A measurement unit comprising a converter unit and a processing unit is configured to provide a measurement result value, based on a first input signal and a second input signal.

The converter unit is configured to provide a first digital, quantized values based on the first input signal or derived from the first input signal and the second input signal. The converter unit is further configured to provide second digital, quantized values based on the second input signal. The measurement unit is configured to change the one or more control signals of the converter unit between determination of different first values or a determination of the different second values, wherein different first values and/or different second values are provided using different converter quantization step sizes. The processing unit is configured to provide a measurement result value from a predefined number of first values and a predefined number of second values.

A sensor system (1, 1S) including a current DA converter (42) outputting a control current (Ip) of a sensor element (3S), a control unit (4C) generating a control current instruction value (Ipcmd) corresponding to magnitude of the control current and inputting this instruction value to the current DAC, an instruction value sequence generating unit (47) generating, instead of the control current instruction value, an inspection instruction value sequence (RChcmd) in which predetermined inspection current instruction values (Chcmd) inputted to the current DAC are arranged in order and by which failure of the current DAC can be detected, an inspection current detection unit (71) detecting an inspection current value (Ichv) of an inspection current (Ich) outputted from the current DAC, and a failure detection unit (8) detecting failure of the current DAC from an inspection current value sequence (RIchv) in which the inspection current values are arranged in order of detection.

An integrated circuit includes a successive approximation register (SAR) analog-to-digital converter (ADC). The ADC includes a bit step selector. During testing of the ADC, the bit step selector selects a number of bits to be tested for a next analog test voltage based on digital values that are within an integer delta value of most recent digital value for a most recent analog test voltage.

Testing of the noise-shaping circuitry within a successive approximation register (“SAR”) analog-to-digital converter (“ADC”) (“SAR ADC”) to ensure it will function as expected, while also providing a method for calibrating the coefficients of the noise-shaping circuitry. Programmable/trimmable circuit component(s) can be used to calibrate the coefficient(s) of the SAR ADC. Digital logic within the SAR engine enables it to selectively skip portions of the ADC conversion process and to use voltage references rather than an analog voltage input signal in sample mode during such test/calibration modes.

A circuit configured to: generate a reference clock signal; generate an excitation signal at a target frequency having a period that is a first integer number of cycles of the reference clock signal; update a driver circuit at an update frequency having a period that is a second integer number of cycles of the reference clock signal; digitize sense signals resulting from the excitation signal at a frequency having a period that is a third integer number of cycles of the reference clock signal; identify a fourth integer number of sense signal samples; optionally utilize an excitation control signal having a period that is a fifth integer number of cycles of the reference clock signal; and minimize harmonics at the target frequency of the excitation signal based on the first integer number, the second integer number, the third integer number, the fourth integer number, and possibly the fifth integer number.

A measurement apparatus comprising an acquisition memory adapted to store data sections of at least one acquired measurement signal; a processor adapted to calculate a measurement parameter vector, v, for each data section of the acquired measurement signal; and a trained autoencoder neural network adapted to process the measurement parameter vectors, v, applied as input data to the trained autoencoder neural network to provide at a middle layer of said autoencoder neural network an encoded vector, h, with characteristic signal features of the acquired measurement signal.

An error extraction method for foreground digital correction of a pipeline analog-to-digital converter including: acquiring a transmission curve of a pipeline analog-to-digital converter, and controlling an input signal to be within a sub-segment 0 of the transmission curve; during extraction of error information of an ith pipeline stage, setting a magnitude of the input signal according to Formula (I); locking the outputs of all previous-stage comparators in the i.sup.th pipeline stage of the pipeline analog-to-digital converter; and completing, according to original output code of the pipeline analog-to-digital converter, error extraction by means of adaptive iteration, stage-by-stage, sequentially from a last stage to a first stage of a pipeline. During quantization of error value, the invention performs, by means of a fitting-based adaptive algorithm, foreground extraction of a capacitance mismatch error, a gain bandwidth error, and a kickback error in each stage of the pipeline, without any additional circuit.

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

A system may include ADC circuitry. To test the performance of the ADC circuitry, the system may include ADC testing circuitry coupled to the ADC circuitry. In particular, the ADC testing circuitry may include reference voltage generation circuitry configured to generate reference voltages serving as test voltages for the ADC circuitry. The ADC circuitry may be coupled to a test input for receiving the test voltages via switching circuitry and may be coupled to a main data input for receiving system data via the switching circuitry. Testing may occur during an idling time period of the system and when the switching circuitry couples the test input to the ADC circuitry. Test input voltages corresponding to one or more stages in the ADC circuitry may be provided to the ADC circuitry, and corresponding output values from the ADC circuitry may be compared to an expected value and/or expected threshold values.

A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.