H03M1/86

ΔΣ modulator with excess loop delay compensation

According to at least one aspect, a delta sigma modulator circuit is provided. The delta sigma modulator circuit includes a first signal processor circuit configured to receive an input signal and a feedback signal and generate a processed signal using the input signal and the feedback signal, a quantizer configured to generate a digital code using the processed signal, a second signal processor circuit configured to receive the digital code, segment the digital code to form a segmented digital code that is smaller in size than the digital code, and generate a rotated digital code using the segmented digital code at least in part by rotating the segmented digital code to compensate for an excess loop delay in the circuit, and an digital-to-analog converter (DAC) configured to receive the rotated digital code and generate the feedback signal using the rotated digital code.

DELTA SIGMA MODULATOR WITH EXCESS LOOP DELAY COMPENSATION

According to at least one aspect, a delta sigma modulator circuit is provided. The delta sigma modulator circuit includes a first signal processor circuit configured to receive an input signal and a feedback signal and generate a processed signal using the input signal and the feedback signal, a quantizer configured to generate a digital code using the processed signal, a second signal processor circuit configured to receive the digital code, segment the digital code to form a segmented digital code that is smaller in size than the digital code, and generate a rotated digital code using the segmented digital code at least in part by rotating the segmented digital code to compensate for an excess loop delay in the circuit, and an digital-to-analog converter (DAC) configured to receive the rotated digital code and generate the feedback signal using the rotated digital code.

VCO-BASED CONTINUOUS-TIME SIGMA DELTA MODULATOR EQUIPPED WITH TRUNCATION CIRCUIT AND PHASE-DOMAIN EXCESS LOOP DELAY COMPENSATION

A continuous-time sigma-delta modulator includes a VCO-based quantizer, a rotator, a truncation circuit and a digital-to-analog converter (DAC). The VCO-based quantizer is arranged to generate a thermometer code based on an input signal and a feedback signal. The rotator is coupled to the VCO-based quantizer, and is arranged to generate a phase-shifted thermometer code based on the thermometer code and a phase shift, and generate a rearranged thermometer code based on the phase-shifted thermometer code to comply with a specific pattern. The truncation circuit is coupled to the rotator, and is arranged to extract a most significant bit (MSB) part from the rearranged thermometer code. The DAC is coupled to the truncation circuit, and is arranged to generate the feedback signal according to at least the MSB part. Two alternative continuous-time sigma-delta modulators are also disclosed.

VCO-based continuous-time sigma delta modulator equipped with truncation circuit and phase-domain excess loop delay compensation

A continuous-time sigma-delta modulator includes a VCO-based quantizer, a rotator, a truncation circuit and a digital-to-analog converter (DAC). The VCO-based quantizer is arranged to generate a thermometer code based on an input signal and a feedback signal. The rotator is coupled to the VCO-based quantizer, and is arranged to generate a phase-shifted thermometer code based on the thermometer code and a phase shift, and generate a rearranged thermometer code based on the phase-shifted thermometer code to comply with a specific pattern. The truncation circuit is coupled to the rotator, and is arranged to extract a most significant bit (MSB) part from the rearranged thermometer code. The DAC is coupled to the truncation circuit, and is arranged to generate the feedback signal according to at least the MSB part. Two alternative continuous-time sigma-delta modulators are also disclosed.

Self-calibrating buffered-voltage DAC

A self-calibrated buffered-voltage DAC includes a DAC configured to receive an input digital signal and output a first analog voltage signal, a buffer amplifier configured to receive the first voltage signal from the DAC and provide a buffered second analog voltage signal, a voltage to frequency converter configured to selectively receive the first and second voltage signals and provide first and second output signals at respective first and second frequencies, a counter configured to receive the output signals from the voltage to frequency converter and provide respective first and second digital output signals corresponding to the respective first and second frequencies, a comparator configured to receive the first and second digital output signals and provide a digital calibration offset, and a DAC error code module configured to receive a digital input code and the digital calibration offset and to provide an offset corrected input digital signal to the DAC.

UNIT CELL-BASED DAC
20260058671 · 2026-02-26 ·

There is disclosed a unit cell-based DAC configured to operate in N consecutive phases, wherein the unit cell-based DAC comprises a plurality of unit cells and wherein a single transition between a first state and a second state of the unit cell-based DAC is caused by M transitions of the plurality of unit cells between corresponding first states and second states, where M is smaller than N, wherein each transition of a unit cell is configured to occur during one of the N phases and wherein the interconnections of the unit cells are reconfigurable such that the unit cell-based DAC is configured to switchably operate in one of a PAM3 mode, in which the unit cell-based DAC converts a two-bit input signal into a three-level output signal, and a PAM4 mode in which the unit cell-based DAC converts the two-bit input signal into a four-level output signal.

UNIT CELL-BASED DAC
20260058671 · 2026-02-26 ·

There is disclosed a unit cell-based DAC configured to operate in N consecutive phases, wherein the unit cell-based DAC comprises a plurality of unit cells and wherein a single transition between a first state and a second state of the unit cell-based DAC is caused by M transitions of the plurality of unit cells between corresponding first states and second states, where M is smaller than N, wherein each transition of a unit cell is configured to occur during one of the N phases and wherein the interconnections of the unit cells are reconfigurable such that the unit cell-based DAC is configured to switchably operate in one of a PAM3 mode, in which the unit cell-based DAC converts a two-bit input signal into a three-level output signal, and a PAM4 mode in which the unit cell-based DAC converts the two-bit input signal into a four-level output signal.