said orifice of the orifice plate, where the second PCB has at least one metal coating disposed on at least a portion thereof.

A signal processing assembly for a detector includes a signal amplifier, a control unit, and an offset control module. The signal amplifier is configured to receive an input signal from the detector assembly and to provide an output signal. The control unit is configured to compare a first data point from the output signal with a signal range, and to generate an input bias control signal based upon the comparison. The offset control module is coupled with the control unit and configured to receive the input bias control signal. The offset control module includes a power supply operatively coupled with an input of the signal amplifier, and the offset control module is configured to generate and apply an adaptive input offset signal at the input of the signal amplifier based upon the input bias control signal.

A method and device for determining an average frequency of a series of ion detection pulses (P) in a spectrometer can be applied to a measurement interval (MI). The method may comprise determining the duration of an auxiliary interval (AI1, AI2, . . . ), wherein the auxiliary interval overlaps the measurement interval, the auxiliary interval starts at the last pulse (P0) preceding the measurement interval (MI), and the auxiliary interval ends at the last pulse (PN) within the measurement interval. The method may further comprise determining the number of pulses during the auxiliary interval and dividing the number of pulses by the duration of the auxiliary interval so as to produce the average frequency. The method may be applied to a series of ion pulses produced by a voltage-to-frequency converter connected to a Faraday cup.

A temperature-controlled electronic apparatus, comprises: a circuit board; a plurality of electronic components, mounted on the circuit board in an arrangement to form at least one electronic circuit; a temperature sensor, configured to measure a temperature of the at least one electronic circuit; and a heat-generating component, configured to be controlled by a temperature control circuit, the temperature control circuit being configured to control an amount of heat generated by the heat-generating component in response to the temperature measured by the temperature sensor. The plurality of electronic components are arranged on the circuit board to lie on one of one or more paths, each path of the one or more paths being defined by a respective circle having a radius.

A system for trapping ions for measurement thereof may include an electrostatic linear ion trap (ELIT), a source of ions to supply ions to the ELIT, a processor operatively coupled to ELIT, and a memory having instructions stored therein executable by the processor to produce at least one control signal to open the ELIT to allow ions supplied by the source of ions to enter the ELIT, determine an ion inlet frequency corresponding to a frequency of ions flowing from the source of ions into the open ELIT, generate or receive a target ion charge value, determine an optimum threshold value as a function of the target ion charge value and the determined ion inlet frequency, and produce at least one control signal to close the ELIT when a charge of an ion within the ELIT exceeds the optimum threshold value to thereby trap the ion in the ELIT.

An electrostatic linear ion trap (ELIT) array includes multiple elongated charge detection cylinders arranged end-to-end and each defining an axial passageway extending centrally therethrough, a plurality of ion mirror structures each defining a pair of axially aligned cavities and an axial passageway extending centrally therethrough, wherein a different ion mirror structure is disposed between opposing ends of each cylinder, and front and rear ion mirrors each defining at least one cavity and an axial passageway extending centrally therethrough, the front ion mirror positioned at one end of the arrangement of charge detection cylinders and the rear ion mirror positioned at an opposite end of the arrangement of charge detection cylinders, wherein the axial passageways of the charge detection cylinders, the ion mirror structures, the front ion mirror and the rear ion mirror are coaxial to define a longitudinal axis passing centrally through the ELIT array. In a second aspect, an ELIT array comprises a plurality of non-coaxial ELIT regions, wherein ions are selectively guided into each of the ELIT regions.