A x-ray apparatus of the present application comprises: a vacuum box which is sealed at its periphery, and the interior thereof is high vacuum; a plurality of electron transmitting units arranged in a linear array and installed on the wall at one end within the vacuum box, each electron transmitting unit is independent to each other; the electron transmitting unit having: a heating filament; a cathode connected to the heating filament; a grid arranged above the cathode opposing the cathode; anode made of metal and installed at the other end of the vacuum box, and in the direction of length, the anode is parallel to the plane of the grid of the electron transmitting unit, and in the direction of width, the anode has a predetermined angle with respect to the plane of the grid of the electron transmitting unit.

An on-chip miniature X-ray source, comprising: an on-chip miniature electron source (10); a first insulating spacer (11) located on one side of the on-chip miniature electron source (10) emitting electrons, the first insulating spacer (11) being of a cavity structure; and an anode (12) located on the first insulating spacer (11), a closed vacuum cavity being formed between the on-chip miniature electron source (10) and the anode (12). The on-chip miniature electron source can be obtained by means of a micromachining technique, further reducing the size thereof, and reducing the manufacturing costs. The on-chip miniature X-ray source has the advantages of stable X-ray dose, low operation vacuum requirement, fast switch response, integrated and mass processing, etc. and can be used in various types of small and portable X-ray detection, analysis and treatment devices.

The invention comprises a method and apparatus for treating a tumor of a patient with positively charged particles, comprising the steps of transporting the positively charged particles along a beam transport path passing sequentially from an accelerator, through a beam transport line, through a nozzle, and toward a position of the patient, the step of transporting further comprising the steps of: (1) terminating a first Bragg peak, of a first set of the positively charged particles, in a position of the tumor and (2) flash treating the tumor with a second Bragg peak, of a second set of the positively charged particles, the second Bragg peak terminating post-patient relative to the nozzle. Optionally the second set of particles are delivered at a rate exceeding one MHz. Optionally, particles in common are used to both treat the tumor and image the tumor.

The invention comprises a method and apparatus for aligning a charged particle beam path for treating a tumor of a patient, comprising: a cancer therapy system comprising the charged particle beam path sequentially passing: from an injector, through a synchrotron, along a beam transport line, and through a nozzle; a first two-dimensional detector configured to measure a beam state of positively charged particles; and an integrated intelligent system configured to classify the beam state into a set of beam shape factors, the integrated intelligent system configured to correct the beam shape through application of a condition-action rule: (1) adjusting a first voltage delivered to a first magnet positioned in the beam line prior to the first two-dimensional detector and (2) altering the beam shape through application of a second voltage to a second magnet position in the beam line adjacent to the first magnet.

A distributed X-ray light source comprises: a plurality of arranged cathode assemblies used for emitting electron beams; an anode target used for receiving the electron beams emitted by the cathode assemblies; and compensation electrodes and focusing electrodes provided in sequence between the plurality of the cathode assemblies and the anode target, the compensation electrode being used for adjusting electric field strength at two ends of a grid structure in each cathode assembly, and the focusing electrode being used for focusing the electron beams emitted by the cathode assemblies, wherein the focusing electrode corresponding to at least one cathode assembly in the plurality of the cathode assemblies comprises a first electrode and a second electrode which are separately provided, and an electron beam channel is formed between the first electrode and the second electrode.

An X-ray source for emitting an X-ray beam is proposed. The X-ray source comprises an anode and an emitter arrangement comprising a cathode for emitting an electron beam towards the anode and an electron optics for focusing the electron beam at a focal spot on the anode. The X-ray source further comprises a controller configured to determine a switching action of the emitter arrangement and to actuate the emitter arrangement to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot on the anode, a size of the focal spot, and a shape of the focal spot. The controller is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot expected after the switching action. Further, the controller is configured to actuate the electron optics to compensate for a change of the size and the shape of the focal spot induced by the switching action.

The invention comprises a method and apparatus for treating a tumor of a patient with positively charged particles, comprising the steps of: (1) transporting the positively charged particles sequentially from an accelerator, through a beam transport line, through a nozzle, and toward a position of the tumor; (2) treating the tumor with first particles, of the positively charged particles, where at least fifty percent of the first particles pass through a patient position, from the nozzle, to a post-patient position; and (3) detecting a beam position of the first particles in the post-patient position with a detector. The flash treatment preferably delivers the first particles at a rate exceeding one MHz.

A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.

According to one embodiment, an analytical X-ray tube includes a vacuum enclosure with an output window to transmit X-rays, an anode target provided in the vacuum enclosure and opposing the output window, an anode support that supports the anode target. The anode support includes a distal end portion an outer diameter of which is smaller than an outer diameter of the anode target, and a rear side portion on a rear side of the distal end portion, an outer diameter of which is greater than the outer diameter of the anode target, and an outer surface of the rear portion is coated with a coating layer of a same material as that of the anode target.

The present application relates to a deflection electrode assembly, an X-ray source, and an X-ray imaging system. The deflection electrode assembly includes: a first electrode plate, including a first connection portion and a plurality of first tooth portions, wherein the first electrode plate is formed as a comb shape; and a second electrode plate, including a second connection portion and a plurality of second tooth portions, wherein the second electrode plate is formed as a comb shape. The first electrode plate and the second electrode plate are not in contact with each other, and the plurality of first tooth portions and the plurality of second tooth portions are arranged at least partially in a staggered manner to form a plurality of electron beam passageways; each electron beam passageway is located between adjacent first and second tooth portions.