H03K5/151

Multi-phase signal generation

The disclosure relates to technology for generating multi-phase signals. An apparatus includes 2{circumflex over ( )}n phase signal generation stages. The apparatus also includes a controller configured to provide a mode input of each of the 2{circumflex over ( )}n stages with an active periodic binary signal with remaining inputs of each of the 2{circumflex over ( )}n stages provided with another periodic binary signal to collectively generate a 2{circumflex over ( )}n phase signal in a first mode. The controller is further configured to provide the mode input of each of 2{circumflex over ( )}(n−1) odd stages with a first steady state signal and the mode input of each of 2{circumflex over ( )}(n−1) even stages with a second steady state signal with remaining inputs of each of the 2{circumflex over ( )}n stages provided with the same periodic binary signal as in the first mode to cause either the 2{circumflex over ( )}(n−1) odd stages or the 2{circumflex over ( )}(n−1) even stages to collectively generate a 2{circumflex over ( )}(n−1) phase signal in a second mode.

Driver circuit, corresponding device and method of operation

A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Semiconductor integrated circuit, semiconductor storage device, memory system, and frequency generation method
11750202 · 2023-09-05 · ·

A semiconductor integrated circuit includes a first oscillator configured to generate a first signal with a first frequency based on a control signal and output the first signal to a path. The semiconductor integrated circuit includes a control signal generation circuit operatively coupled to the first oscillator via the path, and configured to receive the first signal from the first oscillator via the path and generate the control signal. The semiconductor integrated circuit includes a second oscillator configured to generate a second signal with a second frequency based on the control signal and output the second signal to an output terminal outside the path.

Semiconductor integrated circuit, semiconductor storage device, memory system, and frequency generation method
11750202 · 2023-09-05 · ·

A semiconductor integrated circuit includes a first oscillator configured to generate a first signal with a first frequency based on a control signal and output the first signal to a path. The semiconductor integrated circuit includes a control signal generation circuit operatively coupled to the first oscillator via the path, and configured to receive the first signal from the first oscillator via the path and generate the control signal. The semiconductor integrated circuit includes a second oscillator configured to generate a second signal with a second frequency based on the control signal and output the second signal to an output terminal outside the path.

Dual-clock generation circuit and method and electronic device
11817860 · 2023-11-14 · ·

The present disclosure relates to a dual-clock generation circuit and method and an electronic device, and relates to the technical field of integrated circuits. The dual-clock generation circuit includes: a first inverter module, configured to access a first signal and output a first clock output signal; a second inverter module, configured to access a second signal and output a second clock output signal, where the first signal and the second signal are opposite clock signals; a first feedforward buffer, disposed between an input terminal of the first inverter module and an output terminal of the second inverter module, and configured to transmit the first signal to compensate for the second clock output signal.

Driver circuit, corresponding device and method of operation

A circuit comprises first and second input supply nodes configured to receive a supply voltage therebetween. The circuit comprises a high-side driver circuit configured to be coupled to a high-side switch and produce a first signal between first and second high-side output nodes. The circuit comprises a low-side driver circuit configured to be coupled to a low-side switch and produce a second signal between first and second low-side output nodes. The circuit comprises a floating node configured to receive a floating voltage applied between the floating node and the second high-side output node, a bootstrap diode between the first input supply node and an intermediate node, and a current limiter circuit between the intermediate node and the floating node and configured to sense the floating voltage and counter a current flow from the intermediate node to the floating node as a result of the floating voltage reaching a threshold value.

Deskew cell for delay and pulse width adjustment
11456729 · 2022-09-27 · ·

A deskew system can be used to adjust signal characteristics such as pulse width and edge timing. In an example, a deskew system can include multiple timing control cells and each cell can operate in one of multiple different modes according to respective mode control signals. The modes can include at least a signal delay mode and a signal pulse width adjustment mode. In an example, a first cell in a deskew system can be configured to receive a test input signal at a first input node and, in response, provide a deskew output signal at a first output node. The deskew output signal can be based on the test input signal, a pulse width adjustment provided by the first cell, and on a delayed signal, corresponding to the input signal, that is provided by a subsequent cell in the series.

DESKEW CELL FOR DELAY AND PULSE WIDTH ADJUSTMENT
20220311426 · 2022-09-29 ·

A deskew system can be used to adjust signal characteristics such as pulse width and edge timing. In an example, a deskew system can include multiple timing control cells and each cell can operate in one of multiple different modes according to respective mode control signals. The modes can include at least a signal delay mode and a signal pulse width adjustment mode. In an example, a first cell in a deskew system can be configured to receive a test input signal at a first input node and, in response, provide a deskew output signal at a first output node. The deskew output signal can be based on the test input signal, a pulse width adjustment provided by the first cell, and on a delayed signal, corresponding to the input signal, that is provided by a subsequent cell in the series.

Duty cycle correction circuit and semiconductor system
11121706 · 2021-09-14 · ·

A duty cycle correction circuit may include a data alignment circuit, a correction value generation circuit, and a dock generation circuit. The data alignment circuit may align unit pattern data based on a strobe clock signal. The correction value generation circuit may generate a duty correction value by measuring the amount of charges corresponding to the aligned data. The clock generation circuit may correct the duty ratio of the strobe clock signal based on the duty correction value.

Duty cycle correction circuit and semiconductor system
11121706 · 2021-09-14 · ·

A duty cycle correction circuit may include a data alignment circuit, a correction value generation circuit, and a dock generation circuit. The data alignment circuit may align unit pattern data based on a strobe clock signal. The correction value generation circuit may generate a duty correction value by measuring the amount of charges corresponding to the aligned data. The clock generation circuit may correct the duty ratio of the strobe clock signal based on the duty correction value.