A first layer, a first spacer layer, and a second layer of a semiconductor wafer can be etched to produce a plurality of columnar structures extending from the substrate layer and including a first optical cavity situated about the first gain medium, a second optical cavity situated about the second gain medium, and a first spacer region contacting the first gain medium and the second gain medium. Also, a photonic microparticle formed from a layered semiconductor wafer and of a columnar structure having a first optical cavity situated about a first gain medium, a second optical cavity situated about a second gain medium, and a first spacer region contacting the first gain medium and the second gain medium. The first optical cavity and the second optical cavity in the photonic microparticle are each capable of generating laser light with a distinct spectral peak when energetically excited.

An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.

A coherent optical injection locking (COIL) apparatus generates multiple optical source outputs from a single optical source generated by a parent laser. The COIL apparatus includes a plurality of optical source generators each having a child laser, of lesser performance than the parent laser, that is injection locked to the single optical source. The optical source generators may have one or both of a shared configuration and a cascaded configuration that replicates the single optical source, or a single wavelength of the single optical source when it is a comb source.

An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.

A vertical cavity surface-emitting laser including: a substrate having a main surface; and a post structure mounted on the main surface. The post structure includes an active layer and a carrier confinement structure. The carrier confinement structure includes a first region and a second region having a higher resistivity than the first region. The first region has an edge, and a first to a third reference line segments. A first length of the first reference line segment is longest among lengths of line segments joining any two points on the edge and extending in a [1-10] direction of the III-V group semiconductor. The first length is greater than a sum of a second length of the second reference line segment and a third length of the third reference line segment. The third length is smaller than the second length and is zero or more.

One feature pertains to an apparatus that includes apparatus that includes an evanescent field coupler having a first surface that evanescently couples light between the evanescent field coupler and an open dielectric resonator. The apparatus also includes a thin film coating covering at least a portion of the first surface of the evanescent field coupler. The thin film coating is specifically designed so that the thin film coating reflects light of a first wavelength.

An assembly (14) for analyzing a sample (15) includes a detector assembly (18); a tunable laser assembly (10); and (iii) a laser controller (10F). The detector assembly (18) has a linear response range (232) with an upper bound (232A) and a lower bound (232B). The tunable laser assembly (10) is tunable over a tunable range, and includes a gain medium (10B) that generates an illumination beam (12) that is directed at the detector assembly (18). The laser controller (10F) dynamically adjusts a laser drive to the gain medium (10B) so that the illumination beam (12) has a substantially constant optical power at the detector assembly (18) while the tunable laser assembly (10) is tuned over at least a portion of the tunable range.

A multi-wavelength light source has a laser region that includes a gain medium with a reflective end facet and two or more diffraction gratings optically connected to a second end facet opposite to the reflective end facet of the gain medium, an optical amplifier configured to amplify a laser beam emitted from the reflecting end facet of the laser region and containing multiple wavelengths, the multiple wavelengths being amplified collectively, an optical demultiplexer configured to demultiplex an amplified laser beam output from the optical amplifier, and output waveguides connected to the optical demultiplexer and configured to output light beams with the multiple wavelengths.

Provided is an external cavity laser (ECL) including a vertical cavity surface emitting laser (VCSEL)-Distributed Bragg Reflector (DBR) type light emitting unit configured to receive a current and emit light, and including a DBR function layer and an active layer for a quantum well formed on one side of this DBR function layer, and an optical circuit unit including a light guide in which one end surface is installed to face an active layer at one side of the active layer, light generated from the active layer is received and guided, and an optical axis is formed vertically to an active layer plane, a reflection pattern that is formed at one side of the light guide so as to receive light output from the other end of the light guide to reflect the light again to the light guide, and an external layer for surrounding the light guide and the reflection pattern, wherein the VCSEL-DBR type light emitting unit and the optical circuit unit are mutually coupled to each other.

According to the present invention, an optical coupling efficiency in the ECL may be raised by improving an inefficient optical coupling issue including alignment, reflection, and the like in a coupling part of a gain element and a silicon waveguide.

A spectroscopy system includes a light source having an input light source, including semiconductor diodes generating an input beam with a wavelength shorter than 2.5 microns. Cladding-pumped fiber amplifiers receive the input beam and form an amplified optical beam having a spectral width. A nonlinear element broadens the spectral width of the amplified optical beam to 100 nm or more through a nonlinear effect forming an output beam that is pulsed. A filter is coupled to at least one of a lens and a mirror that receives the output beam and delivers the filtered output beam to a sample. A detection system includes detectors configured to receive the output beam reflected or transmitted from the sample. The detection system is configured to use a lock-in technique with the pulsed output beam and the spectroscopy system is adapted to detect chemicals in the sample.