An analog to digital converter (ADC) that may include an input configured to receive a first signal and a second signal; a signal generator that is configured to generate multiple signals, the multiple signals may include a phase-shifted clock signals that are phase shifted from each other, first pulse width modulation (PWM) related signals indicative of a value of the first signal, second PWM related signals indicative of a value of the second signals, a first sampled stream, a second stream that have substantially opposite phases, and phase related signals related to the first sampled stream and the second sampled stream; wherein the first sampled stream and the second sampled stream are generated based on at least one of the phase shifted clock signals; and a processing unit that is configured to receive at least some of the multiple signals, the at least some of the multiple signals may include the first PWM related signals, the second PWM related signals, and the phase related signals; generate, based on the at least some of the multiple samples, virtual counter values and virtual phase values that are mutually aligned; determine a value of a difference between the first signal and the second signal, and output an ADC output signal indicative of the difference between the first signal and the second signal.

An electronic circuit for converting a signal between digital and analog in a burst mode, including a processor configured to utilize a synchronizing clock signal, a converter configured to convert a signal data between digital and analog using a converter clock signal, a phase comparator configured to determine a phase relationship between the synchronizing clock signal and the converter clock signal, and a digital signal processor coupled to the phase comparator and configured to receive an information about the phase relationship, wherein the digital signal processor is configured to apply a delay to the signal data being exchanged between the processor and. The synchronizing clock signal and the converter clock signal have a predetermined frequency relationship.

Digital to analog converter generates an analog output corresponding to a digital input by controlling DAC cells using bits of the digital input. The DAC cells individually make a contribution to the analog output. Due to process, voltage, and temperature variations, the DAC cells may have duty cycle error or mismatches. To compensate for the duty cycle error of a DAC cell, a small amount of charge is injected into a low-impedance node of a DAC cell when the data signal driving the DAC cell transitions, or changes state. The small amount of charge is generated using a capacitive T-network, and the polarity of the charge injected is opposite of the error charge caused by duty cycle error. The opposite amount of charge thus compensates or cancels out the duty cycle error, and duty cycle error present at the output of the DAC cell is reduced.

A column analog-to-digital converter and the local counting method is provided. The column analog-to-digital converter includes a plurality of analog-to-digital converters in parallel. Each of the analog-to-digital converters includes a comparator and a counting circuit. The comparator compares the ramp voltage with one of the plurality of column signals to generate a comparator output signal. The counting circuit triggers a delay line circuit of the counting circuit to generate first delay data according to the comparator output signal, re-triggers the delay line circuit to generate first re-trigger delay data according to a base clock, and compares the first delay data with the first re-trigger delay data to generate a first counting output.

Testing of the noise-shaping circuitry within a successive approximation register (“SAR”) analog-to-digital converter (“ADC”) (“SAR ADC”) to ensure it will function as expected, while also providing a method for calibrating the coefficients of the noise-shaping circuitry. Programmable/trimmable circuit component(s) can be used to calibrate the coefficient(s) of the SAR ADC. Digital logic within the SAR engine enables it to selectively skip portions of the ADC conversion process and to use voltage references rather than an analog voltage input signal in sample mode during such test/calibration modes.

A controlled oscillator Analog-to-Digital Converter (ADC) includes an analog interface configured for receiving an analog differential input signal, and configured for providing a differential control signal; first and second controlled oscillators configured for receiving the differential control signal; and a frequency-to-digital converter having a first input coupled to an output of the first controlled oscillator, a second input coupled to an output of the second controlled oscillator, and an output for providing a digital output signal proportional to the analog differential input signal, wherein the analog interface or at least one of the first and second controlled oscillators is configured for receiving at least one disturb signal to prevent locking between the first and second controlled oscillators.

A digital-to-analog conversion circuit includes an operational amplification module having an operational amplifier connected to an output transistor to form a negative feedback circuit to obtain equal voltages at positive and negative ends. A negative end current flowing into the negative end is proportional to a positive end current flowing into the positive end. An input end of a conversion module is connected in parallel with a first resistor of the operational amplification module to obtain the same voltage as the first resistor, and an analog current proportional to the negative end current and positive end current. An output end of the conversion module is connected with the source of the output transistor and configured to receive the analog current and to make the analog current flow to an output resistor via the drain of the output transistor, to obtain an output current proportional to the positive end current.

A Successive Approximation Register Analog-to-Digital Converter (SAR ADC) is disclosed. The SAR ADC includes a switched capacitor array, a buffer, a comparator and a control logic circuit. The switched capacitor array is arranged to sample an input signal according to a switch control signal to generate a sampling signal. The buffer is arranged to generate a common mode voltage. The comparator is arranged to receive the sampling signal and the common mode voltage in order to generate a comparison result. The control logic circuit is arranged to generate an output signal according to the comparison result, and generate the switch control signal to control the switched capacitor array. The control logic circuit further generates an operation control signal to adjust a Miller compensation capacitor inside the buffer. An associated control method is also disclosed.

The present application discloses a data converter (112). The data converter includes an input terminus (98), a digital-to-analog (D/A) converter (116) and a mapping unit (114). The input terminus is configured to receive an input signal. The D/A converter includes a plurality of D/A converter units configured to generate an output signal. The mapping unit is coupled between the input terminus and the D/A converter and is configured to cause the plurality of D/A conversion units to be equivalently arranged in a relative order in which the plurality of D/A conversion units are gated according to specific electrical characteristics of the plurality of D/A conversion units for digital-to-analog conversion. The present application further provides an A/D converter, a D/A converter and a related chip.

An analog input device, which converts an inputted analog signal to a digital signal and outputs the digital signal, includes a high resolution AD converter, a first low resolution AD converter, and a second low resolution AD converter. When a difference between a first digital signal converted by the high resolution AD converter and a second digital signal converted by the first low resolution AD converter is equal to or less than a predetermined first threshold, the analog input device outputs first digital signal. When the difference between the first digital signal and the second digital signal is larger than the predetermined first threshold, the analog input device stops an output of the first digital signal.