Provided are embodiments that include a circuit configured to operate in a disabled mode error reduction for high-voltage bilateral operational amplifier current source. The circuit includes an operational amplifier, and a switching circuit coupled to the operation amplifier, wherein the switching circuit is operable in a normal mode and a disabled mode, wherein the disabled mode reduces error current at the output of the operational amplifier. Also provided are embodiments for a method for operating a circuit in a disabled mode for error reduction.

In an embodiment an integration circuit has a first input terminal configured to receive a first input signal, a second input terminal configured to receive a second input signal, an output terminal to provide an output signal as a function of the first and the second input signal, a first and a second amplifier, each being switchably connected between the first or the second input terminal and the output terminal, and a capacitor which is switchably coupled in a feedback loop either of the first or of the second amplifier such that the capacitor and one of the first and the second amplifier form an inverting integrator providing the output signal. Therein the integration circuit is prepared to be operated in a first and a second subphase, wherein in each of first and second subphases one of the first and the second input signals is supplied to the inverting integrator and the respective other one of first and the second input signals is supplied to the respective other one of the first and the second amplifier.

An amplifier assembly (100) includes an amplifier (102) having an input terminal, an output terminal and a feedback terminal; a first feedback path connecting the output terminal to the feedback terminal; a second feedback path connecting the output terminal to the feedback terminal; a switch (124) positioned in the second feedback path, the switch (124) opening or closing in response to a voltage at the output terminal relative to a breakpoint, when the switch (124) is open, the amplifier assembly (100) has a first gain and when the switch (124) is closed, the amplifier assembly (100) has a second gain; and a thermally variable element (152) connected to the switch (124), the thermally variable element (152) configured to generate a compensation voltage to maintain the breakpoint in response to varying temperature of the switch (152).

Provided are a semiconductor device and a sensor system capable of achieving improvement of noise resistance. Thus, an output circuit 106a in the semiconductor device includes: input terminals 207n, 207p; and an output terminal 208; an output amplifier 201 connecting the input terminals 207n, 207p to the output terminal 208; a feedback element 203 returning the output terminal 208 to the input terminal 207n; a switching transistor 204; and a resistance element 206. A drain of the switching transistor 204 is connected to the input terminal 207n. The resistance element 206 is provided between a back gate of the switching transistor 204 and a power source Vdd and has impedance of a predetermined value or more for suppressing noise of a predetermined frequency generated at the input terminal 207n.

An oscilloscope probe includes a tip network, a low-loss signal cable, and a terminating assembly. The tip network is connected to the signal cable and is configured to electrically connect to a device under test via a tip network node. The terminating assembly includes an amplifier, a feedback network and a terminating attenuator. The amplifier has an inverting input, a non-inverting input connected to ground, and an amplifier output configured to connect to an oscilloscope input. The feedback network is connected between the inverting input and the amplifier output. The terminating attenuator includes a first loop circuit and a second loop circuit. The first loop circuit is provided between the signal cable and the inverting input of the amplifier. The second loop circuit is provided between the signal cable, and ground. Resistance of terminating resistors in the loop circuits are selected to match characteristic impedance of the signal cable.

Provided are embodiments that include a circuit configured to operate in a disabled mode error reduction for high-voltage bilateral operational amplifier current source. The circuit includes an operational amplifier, and a switching circuit coupled to the operation amplifier, wherein the switching circuit is operable in a normal mode and a disabled mode, wherein the disabled mode reduces error current at the output of the operational amplifier. Also provided are embodiments for a method for operating a circuit in a disabled mode for error reduction.

An electronic circuit for a micro-electro-mechanical systems gyroscope is disclosed. The electronic circuit includes a current buffer, a transimpedance amplifier coupled with the current buffer, and a plurality of transistors. An inverting input terminal of the current buffer and a non-inverting input terminal of the current buffer are connected with a plurality of first resistors. The inverting input terminal of the current buffer is connected with a source of one of the plurality of transistors, and the non-inverting input terminal of the current buffer is connected with a source of another one of the plurality of transistors. The plurality of first resistors are connected to a ground. The current buffer is configured to isolate a load in the micro-electro-mechanical systems gyroscope from the transimpedance amplifier.

A high-to-low voltage interface circuit includes a differential circuit stage with a differential amplifier circuit having inverting and non-inverting inputs coupled to first and second input pads as well as a differential output having first and second output nodes. A pair of bias amplifier stages sensitive to the common mode voltage of the differential amplifier circuit are arranged in first and second current mirror paths from the first and second input pads to the inverting/non-inverting inputs of the differential amplifier circuit, respectively. The bias amplifier stages are configured to maintain the first input pad and the second input pad of the differential circuit stage at the common mode voltage.

A circuit arrangement comprises a first input node, a first output node, a sampling capacitor means and a first switching means being switchable between a first switching state and a second switching state. The first switching means is coupled to the sampling capacitor means, the first input node and the first output node in such a way that the sampling capacitor means is conductively connected to the first input node and disconnected from the first output node in the first switching state and the sampling capacitor means is disconnected from the first input node and conductively connected to the first output node in the second switching state. A first charge-storing element is coupled via a second switching means to the first input node in such a way that the charge-storing element is charged in the first switching state and discharged in the second switching state, thereby at least partly compensating current flow for charging the sampling capacitor means in the first switching state.

A complex current measurement circuit for a guard-sense capacitive sensor includes a periodic signal voltage source, a differential transimpedance amplifier circuit (DTA) and a demultiplexer circuit (DMX). At least one sense antenna electrode of the capacitive sensor is electrically connectable to a signal input line of the DMX which has signal output lines electrically connected to differential signal input lines of the DTA. The DTA includes operational amplifiers having input ports each electrically connected to one of the signal output lines. For each differential signal input line, either a capacitor is electrically connected between an output port of the voltage source and the differential signal input line, wherein an impedance of the capacitor is close to zero Ohm, or a galvanic connection is provided to one of the signal output lines. An output signal provided by the DTA is usable for determining a complex sense current of the capacitive sensor.