Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).

Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).

An impedance measurement circuit and an operating method thereof are provided. The impedance measurement circuit includes a current source, a voltage controlled oscillator (VCO), an operation circuit, and a first delay circuit. The current source, electrically connected to a power rail, is able to sink a current from the power rail according to the delayed clock signal. The VCO is configured to generate an oscillation signal according to a power voltage on the power rail. The operation circuit is electrically connected to the VCO and is configured to receive a sampling clock signal and the oscillation signal, sense the power voltage to generate a sampled signal, and accumulate the sampled signal to generate a measurement result. The first delay circuit, electrically connected to the current source and the operation circuit, is able to receive the sampling clock signal and transmit the delayed clock signal to the current source.

An impedance measurement circuit and an operating method thereof are provided. The impedance measurement circuit includes a current source, a voltage controlled oscillator (VCO), an operation circuit, and a first delay circuit. The current source, electrically connected to a power rail, is able to sink a current from the power rail according to the delayed clock signal. The VCO is configured to generate an oscillation signal according to a power voltage on the power rail. The operation circuit is electrically connected to the VCO and is configured to receive a sampling clock signal and the oscillation signal, sense the power voltage to generate a sampled signal, and accumulate the sampled signal to generate a measurement result. The first delay circuit, electrically connected to the current source and the operation circuit, is able to receive the sampling clock signal and transmit the delayed clock signal to the current source.

A floating point multiplier-accumulator (MAC) multiplies and accumulates N pairs of floating point values using N MAC processors operating simultaneously, each pair of values comprising an input value and a coefficient value to be multiplied and accumulated. The pairs of floating point values are simultaneously processed by the plurality of MAC processors, each of which output a signed integer form fraction with a first bitwidth and a second bitwith, along with a maximum exponent. The first bitwidth signed integer form fractions are summed by an adder tree using the first bitwidth to form a first sum, and when an excess leading 0 condition is detected, a second adder tree operative on the second bitwidth integer form fractions forms a second sum. The first sum or second sum, along with the maximum exponent, is converted into floating point result.

A floating point multiplier-accumulator (MAC) multiplies and accumulates N pairs of floating point values using N MAC processors operating simultaneously, each pair of values comprising an input value and a coefficient value to be multiplied and accumulated. The pairs of floating point values are simultaneously processed by the plurality of MAC processors, each of which output a signed integer form fraction with a first bitwidth and a second bitwith, along with a maximum exponent. The first bitwidth signed integer form fractions are summed by an adder tree using the first bitwidth to form a first sum, and when an excess leading 0 condition is detected, a second adder tree operative on the second bitwidth integer form fractions forms a second sum. The first sum or second sum, along with the maximum exponent, is converted into floating point result.

A single-phase clocked data multiplexer (MUX-D) scan capable flipflop (FF) design that improves over existing transmission-gate (t-gate) based master-slave flipflops in terms of dynamic capacitance (Cdyn) as well as performance while remaining comparable in area. Unique features of the design are a complementary metal oxide semiconductor (non-t-gate) style structure with an improvement in circuit parameters achieved by eliminating clock inversions and maximally sharing NMOS devices across NAND structures. The core of the flipflop adopts an all CMOS NAND, And-OR-Inverter (AOI) complex logic structure to implement a true edge-triggered flip-flop functionality.

The disclosed technology relates to a logic device based on spin waves. In one aspect, the logic device includes a spin wave generator, a waveguide, at least two phase shifters, and an output port. The spin wave generator is connected with the waveguide and is configured to emit a spin wave in the waveguide. The at least two phase shifters are connected with the waveguide at separate positions such that, when a spin wave is emitted by the spin wave generator, it passes via the phase shifters. The at least two phase shifters are configured to change a phase of the passing spin wave. The output port is connected with the wave guide such that the at least two phase shifters are present between the spin wave generator and the output port.

The disclosed technology relates to a logic device based on spin waves. In one aspect, the logic device includes a spin wave generator, a waveguide, at least two phase shifters, and an output port. The spin wave generator is connected with the waveguide and is configured to emit a spin wave in the waveguide. The at least two phase shifters are connected with the waveguide at separate positions such that, when a spin wave is emitted by the spin wave generator, it passes via the phase shifters. The at least two phase shifters are configured to change a phase of the passing spin wave. The output port is connected with the wave guide such that the at least two phase shifters are present between the spin wave generator and the output port.

Disclosed in some examples are improvements to data placement architectures in NAND that provide additional data protection through an improved NAND data placement schema that allows for recovery from certain failure scenarios. The present disclosure stripes data diagonally across page lines and planes to enhance the data protection. Parity bits are stored in SLC blocks for extra protection until the block is finished writing and then the parity bits may be deleted.