Patent classifications
H03K19/0033
Protection of an integrated circuit
An integrated circuit protection device, including: groups of radiation detection elements distributed in a matrix array; logic gates combining outputs of the detection elements in rows and in columns, each output of a detection element being connected to a gate combining a row and to a gate combining a column; and a circuit for interpreting signals supplied by said logic gates and including an event counter and a delay element.
RADIATION-HARDENED BREAK BEFORE MAKE CIRCUIT
A break-before-make (BB4M) circuit topology is disclosed for use with a multiplexer that eliminates shoot-through current between analog inputs and also between an analog input and analog output. The BB4M circuit generates a pulse that disables an existing selected channel before enabling a newly selected channel or gate driver, and is suitable for use in high-radiation or outer space operating environments.
SINGLE EVENT UPSET HARDENED FLIP-FLOP AND METHODS OF OPERATION
A single event upset (SEU) hardened flip-flop comprises a master latch and a plurality of slave latches, where an output of the master latch is coupled to a respective input of the slave latches. A Muller element which has an input which is coupled to a respective output of the slave latches and an output which is coupled to a bus keeper. The bus keeper maintains a logic level output in presence of the SEU.
INTEGRATED RADIATION HARDENED RADIO FREQUENCY DIGITIZER AND SIGNAL PROCESSING ELECTRONICS
Aspects of the present disclosure involve a system and method for sampling received signals for performing time of flight estimation using LiDAR signal processing. In one aspect, a radio frequency analog-to-digital converter is used for real time waveform digitalization. The radio frequency analog-to-digital converter may be coupled to a mezzanine card and used to generate a clock for the converter. The digital waveform may then be buffered and correlated for time of flight estimation.
PROTECTION OF AN INTEGRATED CIRCUIT
An integrated circuit protection device, including: groups of radiation detection elements distributed in a matrix array; logic gates combining outputs of the detection elements in rows and in columns, each output of a detection element being connected to a gate combining a row and to a gate combining a column; and a circuit for interpreting signals supplied by said logic gates and including an event counter and a delay element.
Redundancy scheme for analog circuits and functions for transient suppression
An interference-suppression circuit produces an interference-reduced signal from output signals of a plurality of redundant functional blocks. A first extreme-value determination unit determines the specific output signal that represents a first extreme value from the output signals of the functional blocks. A processing unit offsets the output signals of the plurality of functional blocks against one another in such a manner that the interference-reduced signal is determined. The processing unit omits from consideration the first extreme value in determining the interference-reduced signal.
Protection of an integrated circuit
An integrated circuit protection device, including: groups of radiation detection elements distributed in a matrix array; logic gates combining outputs of the detection elements in rows and in columns, each output of a detection element being connected to a gate combining a row and to a gate combining a column; and a circuit for interpreting signals supplied by said logic gates and including an event counter and a delay element.
Multi-bit flip-flop with soft error suppression
A multi-bit flip-flop includes at least two storage stages. Each of the storage stages includes redundant latches to suppress state corruptions resulting from soft error upset at the storage stage. In addition, the multi-bit flip-flop includes a split clock path that routes different shared clock signals that control the timing of the latches. The shared split clock path reduces or eliminates the impact of soft errors on the clock signals, thereby further limiting the impact of such errors on data stored at the flip-flop. In particular, the split clock path can be distributed over disparate cells in a layout of multi-bit flip-flop, thereby reducing the likelihood that a transient charge will cause a soft error in all paths of the split clock path.
Fault tolerant synchronizer
A synchronization circuit includes a first synchronizer having a first data input, a first clock input, and first output; a second synchronizer having a second data input, a second clock input, and a second output; selection circuitry having first, second, third and fourth inputs, and a synchronized data output, the first and second inputs coupled to the first and second outputs, respectively; and storage circuitry having a storage data input coupled to the synchronized data output, a third clock input, and a feedback output coupled to the fourth input.
MULTI-BIT FLIP-FLOP WITH SOFT ERROR SUPPRESSION
A multi-bit flip-flop includes at least two storage stages. Each of the storage stages includes redundant latches to suppress state corruptions resulting from soft error upset at the storage stage. In addition, the multi-bit flip-flop includes a split clock path that routes different shared clock signals that control the timing of the latches. The shared split clock path reduces or eliminates the impact of soft errors on the clock signals, thereby further limiting the impact of such errors on data stored at the flip-flop. In particular, the split clock path can be distributed over disparate cells in a layout of multi-bit flip-flop, thereby reducing the likelihood that a transient charge will cause a soft error in all paths of the split clock path.