A resonator is described including a piezoelectric material with first and second electrodes provided on the piezoelectric material. An acoustic metamaterial at least partially surrounds an active region of the resonator.

A microelectronic device including a substrate including, in a stack, a base portion, a dielectric portion and an upper layer with a semi-conductive material base, at least one electrical connection element made of an electrically conductive material located above the upper layer and electrically insulated from the upper layer at least by a dielectric layer, the dielectric layer being in contact with the surface of the upper layer, at least one dielectric element including at least one trench forming a closed edge at the periphery or upright of at least one portion of the dielectric electrical connection element, located at least partially in the upper layer and delimiting a closed zone of said upper layer, at least one dielectric element having a portion exposed to the surface of the upper layer, device wherein the dielectric layer totally covers the exposed portion of at least one dielectric element.

An acoustic wave device includes a piezoelectric material substrate, an intermediate layer on the piezoelectric material substrate and composed of one or more materials selected from the group consisting of silicon oxide, aluminum nitride and sialon, a bonding layer on the intermediate layer and composed of one or more materials selected from the group consisting of tantalum pentoxide, niobium pentoxide, titanium oxide, mullite, alumina, a high resistance silicon and hafnium oxide, a supporting body composed of a polycrystalline ceramic and bonded to the bonding layer by direct bonding, and an electrode on the piezoelectric material substrate.

Provided is a piezoelectric laminated film which does not discolor even under a high-temperature and high-humidity environment. The piezoelectric laminated film includes a piezoelectric film and a transparent adhesive sheet satisfying the following Condition 1. Condition 1: when volatile components obtained from a test piece per 1 cm.sup.2 that has been held at 85? C. for 90 minutes are subjected to solid-phase microextraction, adsorbed onto a fiber coated with polydimethylsiloxane, and analyzed by a gas chromatography mass spectrometer, a total amount of organic substances detected after a retention time of 3 minutes is 50 ?g or less in terms of weight of 2,2-azobis(isobutyronitrile).

Provided is a piezoelectric laminated film which does not discolor even under a high-temperature and high-humidity environment. The piezoelectric laminated film includes a piezoelectric film and a transparent adhesive sheet satisfying the following Condition 1. Condition 1: when volatile components obtained from a test piece per 1 cm.sup.2 that has been held at 85? C. for 90 minutes are subjected to solid-phase microextraction, adsorbed onto a fiber coated with polydimethylsiloxane, and analyzed by a gas chromatography mass spectrometer, a total amount of organic substances detected after a retention time of 3 minutes is 50 ?g or less in terms of weight of 2,2-azobis(isobutyronitrile).

An oscillator frequency modulation method includes: providing a piezoelectric material having a surface and an interior; and performing a pattern process on the piezoelectric material by a laser. A patterned processing zone is formed on the surface and/or in the interior of the piezoelectric material. The pattern process may be a material removal and/or a material modification. Therefore, without changing the appearance of the piezoelectric material, the pattern process on the piezoelectric material through the laser can accurately adjust the frequency of the oscillator and block unnecessary mode at the same time. An oscillator piezoelectric structure with frequency modulation is also provided.

An oscillator frequency modulation method includes: providing a piezoelectric material having a surface and an interior; and performing a pattern process on the piezoelectric material by a laser. A patterned processing zone is formed on the surface and/or in the interior of the piezoelectric material. The pattern process may be a material removal and/or a material modification. Therefore, without changing the appearance of the piezoelectric material, the pattern process on the piezoelectric material through the laser can accurately adjust the frequency of the oscillator and block unnecessary mode at the same time. An oscillator piezoelectric structure with frequency modulation is also provided.

A piezoelectric material includes a first material layer including a polycrystalline lead zinc niobate-lead zirconate titanate material arranged in a 001 crystal direction; and a second material layer including a mono-crystalline material having a 001 crystal face, wherein the lead zinc niobate-lead zirconate titanate and the mono-crystalline material are different. Also a piezoelectric device including the piezoelectric material.

Provided is a display device containing a crystalline piezoelectric polymer layer having a helical chiral polymer (A) that has a weight average molecular weight of from 50,000 to 1,000,000 and has optical activity, an optical compensation layer satisfying the following expression (1), and a linear polarizer. In expression (1), Xc represents a degree of crystallinity (%) of the crystalline piezoelectric polymer layer obtained by a DSC method; MORc represents a standardized molecular orientation of the crystalline piezoelectric polymer layer measured by a microwave transmission molecular orientation meter when a reference thickness is 50 ?m; d represents a thickness (?m) of the crystalline piezoelectric polymer layer; and Rth represents a phase difference (nm) in a thickness direction of the optical compensation layer at a wavelength of 550 nm.
|0.06?Xc?MORc?d+Rth|?500Expression (1):

An oscillator piezoelectric structure includes a piezoelectric material having a surface and an interior. A plurality of patterned processing zones are formed on the surface and in the interior of the piezoelectric material, and the patterned processing zones include a material removal area and a material modification area. Therefore, without changing the appearance of the piezoelectric material, the patterned processing zones on the piezoelectric material can accurately adjust the frequency of the oscillator and block unnecessary modes at the same time.