Time-to-digital converter (TDC) using multiple Vernier in a cascaded architecture reduces the timing jitter by decreasing the number of the ring oscillator cycles during the measurement processes. Time-to-digital converter (TDC) measurements using a third oscillator for the second Vernier process has significant advantages compared to changing the period of the second oscillator during the measurement cycle. The Vernier architecture described herein may operate with faster oscillators, reducing the number of intervals before converging and leading to a lower time conversion and a better timing jitter Adding multiple cascaded Vernier interpolation may further improve the TDC measurement resolution while having only a small increment of time required to resolve the time interval calculations.

A duty cycle correction circuit includes a first duty cycle detecting circuit configured to detect a duty cycle of a clock signal with a first resolution; a reference clock generating circuit configured to generate a reference clock signal by adjusting a phase of the clock signal; a second duty cycle detecting circuit configured to detect a duty cycle of the clock signal with a second resolution according to the reference clock signal and the clock signal, the second resolution being finer than the first resolution; a first duty cycle adjusting circuit configured to adjust the duty cycle of the clock signal according to one or more first control signals output from the first duty cycle detecting circuit; and a second duty cycle adjusting circuit configured to adjust the duty cycle of the clock signal according to one or more second control signals output from the second duty cycle detecting circuit.

The present disclosure relates to the field of analog integrated circuit technology. A digital and analog mixed signal control circuit for eliminating a degenerate metastable state of a self-biased bandgap reference circuit utilizes a digital-to-analog converter module with low-power consumption and flexibly customized accuracy as needed, a delay switch, and a non-volatile memory cell to directly control and clamp a circuit node at the degenerate metastable state in the bandgap reference circuit module, and to release the clamping after a certain delay. Such control mechanism effectively prevents the self-biased bandgap reference circuit with an operational amplifier from entering the degenerate metastable state, and enhance robustness of the circuit, such that the reference circuit is capable of starting normally under various conditions, which improves the performance and yield of the products.

Apparatuses and methods to reduce leakage current are presented. The includes a switch circuit configured to power a circuit block; a delay circuit configured to delay enabling the switch circuit powering the circuit block and to be powered down; and a bypass circuit configured to bypass the delay circuit to disable the switch circuit powering the circuit block. The method includes powering, by switch, a circuit block; powering down a delay circuit; and bypassing, by a bypass circuit, the delay circuit to disable the switch circuit powering the circuit block.

A voltage-controlled delay buffer includes a plurality of inverters configured in a cascade topology to receive an input signal from a source circuit and output an output signal to an output circuit. The plurality of inverters includes a voltage-controlled inverter controlled by a control signal having a first voltage and a second voltage. The voltage-controlled inverter includes a PMOS transistor configured to assist a low-to-high transition of an outgoing signal, and an NMOS transistor configured to assist a high-to-low transition of the outgoing signal. Two varactors, one forward connected and the other backward connected are configured to adjust a delay of a transition of an incoming signal.; Another two varactors, one forward connected and the other backward connected, configured to adjust a delay of a transition of the outgoing signal in accordance with the first voltage and the second voltage.

A circuit includes a noise generator and a delay element. The output of the noise generator couples to the input of the delay element. The output of the delay element is coupled to a first input of a logic circuit, and the output of the noise generator is coupled to a second input of the logic circuit. The output of the logic circuit is coupled to a first control input of a waveform storage circuit. The waveform storage circuit is configured to produce a first digital waveform on its output responsive to a first logic state on the output of the logic circuit and to produce a second digital waveform on its output responsive to a second logic state on the output of the logic circuit. A sequencer has a sequencer output coupled to the second control input of the waveform storage circuit.

An imaging device includes an imaging unit, a reference signal generation unit, m (m is an integer of 3 or more) number of column delay units, and a plurality of column AD conversion units. The plurality of column delay units is arranged so as to correspond to two or more and less than m of the column AD conversion units. Each of the plurality of column delay units includes a first delay circuit. The first delay circuit generates a plurality of first delay clocks. The column AD conversion unit includes a comparison unit, a latch unit, and a counter unit. The comparison unit compares a pixel signal with a reference signal, and outputs a control signal corresponding to a comparison result. The latch unit includes a plurality of latch circuits that latches the plurality of first delay clocks on the basis of a state change of the control signal.

A semiconductor integrated circuit includes a first circuit and a second circuit. The first circuit is configured to divide a first pulse signal having a first duty cycle by N (where N is an integer of 2 or more), and output 2×N second pulse signals of which phases are different from each other. The first pulse signal is a pair of differential signals. The second circuit is configured to receive one or more selection signals and calculate a logical product of one of the one or more selection signals and two of the 2×N second pulse signals to generate a third pulse signal having a second duty cycle less than the first duty cycle.

The disclosed subject matter includes an apparatus. The apparatus is configured to provide an approximate differentiation of an input continuous-time signal. The apparatus includes a continuous-time delay block configured to receive the input continuous-time signal and to delay the input continuous-time signal by a predetermined delay factor to generate a delayed input continuous-time signal; a processing block configured to determine a difference between the input continuous-time signal and the delayed input continuous-time signal; and a multiplication block configured to multiply the difference by a multiplication factor to provide the approximate differentiation of the input continuous-time signal.

A multi-phase signal control circuit includes: a comparator, configured to compare a triangular wave signal with a feedback control signal to output a first pulse width modulation signal, where the feedback control signal is a signal fed back by the power stage circuit; a phase switch circuit, configured to receive a phase switch signal and the first pulse width modulation signal to generate a first phase signal and a second phase signal, where the first phase signal and the second phase signal are used to control the power stage circuit to generate an output voltage signal.