An apparatus and method are disclosed with some embodiments including an analog and time to digital converter (ATDC) including a receiver, the receiver for receiving an analog channel input for conversion to a digital data, the digital data having at least one bit, and a defined absolute reference time stamp, the defined absolute reference time stamp representing an absolute reference time associated with conversion of the analog channel input to the digital data and an analog-to-digital converter, the converter converting the analog channel input to the digital data.

An image sensor includes ADCs, each including a comparator receiving a ramp signal and an image signal, and generating a comparator output. Each ADC also includes a counter ceasing to change a digital count value in response to a change in the comparator output. The digital count value has a first resolution. Each ADC also includes a delay line circuit including a delay line generating a first digital value encoding a duration of a period of the counter clock and generating a second digital value encoding a first portion of the period of the counter clock. Each ADC also includes a delay to digital circuit generating a digital output value based on the first and digital values. The digital output value encodes a second value of the ramp signal, where the digital count value has a second resolution that is greater than the first resolution.

An image sensor includes ADCs, each including a comparator receiving a ramp signal and an image signal, and generating a comparator output. Each ADC also includes a counter ceasing to change a digital count value in response to a change in the comparator output. The digital count value has a first resolution. Each ADC also includes a delay line circuit including a delay line generating a first digital value encoding a duration of a period of the counter clock and generating a second digital value encoding a first portion of the period of the counter clock. Each ADC also includes a delay to digital circuit generating a digital output value based on the first and digital values. The digital output value encodes a second value of the ramp signal, where the digital count value has a second resolution that is greater than the first resolution.

An integrating Analog-to-digital converter has a global counter that outputs a counter code signal including a multiphase signal. It also has a column circuit including: a ramp wave generation circuit outputting a ramp wave voltage; a comparator comparing the ramp wave voltage with a pixel voltage; and a latch circuit latching the counter code signal at output inversion timing of the comparator. An output value of the latch circuit is used as a digital conversion output value per the column circuit. The counter has a phase division circuit outputting, as an LSB of the digital conversion output value of the integrating analog-to-digital converter, a phase division signal to the latch circuit, the phase division signal dividing a phase of the counter code signal. The phase division circuit is arranged to a plurality of column circuits, and the LSB is shared by a plurality of phase division circuits.

An integrating Analog-to-digital converter has a global counter that outputs a counter code signal including a multiphase signal. It also has a column circuit including: a ramp wave generation circuit outputting a ramp wave voltage; a comparator comparing the ramp wave voltage with a pixel voltage; and a latch circuit latching the counter code signal at output inversion timing of the comparator. An output value of the latch circuit is used as a digital conversion output value per the column circuit. The counter has a phase division circuit outputting, as an LSB of the digital conversion output value of the integrating analog-to-digital converter, a phase division signal to the latch circuit, the phase division signal dividing a phase of the counter code signal. The phase division circuit is arranged to a plurality of column circuits, and the LSB is shared by a plurality of phase division circuits.

A column analog-to-digital converter and the local counting method is provided. The column analog-to-digital converter includes a plurality of analog-to-digital converters in parallel. Each of the analog-to-digital converters includes a comparator and a counting circuit. The comparator compares the ramp voltage with one of the plurality of column signals to generate a comparator output signal. The counting circuit generates a local clock by means of a voltage-controlled oscillator of the counting circuit according to the base clock and the comparator output signal, counts the base clock and the local clock respectively to generate a first counting output and a second counting output, and combines the first counting output with the second counting output to generate the counting output.

In an example, a system includes an input channel and a voltage to delay converter (V2D) coupled to the input channel. The system also includes a first multiplexer coupled to the V2D and an analog-to-digital converter (ADC) coupled to the first multiplexer. The system includes a second multiplexer coupled to the input channel and an auxiliary ADC coupled to the second multiplexer. The system includes calibration circuitry coupled to an output of the auxiliary ADC, where the calibration circuitry is configured to correct a non-linearity in a signal provided by the input channel. The calibration circuitry is also configured to determine the non-linearity of the signal provided to the ADC relative to the signal provided to the auxiliary ADC.

An analog-to-digital converter is disclosed that converts an input analog potential to a digital conversion value. An analog-to-digital converter according to one or more embodiments may include a comparator that compares the input analog potential with a reference potential; and a conversion circuit that measures comparison operation time from a start to an end of a comparison operation by the comparator and outputs the digital conversion value according to the measured comparison operation time and a comparison result by the comparator.

Various implementations of sorting networks are described that utilize time-encoded data signals having encoded values. In some examples, an electrical circuit device includes a sorting network configured to receive a plurality of time-encoded signals. Each time-encoded signal of the plurality of time-encoded signals encodes a data value based on a duty cycle of the respective time-encoded signal or based on a proportion of data bits in the respective time-encoded signal that are high relative to the total data bits in the respective time-encoded signal. The sorting network is also configured to sort the plurality of time-encoded signals based on the encoded data values of the plurality of time-encoded signals.

An analog counter circuit for use with a digital pixel includes an input; an output; a first inverter connected to the input that produces on a first inverter output a time delayed inverted signal (RP*) from an input signal received at the input; a second inverter connected to the first inverter output that produces a time delayed signal (RP) at a second inverter output from the input signal and that is delayed relative to RP* and a control switch connected between a source voltage and a floating node. The control switch is controlled by the signal RP* on the first inverter output. The analog counter also includes a feedback capacitor connected between the second inverter output and the floating node; an accumulating capacitor that accumulates at least some of a charge that passes through the control switch; and an injection switch connected between the control switch and the accumulating capacitor.