An interface configured to transfer ions produced at or near atmospheric pressure conditions into a mass spectrometer for mass analysis is provided. The interface includes a first conduit including an inlet configured to receive a fluid containing the ions and an outlet configured to direct the fluid containing the ions into the mass spectrometer. The first conduit defines a first flow path extending from the inlet to the outlet. The interface includes a pump. The interface includes a second conduit. The second conduit includes an inlet. The second conduit defines a second flow path extending from a location between the inlet and the outlet of the first conduit to an outlet of the second conduit. The pump is configured to divert a portion of the fluid including the ions moving in the first flow path to the second flow path.

Peltier-cooled cryogenic laser ablation cells for sample preparation.

A method for analyzing charged particles may include generating, in or into an ion source region, charged particles from a sample of particles, causing the charged particles to enter a mass spectrometer from the ion source region at each of a plurality of differing physical and/or chemical conditions in a range of physical and/or chemical conditions in which the sample particles undergo structural changes, controlling the mass spectrometer to measure at least the charge magnitudes of the generated charged particles at each of the plurality of differing physical and/or chemical conditions, determining, with a processor, an average charge magnitude of the generated charged particles at each of the plurality of differing physical and/or chemical conditions based on the measured charge magnitudes, and determining, with the processor, an average charge magnitude profile over the range of physical and/or chemical conditions based on the determined average charge magnitudes.

Embodiments herein describe using compressed source material to perform an atomic experiment or an atomic application within a vacuum chamber (e.g., an atom cooling and trapping apparatus). Source material is often refined and sold with dendritic or crystalline surfaces that result in a very large surface area. This surface area increases the likelihood that a large amount contaminants will form on the surface, which is especially true for reactive source materials. To mitigate the risk of contamination, in the embodiments herein the source material is compressed onto a substrate. This changes the material from having a dendritic or crystalline surface to a flat surface, which has a much smaller surface area and thus is less susceptible to contaminants which can, for example, improve the lifetime usage of the source material.

An ionizing system includes a channel and a heater coupled to the channel. The channel has an inlet disposed in a first pressure region having a first pressure and an outlet disposed in a second pressure region having a second pressure. The first pressure is greater than the second pressure. The heater is for heating the channel, and the channel is configured to generate charged particles of a sample in response to the sample being introduced into the channel.

Disclosed herein is an evolved gas analyzer and a method for analyzing evolved gas, the apparatus enhancing detection accuracy for gas component without providing the apparatus in a large size. The apparatus includes a heating unit evolving a gas component by heating a sample, a detecting means detecting the gas component, a gas channel connecting the heating unit to the detecting means, the gas channel through which mixed gas of the gas component and carrier gas flows, wherein the gas channel includes a branching channel being open to outside and including a discharge flow rate controlling device, and a flow rate control device controlling the discharge flow rate controlling device based on a detection signal received from the detecting means so as to control the detection signal to be within a predetermined range.

Disclosed herein is a method for correcting an evolved gas analyzer and the evolved gas analyzer. The method includes: correcting a mass spectrum position to be located at a reference spectrum position, the mass spectrum position corresponding to a mass-to-charge ratio m/z of a mass spectrum of a gas component of a reference sample; calculating a sensitivity correction factor Cs=Ss/S by using an area S and a reference area Ss of a chromatogram, the sensitivity correction factor being used to measure an area of a chromatogram of the gas component of a test sample; and calculating a heating correction factor H=t/ts by using a time t and a reference time is indicating a maximum peak of the chromatogram about the reference sample, the heating correction factor being used to correct a heating rate of the test sample when measuring the gas component of the test sample.

The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.

An ionization source for Electrospray Ionization (ESI) mass spectrometry includes a mass spectrometer having a source vacuum chamber having an inlet and an outlet. The outlet is disposed at an opening of the mass spectrometer. The ionization source further includes a hollow emission needle having an exit disposed at the inlet of the vacuum chamber. The hollow emission needle is configured to convey a first material toward the exit. An auxiliary line is disposed adjacent to the hollow emission needle to convey a second material toward the exit. A voltage supply apparatus is applied between the hollow emission needle and the mass spectrometer to establish a voltage between the hollow emission needle and the mass spectrometer and to induce particles to enter the mass spectrometer for analysis.

To provide a mass spectrometer capable of performing high-sensitivity measurement using water molecules. The mass spectrometer has a chamber in which a sample is disposed, an irradiation unit for emitting particles to the sample, and an extraction electrode which leads secondary ions emitted from the sample to a mass spectrometry unit, in which the irradiation unit switches a first mode of emitting primary ions for causing the secondary ions to be emitted from the sample and a second mode of emitting particles containing water molecules to be made to adhere to the sample and emits the particles to the sample.