This patent provides a method and apparatus for acquiring imagery with improve spatial resolution through an apparatus called a “light painting imaging device”. Other aspects of this invention correct for barrel distortion and pincushion distortion.

An image sensor includes a pixel array including a plurality of pixels provided in a plurality of rows and a plurality of columns, and a signal processor configured to process first image data generated by the pixel array to generate a plurality of pieces of first full color image data, wherein the signal processor is further configured to split the first image data into a plurality of pieces of phase data, remosaic-process each of the plurality of pieces of phase data to generate a plurality of pieces of color phase data, merge the plurality of pieces of color phase data corresponding to a same color, respectively, to generate a plurality of pieces of preliminary color data, and compensate for the plurality of pieces of preliminary color data to generate the plurality of pieces of first full color image data.

Provided are a solid-state imaging device, a method for driving a solid-state imaging device and an electronic apparatus capable not only of having advanced global shutter and autofocus functions but also of sufficiently achieving single exposure high dynamic range (SEHDR) performance, thereby substantially realizing enhanced dynamic range and frame rate.

In an image capturing mode, a reading part controls driving of a conversion signal reading part such that the conversion signal reading part keeps first and second transfer transistors in a conduction state in the same transfer period and performs a read-out operation on a pixel signal corresponding to a sum of charges stored in a first photodiode and charges stored in a second photodiode with a first conversion gain and subsequently with a second conversion gain.

The present technology relates to an image sensor and an electronic apparatus which enable higher-quality images to be obtained. Provided is an image sensor including a plurality of pixels, each pixel including one on-chip lens, and a plurality of photoelectric conversion layers formed below the on-chip lens. Each of at least two of the plurality of photoelectric conversion layers is split, partially formed, or partially shielded from light with respect to a light-receiving surface. The pixels are phase difference detection pixels for performing AF by phase difference detection or imaging pixels for generating an image. The present technology can be applied to a CMOS image sensor, for example.

An imaging device with low power consumption is provided. The pixel of the imaging device includes first and second photoelectric conversion elements, and first to fifth transistors. A cathode of the first photoelectric conversion element is electrically connected to the first transistor. An anode of a second photoelectric conversion element is electrically connected to the second transistor. Imaging data of a reference frame is obtained using the first photoelectric conversion element, and then imaging data of a difference detection frame is obtained using the second photoelectric conversion element. After the imaging data of the difference detection frame is obtained, a first potential that is a potential of a signal output from the pixel and a second potential that is a reference potential are compared. Whether or not there is a difference between the imaging data of the reference frame and the imaging data of the difference detection frame is determined using the first potential and the second potential.

An imaging device with low power consumption is provided. The pixel of the imaging device includes first and second photoelectric conversion elements, and first to fifth transistors. A cathode of the first photoelectric conversion element is electrically connected to the first transistor. An anode of a second photoelectric conversion element is electrically connected to the second transistor. Imaging data of a reference frame is obtained using the first photoelectric conversion element, and then imaging data of a difference detection frame is obtained using the second photoelectric conversion element. After the imaging data of the difference detection frame is obtained, a first potential that is a potential of a signal output from the pixel and a second potential that is a reference potential are compared. Whether or not there is a difference between the imaging data of the reference frame and the imaging data of the difference detection frame is determined using the first potential and the second potential.

An image sensor including a semiconductor substrate, a plurality of color filters, a plurality of first lenses and a second lens is provided. The semiconductor substrate includes a plurality of sensing pixels arranged in array, and each of the plurality of sensing pixels respectively includes a plurality of image sensing units and a plurality of phase detection units. The color filters at least cover the plurality of image sensing units. The first lenses are disposed on the plurality of color filters. Each of the plurality of first lenses respectively covers one of the plurality of image sensing units. The second lens is disposed on the plurality of color filters and the second lens covers the plurality of phase detection units.

An image sensor including a semiconductor substrate, a plurality of color filters, a plurality of first lenses and a second lens is provided. The semiconductor substrate includes a plurality of sensing pixels arranged in array, and each of the plurality of sensing pixels respectively includes a plurality of image sensing units and a plurality of phase detection units. The color filters at least cover the plurality of image sensing units. The first lenses are disposed on the plurality of color filters. Each of the plurality of first lenses respectively covers one of the plurality of image sensing units. The second lens is disposed on the plurality of color filters and the second lens covers the plurality of phase detection units.

An event sensing system includes a pixel array including a plurality of event driven pixel circuits configured to be illuminated by incident light. The event driven pixel circuits are configured to generate an event current in response to a detection of an event in the incident light. Output signals of a row of the pixel array are configured to be read out from the row of the pixel array to a line buffer in response to the detection of the event in the incident light. A random number generator is configured to randomly generate a filtering mask. A mask circuit is the output signals of the row of the pixel array from the line buffer and the filtering mask from the random number generator to filter the output signals of the row of the pixel array in response to the filtering mask.

An event sensing system includes a pixel array including a plurality of event driven pixel circuits configured to be illuminated by incident light. The event driven pixel circuits are configured to generate an event current in response to a detection of an event in the incident light. Output signals of a row of the pixel array are configured to be read out from the row of the pixel array to a line buffer in response to the detection of the event in the incident light. A random number generator is configured to randomly generate a filtering mask. A mask circuit is the output signals of the row of the pixel array from the line buffer and the filtering mask from the random number generator to filter the output signals of the row of the pixel array in response to the filtering mask.