The present disclosure describes an example circuit for selecting a voltage supply. The circuit includes a first control switch, a first voltage supply switch, a second control switch, and a second voltage supply switch. The first control switch is configured to receive a control signal and a first voltage supply. The first voltage supply switch is electrically coupled to the first control switch and is configured to receive a second voltage supply. The second voltage supply switch is electrically coupled to the second control switch and configured to receive the first voltage supply. The first and second voltage supply switches are configured to selectively output the first and second voltage supplies based on the control signal.

Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.

A method for power-smart packet processing includes, in response to an event trigger signal, generating, by a state machine, a number of enable signals. The method further includes applying the enable signals to a number of single-level inferred clock (SLICK) gates to generate multiple clock signals with cycles of latency. The clock signals are applied to at least some of a number of groups of flops used for packet processing. The enable signals are clock-gated enable signals that start at consecutive cycles of a main clock, and stay active for at least one cycle of the main clock. The method further includes using flow-aware clock-gating technology (FACT) to distinctly identify logic and tables and continually variable traffic (CVT) to control packet rate and packet spacing.

A semiconductor device that can automatically transition from a standby mode to a deep power down (DPD) mode is provided. The semiconductor device includes a DPD controller supporting the DPD mode and multiple internal circuits. The DPD controller measures a time since a time point of entering the standby mode and generates multiple power down enable signals for further reducing power consumption in the standby mode in response to elapse of a measurement time, so that operations of the multiple internal circuits are stopped in stages.

A semiconductor device having a cell region, the cell region including a first set of one or more first blocks and a second set of one or more second blocks. Each of the first blocks including a clock gate and each of the second blocks includes a decoupling capacitor. The first set has two or more first blocks and/or the second set has two or more second blocks. The first blocks of the first set are interleaved with the second blocks of the second set.

A circuit and method are provided to monitor a clock for a data processor. The method includes receiving a clock signal and producing a first voltage proportional to a frequency of the clock signal. The first voltage is converted to a digital signal. During an initialization mode, the method ensures the clock signal is at a desired frequency and scales the digital signal using a first configurable ratio to produce a high threshold value. When changing from the initialization mode to an operating mode, the method ceases to scale the digital signal and maintains the high threshold value. During the operating mode, the method compares the digital signal to the high threshold value to determine if the clock signal has been increased in frequency beyond a desired level, and if so, triggers an overclock alert to a system management circuit of the data processor.

According to the present invention, an optical latch circuit includes a voltage detector configured to compare a first power generation voltage input from a first input terminal with a preset first threshold voltage and output a set signal from a determination output terminal when the first power generation voltage exceeds the first threshold voltage, a first photovoltaic element connected between the first input terminal and a grounding point in a forward direction and configured to output a first power generation voltage to the first input terminal according to photovoltaic power when light is radiated, and a feedback resistor inserted between the first input terminal and the determination output terminal.

A semiconductor circuit device includes a first clock gating circuit that outputs a first gated clock signal generated from a clock signal and a first enable signal, a non-volatile first flip-flop that operates in response to a clock pulse of the first gated clock signal, an acquisition circuit that acquires data inputted from the first flip-flop according to a second enable signal that enables or disables the acquisition of the data from the first flip-flop, and a power gating circuit that supplies electric power to the first flip-flop and receives the first and second enable signals as power source control signals. The power gating circuit includes a power switch, and supplies the electric power to the first flip-flop by turning ON the power switch when the power source control signals have logical values that enable the clock signal or the acquisition of the data in the acquisition circuit.

Certain aspects of the present disclosure provide a circuit for clock signal generation. The circuit generally includes a plurality of clock generation circuits configured to generate a plurality of clock signals from a clock signal, and a power supply circuit having an output coupled to power supply inputs of the plurality of clock generation circuits. The circuit may also include a capacitor array coupled to the output of the power supply circuit and include a plurality of capacitive elements, the capacitor array being configured to selectively couple each of the plurality of capacitive elements to the output of the power supply circuit based on a quantity of one or more active clock generation circuits of the plurality of clock generation circuits.

An integrated circuit includes a logic circuit comprising a plurality of logic transistors, the logic circuit comprising a plurality of logic gate lines extending in a first direction; and a power gating circuit comprising a plurality of power gating transistors, the power gating circuit comprising a first power gate line extending in a second direction that is perpendicular to the first direction, and the power gating circuit being connected to the logic circuit, wherein a plurality of source regions respectively included in the plurality of power gating transistors are connected to each other, or a plurality of drain regions respectively included in the plurality of power gating transistors are connected to each other.