An example apparatus includes: nonlinearity function selection circuitry with an output, the nonlinearity function selection circuitry to select a type of a nonlinearity function, the nonlinearity function to model nonlinearity portions of data output from an analog-to-digital converter, nonlinearity function term generation circuitry with a first input coupled to the output, the nonlinearity function term generation circuitry to generate one or more nonlinearity function terms of the nonlinearity function based on the type of the nonlinearity function and the data, and coefficient determination circuitry with a second input coupled to the output, the coefficient determination circuitry to determine one or more nonlinearity function coefficients based on the one or more nonlinearity function terms, the nonlinearity portions of the data to be compensated based on the one or more nonlinearity function coefficients.

A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

A buffer circuit includes a first differential signal input, a second differential signal input, a first source follower circuit, and a second source follower circuit. The first source follower circuit includes a first signal output, and a first input transistor. The first input transistor is coupled to the first differential signal input, and is configured to drive the first signal output. The second source follower circuit includes a second signal output, a second input transistor, and a cascode transistor. The second input transistor is coupled to the second differential signal input, and is configured to drive the second signal output. The cascode transistor is coupled to the second input transistor and the first signal output, and is configured to compensate for non-linearity of the second input transistor based on an output signal provided at the first signal output.

A system includes a plurality of digital-to-analog converter (DAC) channels. Each DAC channel includes a current control circuit which receives a start limit signal or an end limit signal. The current control circuit reduces an output current limit of the channel responsive to the start limit signal and increases the output current limit responsive to the end limit signal. Each channel includes a current sensor circuit adapted to measure the output current of the channel and provide a channel over-current alert signal if the output current rises above a high current limit. The system includes a controller which asserts the start limit signal if the number of channels exceeding the high current limit is greater than a maximum allowable number and asserts the end limit signal if the number of channels exceeding the high current limit is less than the maximum allowable number minus a hysteresis value.

A controlled oscillator Analog-to-Digital Converter (ADC) includes an analog interface configured for receiving an analog differential input signal, and configured for providing a differential control signal; first and second controlled oscillators configured for receiving the differential control signal; and a frequency-to-digital converter having a first input coupled to an output of the first controlled oscillator, a second input coupled to an output of the second controlled oscillator, and an output for providing a digital output signal proportional to the analog differential input signal, wherein the analog interface or at least one of the first and second controlled oscillators is configured for receiving at least one disturb signal to prevent locking between the first and second controlled oscillators.

Analog to digital conversion errors caused by non-linearities or other sources of distortion in an analog-to-digital converter are compensated for by use of a machine learning system, such as a neural network. The machine learning system is trained based on simulation or measurement data, which may utilize a reference ADC or a digital training signal representing a reference ADC that has less distortion errors than the analog-to-digital converter. The effect on the analog to digital conversion errors by Process-Voltage-Temperature parameters may be incorporated into the training of the machine learning system.

A tracking ADC with adaptive slew rate boosting can dynamically adjust one or more of its operational parameters in response to detecting a slew rate limit condition. In some embodiments, slew rate boosting can include increasing the value of a digital error signal in response to detection of a slew rate limit condition. In other embodiments, slew rate boosting can include increasing a clock frequency of the tracking ADC in response to detection of a slew rate limit condition.

Integrated circuit dies, systems, and techniques are described related to multiple gate digital to analog converters operable at low temperatures. A multiple gate digital to analog converter includes a channel material spanning a length between a source and a drain and multiple gate structures of different sizes coupled to the channel material and spaced apart along the length. The multiple gate structures of the digital to analog converter are independently operable to convert a digital input to an analog output.

A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

The systems and methods discussed herein related to digital to analog conversion. A digital to analog conversion circuit can includes a digital input, an analog output, and a cell array. The digital to analog converter can also include an integrator, an analog to digital converter (ADC), and a summer coupled to the ADC, and an adaptation circuit coupled to the summer. The adaption circuit provides controls signals to the cell array.