H03K17/145

CHARGE PUMP CELL WITH IMPROVED LATCH-UP IMMUNITY AND CHARGE PUMPS INCLUDING THE SAME, AND RELATED SYSTEMS, METHODS AND DEVICES
20230231474 · 2023-07-20 ·

A charge pump cell for a charge pump is disclosed that may exhibit improved latch-up immunity. A circuit may be arranged at the charge pump cell to apply a voltage to a bulk contact of a charge transfer transistor of such a charge pump cell at least partially responsive to a relationship between a voltage at a first terminal of the charge transfer transistor and a voltage at a second terminal of the charge transfer transistor. A charge pump including one or more such charge pump cells may include a control loop that is configured to control a pumping signal at least partially responsive to a state of an output voltage of the charge pump.

Supply voltage detecting circuit and circuit system using the same
11705902 · 2023-07-18 · ·

A supply voltage detecting circuit has a voltage detection circuit and a current clamping circuit. The voltage detection circuit receives and detects a supply voltage and is used to detect to generate a low-voltage detection signal. When the supply voltage is lower than a set level, the low voltage detection signal output by the voltage detection circuit turns off the current clamping circuit, and a transistor current flowing through the voltage detection circuit is proportional to the supply voltage; and when the supply voltage is higher than or equal to the set level, the low voltage detection signal output by the voltage detection circuit turns on the current clamping circuit, and the current clamping circuit provides a constant current to maintain the operation of the voltage detection circuit, wherein the transistor current flowing through the voltage detection circuit is proportional to the constant current.

GATE DRIVE CIRCUIT AND POWER CONVERTER

A gate drive circuit according to an embodiment includes: a voltage detector that detects a voltage between a first terminal and a second terminal of a switching device; a delay circuit that outputs, with a delay for a predetermined time, a detected value of the voltage obtained from the voltage detector; and a first off-mode drive circuit and a second off-mode drive circuit that apply a control signal to a control terminal of the switching device for turning off the switching device, wherein the first off-mode drive circuit turns off the switching device faster than the second off-mode drive circuit, and stops its operation to turns off the switching device when the delayed voltage value output from the delay circuit exceeds a predetermined threshold value.

POWER CONVERSION DEVICE

Provided is a power conversion device capable of observing a chip temperature with high accuracy without increasing a cost of the power conversion device mounted with a current sense element for observing a main current of a power device. A main control MOSFET 11, a current MOSFET 12, and a diode 13 connected to a source electrode 8 of the main control MOSFET 11 and a source electrode 9 of the current MOSFET 12 are mounted in a chip of a power device, a temperature measurement circuit 3 is connected to the source electrode 9 of the current MOSFET 12, and when the main control MOSFET 11 is in an off state, a forward current (I.sub.f) is caused to flow through the diode 13, and an anode potential is observed to measure the chip temperature.

POWER SUPPLY SWITCH CIRCUIT AND OPERATING METHOD THEREOF

A power supply switch circuit includes a first transistor that switches supplying of a first power supply voltage to a power supply terminal of a power amplifier, a switch controller that controls the first transistor and to which a second power supply voltage is applied, and a voltage selector that selects a higher voltage among the first power supply voltage and the second power supply voltage. The selected higher voltage is applied to a body terminal of the first transistor or a gate terminal of the first transistor.

Voltage comparator
11552631 · 2023-01-10 · ·

A circuit arrangement is disclosed for controlling the switching of a field effect transistor (FET). A current controlled amplifier may be configured to amplify a current in a current sense device to generate an amplified current, wherein the current in the current sense device indicates a current through the FET. A comparator may be coupled to the current sense amplifier to compare a voltage corresponding to the amplified current with a voltage reference and to generate a comparator output based on the comparison, wherein the comparator output controls whether the FET is on or off.

Charge pump cell with improved latch-up immunity and charge pumps including the same, and related systems, methods and devices

A charge pump cell for a charge pump is disclosed that may exhibit improved latch-up immunity. A circuit may be arranged at the charge pump cell to apply a voltage to a bulk contact of a charge transfer transistor of such a charge pump cell at least partially responsive to a relationship between a voltage at a first terminal of the charge transfer transistor and a voltage at a second terminal of the charge transfer transistor. A charge pump including one or more such charge pump cells may include a control loop that is configured to control a pumping signal at least partially responsive to a state of an output voltage of the charge pump.

Power switch arrangement

A power device can be structured with a power switch having multiple arrangements such that the power switch can operate as a power switch with the capability to measure properties of the power switch. An example power device can comprise a main arrangement of transistor cells and a sensor arrangement of sensor transistor cells. The main arrangement can be structured to operate as a power switch, with the transistor cells of the main arrangement having control nodes connected in parallel to receive a common control signal. The sensor arrangement of sensor transistor cells can be structured to measure one or more parameters of the main arrangement, with the sensor transistor cells having sensor control nodes connected in parallel to receive a common sensor control signal. The sensor transistor cells can have a common transistor terminal shared with a common transistor terminal of the transistor cells of the main arrangement.

SAMPLING SWITCH CIRCUITS
20220407513 · 2022-12-22 ·

A sampling switch circuit, including an input node, which receives an input voltage signal to be sampled, a sampling transistor having gate, source and drain terminals, the source terminal connected to the input node, a capacitor, a current source configured to cause a defined current to flow therethrough and switching circuitry configured to alternate between a precharge configuration and an output configuration depending upon a clock signal. In the precharge configuration, the switching circuitry connects the capacitor into a current path between said current source and a first voltage reference node to form a potential difference across the capacitor which is dependent on the defined current. In the output configuration, the switching circuitry connects the capacitor between a second voltage reference node and the gate terminal of the sampling transistor so that a voltage level applied at the gate terminal of the sampling transistor is dependent on the defined current.

SAMPLING SWITCH CIRCUITS
20220407535 · 2022-12-22 ·

A sampling switch circuit, comprising an input node, connected to receive an input voltage signal, a sampling transistor comprising a gate terminal, a source terminal and a drain terminal, the source terminal connected to the input node, a hold-control node connected to receive a hold-control voltage signal, an output node connected to the drain terminal of the sampling transistor, a buffer circuit having a buffer input connected to the input node and a buffer output connected to a track-control node, the buffer circuit configured to provide a track-control voltage signal at the track-control node dependent on the input voltage signal and switching circuitry configured to connect the gate terminal of the sampling transistor to the track-control node or to the hold-control node in dependence upon a clock signal.