A superconducting dipole magnet structure that includes coil boxes, a dewar and a support device is provided, wherein each of the coil boxes is of a one-piece structure in which a superconducting coil is provided, wherein the superconducting coils are opposite to each other so that a uniform dipole magnetic field is generated when the two superconducting coils are energized, and wherein the support device is fixed to the dewar and supports the coil box in the way of point contact.

A hadron therapy system that provides 3D scanning and rapid delivery of a high dose. Such systems can include a hadron source and accelerator with an RF energy modulator and an RF deflector that operate in combination to provide 3D scanning of a targeted tissue. The systems can include a permanent magnet quadrupole for magnification of the beam. The systems can include high energy hadron sources that utilize a multi-cell, multi-klystron design that achieves scanning of high energy hadron beams, for example a fixed energy of 200 MeV protons. Such systems can provide full irradiation of a liter scale tumor within one second or less.

An example method includes: receiving, from a treatment planning process, information that is based on a dose distribution for an irradiation target; and performing at least one of the following operations: moving structures to trim spots of a particle beam so that the spots of the particle beam approximate pre-trimmed spots for which characteristics are obtained based on the information received; moving structures to produce a trimming curve for a layer of an irradiation target based on a specification of a trimming curve for the layer included in the information received; moving structures to produce a single trimming curve for all radiation fields of an irradiation target based on specifications of the single trimming curve included in the information received; or moving structures based on configuration information for the structures in the information received.

A particle beam therapy device that irradiates a patient with a cation beam to perform treatment, the device including a passage selection unit that selectively passes through the cation beam among a mixed beam in which the cation beam and other species of a beam having a nuclide different from that of the cation beam are mixed after passing through a deflection magnetic field, after causing the mixed beam to pass through the deflection magnetic field, in a case where the other species of the beam is generated from the cation beam.

A wafer-based charged particle accelerator includes a charged particle source and at least one RF charged particle accelerator wafer sub-assembly and a power supply coupled to the at least one RF charged particle accelerator wafer sub-assembly. The wafer-based charged particle accelerator may further include a beam current-sensor. The wafer-based charged particle accelerator may further include at least a second RF charged particle accelerator wafer sub-assembly and at least one ESQ charged particle focusing wafer. Fabrication methods are disclosed for RF charged particle accelerator wafer sub-assemblies, ESQ charged particle focusing wafers, and the wafer-based charged particle accelerator.

The present invention relates to a superconducting electromagnet apparatus having a group of superconducting electromagnets including a first superconducting electromagnet and a second superconducting electromagnet arranged adjacent to the first superconducting electromagnet. Effective magnetic field regions generated by the first and second superconducting electromagnets, respectively, are formed to satisfy predetermined relational equations.

A particle therapy system in which the efficiency of extracting a beam from a synchrotron can be improved and time required for therapy can be shortened is provided. The synchrotron 10 of the particle therapy system 100 extracts a charged particle beam, which circulates in the synchrotron 10, out of the synchrotron 10 by means of a slow extraction method using the resonance of a betatron oscillation, and magnetic poles 73 included in a bending magnet 12 of the synchrotron 10 have a SIM structure that generates a magnetic field distribution that makes the horizontal tune of the charged particle more closely approach a resonant line used in the slow extraction method as the amplitude of the horizontal betatron oscillation of a charged particle included in the charged particle beam becomes larger.

A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

A vario-energy electron accelerator includes a resonant cavity consisting of a closed conductor, an electron source injecting a beam of electrons into the resonant cavity, an RF system coupled to the resonant cavity and generating an electric field in the resonant cavity, magnet units centred on a mid-plane and generating a field in a deflecting chamber in fluid communication with the resonant cavity, the magnetic field deflecting along a first deflecting trajectory of adding length an electron beam exiting the resonant cavity along a first radial trajectory to reintroduce it into the resonant cavity along a second radial trajectory, an outlet for extracting along an extraction path an accelerated electron beam from the resonant cavity towards a target, wherein at least one of the magnet units is adapted for modifying the first deflecting trajectory to a second deflecting trajectory, allowing a variation of the energy of the electron beam.

A wafer-based charged particle accelerator includes a charged particle source and at least one RF charged particle accelerator wafer sub-assembly and a power supply coupled to the at least one RF charged particle accelerator wafer sub-assembly. The wafer-based charged particle accelerator may further include a beam current-sensor. The wafer-based charged particle accelerator may further include at least a second RF charged particle accelerator wafer sub-assembly and at least one ESQ charged particle focusing wafer. Fabrication methods are disclosed for RF charged particle accelerator wafer sub-assemblies, ESQ charged particle focusing wafers, and the wafer-based charged particle accelerator.