Disclosed in some examples are improvements to data placement architectures in NAND that provide additional data protection through an improved NAND data placement schema that allows for recovery from certain failure scenarios. The present disclosure stripes data diagonally across page lines and planes to enhance the data protection. Parity bits are stored in SLC blocks for extra protection until the block is finished writing and then the parity bits may be deleted.

High-speed communication links with self-aligned scrambling on a communication link that sends scrambled signals may include a slave device that may self-align by initially detecting an unscrambled preamble symbol and more particularly detect an edge of the unscrambled preamble symbol. Based on the detected edge, a fine alignment adjustment may be made by testing subsequent scrambled data for a repeated pattern such as an IDLE symbol by comparing the repeated pattern to a candidate scrambled sequence that has been received through the communication link. The comparison may use an exclusive OR (XOR) circuit on some bits to derive a scrambler seed that is used to test for a match for the remaining bits. If there is a match, the scrambler seed and frame alignment have been detected and alignment is achieved.

A method for simple measurement of phase shift between a first clock signal and a second clock signal is described, each clock signal having a period T.sub.0. The method includes: feeding the first clock signal into a first input of a mixer; feeding the second clock signal into a second input of the mixer; feeding the output signal of the mixer into a low pass filter; and measuring the output signal of the low pass filter, with the aid of an output voltage that is normalized to operating voltage of the mixer. A circuit for implementing the method includes a mixer and a low pass filter. The mixer includes a first input for feeding in the first clock signal, and a second input for feeding in the second clock signal. The output of the mixer is connected to the input of the low pass filter.

A method for simple measurement of phase shift between a first clock signal and a second clock signal is described, each clock signal having a period T.sub.0. The method includes: feeding the first clock signal into a first input of a mixer; feeding the second clock signal into a second input of the mixer; feeding the output signal of the mixer into a low pass filter; and measuring the output signal of the low pass filter, with the aid of an output voltage that is normalized to operating voltage of the mixer. A circuit for implementing the method includes a mixer and a low pass filter. The mixer includes a first input for feeding in the first clock signal, and a second input for feeding in the second clock signal. The output of the mixer is connected to the input of the low pass filter.

A magnetic logic device having two magnetic elements and a conductive element coupled to the two magnetic elements and arranged at least substantially perpendicular to the magnetic elements, wherein the device is configured, for each magnetic element, to have a magnetisation state with a perpendicular easy axis, and to switch the magnetisation state in response to a spin current generated in the magnetic element in response to a write current applied to the magnetic element, and configured to generate, as an output, a Hall voltage across the conductive element in response to a respective read current applied to each magnetic element, wherein a magnitude of the Hall voltage is variable, depending on a direction of the magnetisation state of each magnetic element and a direction of the respective read current applied to each magnetic element, for the device to provide outputs corresponding to one of a plurality of logical operations.

A magnetic logic device having two magnetic elements and a conductive element coupled to the two magnetic elements and arranged at least substantially perpendicular to the magnetic elements, wherein the device is configured, for each magnetic element, to have a magnetisation state with a perpendicular easy axis, and to switch the magnetisation state in response to a spin current generated in the magnetic element in response to a write current applied to the magnetic element, and configured to generate, as an output, a Hall voltage across the conductive element in response to a respective read current applied to each magnetic element, wherein a magnitude of the Hall voltage is variable, depending on a direction of the magnetisation state of each magnetic element and a direction of the respective read current applied to each magnetic element, for the device to provide outputs corresponding to one of a plurality of logical operations.

The disclosure includes: acquiring first data; grouping the first data to obtain K packet sub-data; inputting a preset primer into a random generator to obtain 4T random number sequences, 4.sup.T>K; determining the packet sub-data corresponding to the ith random number sequence, and performing exclusive or (XOR) operation on the determined packet sub-data to obtain data information DATAi, and obtaining a DNA molecular chain according to the data information DATAi, the preset primer and the generation times capacity of the random generator; performing DNA sequence synthesis on the plurality of DNA molecular chains to obtain target storage data. In the disclosure, in the process of coding the first data to obtain a DNA molecular chain, a random generator is added to greatly simplify the coding process and implement efficient and accurate coding on the first data. The disclosure may be widely applied to a field of data storage technologies.

A comparison circuit includes a comparison module, a state judgment module and a state storage module. The comparison module includes a first input end connected to a voltage to be measured and a second input end connected to a reference voltage. The state judgment module includes a first input end connected to a first output end of the comparison module and a second input end connected to a second output end of the comparison module. The state storage module includes an input end connected to the first output end of the comparison module and an enable end connected to an output end of the state judgment module. The embodiments of the disclosure may improve processing efficiency of the comparison circuit.

An architecture for a chopper stabilized multiplier-accumulator (MAC) uses a chop clock and common Unit Element (UE), the MAC formed as a plurality of MAC UEs receiving X and W values and a sign bit exclusive ORed with the chop clock, a plurality of Bias UEs receiving E value and a sign bit exclusive ORed with the chop clock, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.

An architecture for a chopper stabilized multiplier-accumulator (MAC) uses a chop clock and common Unit Element (UE), the MAC formed as a plurality of MAC UEs receiving X and W values and a sign bit exclusive ORed with the chop clock, a plurality of Bias UEs receiving E value and a sign bit exclusive ORed with the chop clock, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.